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Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769506135
Category : Computers
Languages : en
Pages : 528
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Book Description
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769506135
Category : Computers
Languages : en
Pages : 528
Get Book Here
Book Description
Proceedings of a spring 2000 symposium, highlighting novel ideas and approaches to current and future problems related to testing of electronic circuits and systems. Themes are microprocessor test/validation, low power BIST and scan, technology trends, scan- related approaches, defect-driven techniques, and system-on-chip test techniques. Other subjects are analog test techniques, temperature and process drift issues, test compaction and design validation, analog BIST, and functional test and verification issues. Also covered are STIL extension, IDDQ test, and on-line testing and fault tolerance. Lacks a subject index. Annotation copyrighted by Book News, Inc., Portland, OR.
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
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Book Description
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769511221
Category : Computers
Languages : en
Pages : 458
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Book Description
Collects 58 papers from the April/May 2001 symposium that explore new approaches in the testing of electronic circuits and systems. Key areas in testing are discussed, such as BIST, analog measurement, fault tolerance, diagnosis methods, scan chain design, memory test and diagnosis, and test data compression and compaction. Also on the program are sessions on emerging areas that are gaining prominence, including low power testing, testing high speed circuits on low cost testers, processor based self test techniques, and core- based system-on-chip testing. Some of the topics are robust and low cost BIST architectures for sequential fault testing in datapath multipliers, a method for measuring the cycle-to-cycle period jitter of high-frequency clock signals, fault equivalence identification using redundancy information and static and dynamic extraction, and test scheduling for minimal energy consumption under power constraints. No subject index. c. Book News Inc.
Author:
Publisher:
ISBN:
Category : Electronic circuits
Languages : en
Pages : 526
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Book Description
Author: Michail Maniatakos
Publisher: Springer
ISBN: 303015663X
Category : Computers
Languages : en
Pages : 271
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Book Description
This book contains extended and revised versions of the best papers presented at the 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, held in Abu Dhabi, United Arab Emirates, in August 2017. The 11 papers included in this book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design. On the occasion of the silver jubilee of the VLSI-SoC conference series the book also includes a special chapter that presents the history of the VLSI-SoC series of conferences and its relation with VLSI-SoC evolution since the early 80s up to the present.
Author: Jagdish C. Bansal
Publisher: Springer Science & Business Media
ISBN: 8132210387
Category : Technology & Engineering
Languages : en
Pages : 559
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Book Description
The book is a collection of high quality peer reviewed research papers presented in Seventh International Conference on Bio-Inspired Computing (BIC-TA 2012) held at ABV-IIITM Gwalior, India. These research papers provide the latest developments in the broad area of "Computational Intelligence". The book discusses wide variety of industrial, engineering and scientific applications of nature/bio-inspired computing and presents invited papers from the inventors/originators of novel computational techniques.
Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 580
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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--
Author: Ajith Abraham
Publisher: Springer Nature
ISBN: 3031648471
Category :
Languages : en
Pages : 523
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Book Description
Author: Janmenjoy Nayak
Publisher: Springer Nature
ISBN: 9811694478
Category : Technology & Engineering
Languages : en
Pages : 757
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Book Description
This book addresses different methods and techniques of integration for enhancing the overall goal of data mining. The book is a collection of high-quality peer-reviewed research papers presented in the Sixth International Conference on Computational Intelligence in Data Mining (ICCIDM 2021) held at Aditya Institute of Technology and Management, Tekkali, Andhra Pradesh, India, during December 11–12, 2021. The book addresses the difficulties and challenges for the seamless integration of two core disciplines of computer science, i.e., computational intelligence and data mining. The book helps to disseminate the knowledge about some innovative, active research directions in the field of data mining, machine and computational intelligence, along with some current issues and applications of related topics.
Author: Rajendra Prasad Yadav
Publisher: Springer Nature
ISBN: 9811987424
Category : Technology & Engineering
Languages : en
Pages : 765
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Book Description
This book gathers selected high-quality research papers presented at International Conference on Paradigms of Communication, Computing and Data Sciences (PCCDS 2022), held at Malaviya National Institute of Technology Jaipur, India, during 05 – 07 July 2022. It discusses high-quality and cutting-edge research in the areas of advanced computing, communications and data science techniques. The book is a collection of latest research articles in computation algorithm, communication and data sciences, intertwined with each other for efficiency.
