X-ray Microanalysis in Biology PDF Download
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Author: David C. Sigee
Publisher: Cambridge University Press
ISBN: 9780521415309
Category : Medical
Languages : en
Pages : 356
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Book Description
This book describes an integrated approach to the use of X-ray microanalysis in biology.
Author: David C. Sigee
Publisher: Cambridge University Press
ISBN: 9780521415309
Category : Medical
Languages : en
Pages : 356
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Book Description
This book describes an integrated approach to the use of X-ray microanalysis in biology.
Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Category : Science
Languages : en
Pages : 679
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Book Description
This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.
Author: Alice Warley
Publisher: Ashgate Publishing
ISBN:
Category : Science
Languages : en
Pages : 308
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Book Description
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Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Category : Technology & Engineering
Languages : en
Pages : 598
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Book Description
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Author: Arne Engström
Publisher:
ISBN:
Category : Microradiography
Languages : en
Pages : 108
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Book Description
Author: Godfried M. Roomans
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 292
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Book Description
Author: M. A. Hayat
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 504
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Book Description
Author: Patrick Echlin
Publisher: Springer Science & Business Media
ISBN: 0387857311
Category : Technology & Engineering
Languages : en
Pages : 329
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Book Description
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author: Claude Lechene
Publisher: Elsevier
ISBN: 0323143342
Category : Nature
Languages : en
Pages : 695
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Book Description
Microbeam Analysis in Biology contains the proceedings of a workshop on Biological X-Ray Microanalysis by Electron Beam Excitation, held in Boston, Massachusetts on August 25-26, 1977. This book focuses on the principles, techniques, and biological use of electron probe microanalysis, energy-loss spectroscopy, and ion probe microanalysis. This text reflects the emphasis of the workshop on presenting the principles of analysis, the optimization of operating conditions, the description of successful techniques for sample preparation and quantitation, the illustration of problems and pitfalls, and the direction of microbeam analysis in biology.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 82
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Book Description
