Author: Hsien-Hui Tseng
Publisher:
ISBN:
Category : Farm produce
Languages : en
Pages : 298
Book Description
VLSI Smart Logic Modeling and Design for Optimum Chip Feature Characterization
Author: Hsien-Hui Tseng
Publisher:
ISBN:
Category : Farm produce
Languages : en
Pages : 298
Book Description
Publisher:
ISBN:
Category : Farm produce
Languages : en
Pages : 298
Book Description
Dissertation Abstracts International
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 794
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 794
Book Description
Digital Integrated Circuit Design
Author: Hubert Kaeslin
Publisher: Cambridge University Press
ISBN: 0521882672
Category : Technology & Engineering
Languages : en
Pages : 878
Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
Publisher: Cambridge University Press
ISBN: 0521882672
Category : Technology & Engineering
Languages : en
Pages : 878
Book Description
This practical, tool-independent guide to designing digital circuits takes a unique, top-down approach, reflecting the nature of the design process in industry. Starting with architecture design, the book comprehensively explains the why and how of digital circuit design, using the physics designers need to know, and no more.
American Doctoral Dissertations
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 848
Book Description
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 848
Book Description
Machine Learning in VLSI Computer-Aided Design
Author: Ibrahim (Abe) M. Elfadel
Publisher: Springer
ISBN: 3030046664
Category : Technology & Engineering
Languages : en
Pages : 697
Book Description
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Publisher: Springer
ISBN: 3030046664
Category : Technology & Engineering
Languages : en
Pages : 697
Book Description
This book provides readers with an up-to-date account of the use of machine learning frameworks, methodologies, algorithms and techniques in the context of computer-aided design (CAD) for very-large-scale integrated circuits (VLSI). Coverage includes the various machine learning methods used in lithography, physical design, yield prediction, post-silicon performance analysis, reliability and failure analysis, power and thermal analysis, analog design, logic synthesis, verification, and neuromorphic design. Provides up-to-date information on machine learning in VLSI CAD for device modeling, layout verifications, yield prediction, post-silicon validation, and reliability; Discusses the use of machine learning techniques in the context of analog and digital synthesis; Demonstrates how to formulate VLSI CAD objectives as machine learning problems and provides a comprehensive treatment of their efficient solutions; Discusses the tradeoff between the cost of collecting data and prediction accuracy and provides a methodology for using prior data to reduce cost of data collection in the design, testing and validation of both analog and digital VLSI designs. From the Foreword As the semiconductor industry embraces the rising swell of cognitive systems and edge intelligence, this book could serve as a harbinger and example of the osmosis that will exist between our cognitive structures and methods, on the one hand, and the hardware architectures and technologies that will support them, on the other....As we transition from the computing era to the cognitive one, it behooves us to remember the success story of VLSI CAD and to earnestly seek the help of the invisible hand so that our future cognitive systems are used to design more powerful cognitive systems. This book is very much aligned with this on-going transition from computing to cognition, and it is with deep pleasure that I recommend it to all those who are actively engaged in this exciting transformation. Dr. Ruchir Puri, IBM Fellow, IBM Watson CTO & Chief Architect, IBM T. J. Watson Research Center
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1148
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1148
Book Description
The Engineering Index Annual
Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 2264
Book Description
Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 2264
Book Description
Since its creation in 1884, Engineering Index has covered virtually every major engineering innovation from around the world. It serves as the historical record of virtually every major engineering innovation of the 20th century. Recent content is a vital resource for current awareness, new production information, technological forecasting and competitive intelligence. The world?s most comprehensive interdisciplinary engineering database, Engineering Index contains over 10.7 million records. Each year, over 500,000 new abstracts are added from over 5,000 scholarly journals, trade magazines, and conference proceedings. Coverage spans over 175 engineering disciplines from over 80 countries. Updated weekly.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1148
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1148
Book Description
CAD/CAM Abstracts
Author:
Publisher:
ISBN:
Category : CAD/CAM systems
Languages : en
Pages : 616
Book Description
Publisher:
ISBN:
Category : CAD/CAM systems
Languages : en
Pages : 616
Book Description
VLSI System Design
Author: Saburo Muroga
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 520
Book Description
An overview of LSI/VLSI systems that brings together all their engineering aspects with economical considerations such as production volume economy, yield economy, chip pricing, and custom design methodology. Offers clear, concise explanations of how to design LSI/VLSI chips and what advantages and disadvantages accompany their use. The well-illustrated text includes worked examples as well as extensive references for further study.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 520
Book Description
An overview of LSI/VLSI systems that brings together all their engineering aspects with economical considerations such as production volume economy, yield economy, chip pricing, and custom design methodology. Offers clear, concise explanations of how to design LSI/VLSI chips and what advantages and disadvantages accompany their use. The well-illustrated text includes worked examples as well as extensive references for further study.