Author: Johan Boman
Publisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages :
Book Description
A Selection of Papers Presented at the 13th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF 2009), Göteborg, Sweden, 15-19 June 2009
Author: Johan Boman
Publisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : X-ray spectroscopy
Languages : en
Pages :
Book Description
TXRF 2009
Author: Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Total-Reflection X-Ray Fluorescence Analysis and Related Methods
Author: Reinhold Klockenkämper
Publisher: John Wiley & Sons
ISBN: 1118460278
Category : Science
Languages : en
Pages : 554
Book Description
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study
Publisher: John Wiley & Sons
ISBN: 1118460278
Category : Science
Languages : en
Pages : 554
Book Description
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis • Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry • Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques • Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation • Includes some 700 references for further study
A Collection of Papers Presented at the 12th Conference on Total Reflection X-ray Fluorescence Analysis and Related Methods (TXRF 2007)
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Book Description
Total Reflection X-ray Fluorescence Analysis
Author: Dick K. G. de Boer
Publisher:
ISBN:
Category :
Languages : en
Pages : 277
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 277
Book Description
Total reflection X-ray fluorescence analysis : 7th Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF'98), Austin, TX (USA), September 1998
Author: Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods
Publisher:
ISBN:
Category :
Languages : en
Pages : 1544
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 1544
Book Description
Special Issue Total Reflection X-ray Fluorescence Analysis
Author: Dirk Kornelis Gerhardus de Boer
Publisher:
ISBN:
Category :
Languages : en
Pages : 277
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 277
Book Description
Handbook of Practical X-Ray Fluorescence Analysis
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Publisher: Springer Science & Business Media
ISBN: 3540367225
Category : Science
Languages : en
Pages : 897
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Total Reflection X-ray Fluorescence Analysis
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Microscopic X-Ray Fluorescence Analysis
Author: Koen H. A. Janssens
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 454
Book Description
Table of contents
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 454
Book Description
Table of contents