ZVEI Electro Electronics Buyers' Guide 2002 PDF Download
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Author:
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Category : Electric industries
Languages : en
Pages :
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Book Description
Author:
Publisher:
ISBN:
Category : Electric industries
Languages : en
Pages :
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Author:
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ISBN:
Category : Government libraries
Languages : en
Pages : 1118
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ISBN:
Category : India
Languages : en
Pages : 778
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Author:
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ISBN:
Category : Database industry
Languages : en
Pages : 1308
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Author:
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ISBN:
Category : Directories
Languages : en
Pages : 722
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Author:
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ISBN:
Category : Databases
Languages : en
Pages :
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Book Description
Directory of "2805 database in 2509 entries." Science, technology, medicine, business, law, humanities, and social sciences are covered. Entries give such detailed information as data elements, subject matter, and user aids. Name, subject, producer and processor indexes.
Author: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 1118703332
Category : Technology & Engineering
Languages : en
Pages : 368
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Book Description
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips. The book is unique in covering the EOS manufacturing issues from on-chip design and electronic design automation to factory-level EOS program management in today’s modern world. Look inside for extensive coverage on: Fundamentals of electrical overstress, from EOS physics, EOS time scales, safe operating area (SOA), to physical models for EOS phenomena EOS sources in today’s semiconductor manufacturing environment, and EOS program management, handling and EOS auditing processing to avoid EOS failures EOS failures in both semiconductor devices, circuits and system Discussion of how to distinguish between EOS events, and electrostatic discharge (ESD) events (e.g. such as human body model (HBM), charged device model (CDM), cable discharge events (CDM), charged board events (CBE), to system level IEC 61000-4-2 test events) EOS protection on-chip design practices and how they differ from ESD protection networks and solutions Discussion of EOS system level concerns in printed circuit boards (PCB), and manufacturing equipment Examples of EOS issues in state-of-the-art digital, analog and power technologies including CMOS, LDMOS, and BCD EOS design rule checking (DRC), LVS, and ERC electronic design automation (EDA) and how it is distinct from ESD EDA systems EOS testing and qualification techniques, and Practical off-chip ESD protection and system level solutions to provide more robust systems Electrical Overstress (EOS): Devices, Circuits and Systems is a continuation of the author’s series of books on ESD protection. It is an essential reference and a useful insight into the issues that confront modern technology as we enter the nano-electronic era.
Author: Martine Knoop
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: British Library. Document Supply Centre
Publisher:
ISBN:
Category : Periodicals
Languages : en
Pages : 472
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Book Description
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Publisher: De Gruyter Saur
ISBN: 9783598207372
Category : Business & Economics
Languages : en
Pages : 724
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Book Description
Volume I, Trade Associations contains entries for no fewer than 23,641 associations including every conceivable field of commercial, service and industrial activity, from the construction industry to demolition firms, from the chocolate and candy trade to dental equipment and dentures and from fire insurance to hoses. In contrast to other, similar reference works World Guide to Trade Associations also includes trade unions.
