X-ray and Electron Diffraction Studies of Single Crystal Surfaces PDF Download
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Author: Edwin Joseph Scheibner
Publisher:
ISBN:
Category :
Languages : en
Pages : 58
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Book Description
Author: Edwin Joseph Scheibner
Publisher:
ISBN:
Category :
Languages : en
Pages : 58
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Book Description
Author: Theodore M. French
Publisher:
ISBN:
Category :
Languages : en
Pages : 152
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Author: Kenneth Robert Lawless
Publisher:
ISBN:
Category :
Languages : en
Pages : 38
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Author: Francis Leo McNamara
Publisher:
ISBN:
Category :
Languages : en
Pages : 76
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Book Description
Author: Clifford Alan Megerle
Publisher:
ISBN:
Category :
Languages : en
Pages : 714
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Book Description
Author: Devinder Singh
Publisher: BoD – Books on Demand
ISBN: 1838801898
Category : Science
Languages : en
Pages : 116
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Book Description
In the quantitative determination of new structures, micro-/nano-crystalline materials pose significant challenges. The different properties of materials are structure-dependent. Traditionally, X-ray crystallography has been used for the analysis of these materials. Electron diffraction is a technique that complements other techniques; for example, single crystal X-ray diffraction and powder X-ray diffraction for determination of structure. Electron diffraction plays a very important role when crystals are very small using single crystal X-ray diffraction or very complex for structure solution by powder X-ray diffraction. With the introduction of advanced methodologies, important methods for crystal structural analysis in the field of electron crystallography have been discovered, such as rotation electron diffraction (RED) and automated electron diffraction tomography (ADT). In recent years, large numbers of crystal structures have been solved using electron crystallography.
Author: Myeongkyu Lee
Publisher: CRC Press
ISBN: 1315361973
Category : Science
Languages : en
Pages : 302
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Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Dennis W. Bennett
Publisher: John Wiley & Sons
ISBN: 3527326774
Category : Science
Languages : en
Pages : 826
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Book Description
The first textbook for teaching this method to users with little mathematical background logically presents the theory and fundamentals in an easily comprehensible, self-contained way. The result is a must-have for advanced undergraduate students, as well as masters and graduate students and other users of single-crystal X-ray crystallography from many various disciplines.
Author: David John Dyson
Publisher: Routledge
ISBN:
Category : Science
Languages : en
Pages : 382
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Book Description
This text is to addresses the requirements of the analyst working in a materials laboratory from a practical angle providing reference where necessary to more detailed work. It also shows the link between XRD and other analytical techniques with integral diffraction facilities. Some applications are briefly discussed to show what can be achieved; others to show what to look for and what to check. The provision of computing facilities, while having many benefits, can also lead to a false reliance in the output that they generate. The importance of the errors that can occur, how to handle them and the need to provide some measure of uncertainty to the customer are considered. It does not purport to be universal in its coverage.
Author: L. J. Clarke
Publisher: John Wiley & Sons
ISBN:
Category : Science
Languages : en
Pages : 354
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Book Description
Low Energy Electron Diffraction (LEED) is one of the most commonly used techniques for crystal surface characterization at the atomic level. This book is designed to provide all the essential background information necessary to carry out surface crystallography using LEED.
