X-ray and UV Detectors PDF Download
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Author: Richard B. Hoover
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 278
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Book Description
Author: Richard B. Hoover
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 278
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Book Description
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030642798
Category : Technology & Engineering
Languages : en
Pages : 297
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Book Description
This book offers readers an overview of some of the most recent advances in the field of detectors for X-ray imaging. Coverage includes both technology and applications, with an in-depth review of the research topics from leading specialists in the field. Emphasis is on high-Z materials like CdTe, CZT and perovskites, since they offer the best implementation possibilities for direct conversion X-ray detectors. Authors discuss material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors.
Author: Richard B. Hoover
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 240
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Book Description
Author: B. G. Lowe
Publisher: CRC Press
ISBN: 1466554010
Category : Science
Languages : en
Pages : 610
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Book Description
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its
Author: G. W. Fraser
Publisher: Cambridge University Press
ISBN: 052132663X
Category : Science
Languages : en
Pages : 0
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Book Description
First published in 1989, this book provides a comprehensive review of the detection techniques that are used in X-ray astronomy. Since the first discovery of a cosmic X-ray source in 1962, there has been rapid growth in X-ray astronomy, which has largely been made possible by enormous advances in the capabilities of photon counting instrumentation. The book describes the first 25 years of astronomical X-ray instrumentation and summarises the areas of current detector research, giving particular emphasis to imaging devices and to non-dispersive devices of high spectral resolution. It is the first book to give such a comprehensive treatment of the subject, and will provide astronomers with a valuable summary of detection techniques.
Author: Hiroaki Hayashi
Publisher: Springer Nature
ISBN: 3030626806
Category : Technology & Engineering
Languages : en
Pages : 119
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Book Description
This book first provides readers with an introduction to the underlying physics and state-of-the-art application of photon counting detectors for X-ray imaging. The authors explain that a photon-counting imaging detector can realize quantitative analysis because the detector can derive X-ray attenuation information based on the analysis of intensity changes of individual X-ray. To realize this analysis, it is important to consider the physics of an object and detector material. In this book, the authors introduce a novel analytical procedure to create quantitative X-ray images for medical diagnosis.
Author: Andreas Maier
Publisher: Springer
ISBN: 3319965204
Category : Computers
Languages : en
Pages : 263
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Book Description
This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.
Author: B. G. Lowe
Publisher: CRC Press
ISBN: 1466554002
Category : Technology & Engineering
Languages : en
Pages : 626
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Book Description
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detectors, an important supplement to the knowledge now required to achieve full understanding of the workings of SDDs, CCDs, and Compound Semiconductor Detectors. The book provides an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters present a self-contained summary of relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the assembly and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.
Author: David Attwood
Publisher: Cambridge University Press
ISBN: 1139643428
Category : Technology & Engineering
Languages : en
Pages : 611
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Book Description
This detailed, comprehensive book describes the fundamental properties of soft X-rays and extreme ultraviolet (EUV) radiation and discusses their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy. The author begins by presenting the relevant basic principles such as radiation and scattering, wave propagation, diffraction, and coherence. He then goes on to examine a broad range of phenomena and applications. The topics covered include spectromicroscopy, EUV astronomy, synchrotron radiation, and soft X-ray lasers. The author also provides a wealth of useful reference material such as electron binding energies, characteristic emission lines and photo-absorption cross-sections. The book will be of great interest to graduate students and researchers in engineering, physics, chemistry, and the life sciences. It will also appeal to practising engineers involved in semiconductor fabrication and materials science.
Author: Krzysztof (Kris) Iniewski
Publisher: Springer Nature
ISBN: 3030929892
Category : Technology & Engineering
Languages : en
Pages : 282
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Book Description
This book offers readers an overview of some of the most recent advances in the field of technology for X-ray medical imaging. Coverage includes both technology and applications in SPECT, PET and CT, with an in-depth review of the research topics from leading specialists in the field. Coverage includes conversion of the X-ray signal into analogue/digital value, as well as a review of CMOS chips for X-ray image sensors. Emphasis is on high-Z materials like CdTe, CZT and GaAs, since they offer the best implementation possibilities for direct conversion X-ray detectors. The discussion includes material challenges, detector operation physics and technology and readout integrated circuits required to detect signals processes by high-Z sensors. Authors contrast these emerging technologies with more established ones based on scintillator materials. This book is an excellent reference for people already working in the field as well as for people wishing to enter it.
