Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy PDF full book. Access full book title Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy by Kurt F. J. Heinrich. Download full books in PDF and EPUB format.
Author: Kurt F. J. Heinrich
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 180
Get Book Here
Book Description
Author: Kurt F. J. Heinrich
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 180
Get Book Here
Book Description
Author: Kurt F. J. Heinrich
Publisher:
ISBN:
Category : Electron probe microanalysis
Languages : en
Pages : 180
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 726
Get Book Here
Book Description
Author: David C. Joy
Publisher: Oxford University Press
ISBN: 0195358465
Category : Computers
Languages : en
Pages : 225
Get Book Here
Book Description
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use on personal computers, the programs provide a real time graphical display of the interaction. The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis. The computer code is given in a fully annotated format so that it may be readily modified for specific problems. Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.
Author: United States. National Bureau of Standards. Technical Information and Publications Division
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 804
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1746
Get Book Here
Book Description
Author: K.F.J. Heinrich
Publisher: Springer Science & Business Media
ISBN: 0306438240
Category : Science
Languages : en
Pages : 412
Get Book Here
Book Description
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author: John C. Russ
Publisher: Butterworth-Heinemann
ISBN: 1483164004
Category : Science
Languages : en
Pages : 315
Get Book Here
Book Description
Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.
Author: Ludwig Reimer
Publisher: Springer
ISBN: 3540389679
Category : Science
Languages : en
Pages : 538
Get Book Here
Book Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 766
Get Book Here
Book Description
