Ultra-Low Voltage Nano-Scale Memories PDF Download
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Author: Kiyoo Itoh
Publisher: Springer Science & Business Media
ISBN: 0387688536
Category : Technology & Engineering
Languages : en
Pages : 351
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Book Description
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.
Author: Kiyoo Itoh
Publisher: Springer Science & Business Media
ISBN: 0387688536
Category : Technology & Engineering
Languages : en
Pages : 351
Get Book Here
Book Description
Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.
Author: Itoh
Publisher:
ISBN: 9788184892499
Category :
Languages : en
Pages : 357
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Book Description
Author: Masashi Horiguchi
Publisher: Springer Science & Business Media
ISBN: 1441979581
Category : Technology & Engineering
Languages : en
Pages : 221
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Book Description
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Author: Charles Chiang
Publisher: Springer Science & Business Media
ISBN: 1402051883
Category : Technology & Engineering
Languages : en
Pages : 277
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Book Description
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
Author: Gi-Joon Nam
Publisher: Springer Science & Business Media
ISBN: 0387687394
Category : Technology & Engineering
Languages : en
Pages : 330
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Book Description
This book covers advanced techniques in modern circuit placement. It details all of most recent placement techniques available in the field and analyzes the optimality of these techniques. Coverage includes all the academic placement tools that competed against one another on the same industrial benchmark circuits at the International Symposium on Physical Design (ISPD), these techniques are also extensively being used in industrial tools as well. The book provides significant amounts of analysis on each technique such as trade-offs between quality-of-results (QoR) and runtime.
Author: Ranjit Gharpurey
Publisher: Springer Science & Business Media
ISBN: 0387692789
Category : Technology & Engineering
Languages : en
Pages : 207
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Book Description
This book is a compilation of chapters on various aspects of Ultra Wideband. The book includes chapters on Ultra Wideband transceiver implementations, pulse-based systems and one on the implementation for the WiMedia/MBOFDM approach. Another chapter discusses the implementation of the physical layer baseband, including the ADC and post-ADC processing required in the UWB system. Future advances such as multiantenna UWB solutions are also discussed.
Author: J.-P. Colinge
Publisher: Springer Science & Business Media
ISBN: 038771751X
Category : Technology & Engineering
Languages : en
Pages : 350
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Book Description
This book explains the physics and properties of multi-gate field-effect transistors (MuGFETs), how they are made and how circuit designers can use them to improve the performances of integrated circuits. It covers the emergence of quantum effects due to the reduced size of the devices and describes the evolution of the MOS transistor from classical structures to SOI (silicon-on-insulator) and then to MuGFETs.
Author: Jan Rabaey
Publisher: Springer Science & Business Media
ISBN: 0387717137
Category : Technology & Engineering
Languages : en
Pages : 371
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Book Description
This book contains all the topics of importance to the low power designer. It first lays the foundation and then goes on to detail the design process. The book also discusses such special topics as power management and modal design, ultra low power, and low power design methodology and flows. In addition, coverage includes projections of the future and case studies.
Author: Malay Ganai
Publisher: Springer Science & Business Media
ISBN: 0387691677
Category : Computers
Languages : en
Pages : 338
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Book Description
This book provides an engineering insight into how to provide a scalable and robust verification solution with ever increasing design complexity and sizes. It describes SAT-based model checking approaches and gives engineering details on what makes model checking practical. The book brings together the various SAT-based scalable emerging technologies and techniques covered can be synergistically combined into a scalable solution.
Author: Alice Wang
Publisher: Springer Science & Business Media
ISBN: 0387764720
Category : Technology & Engineering
Languages : en
Pages : 312
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Book Description
This book is about various adaptive and dynamic techniques used to optimize processor power and performance. It is based on a very successful forum at ISSCC which focused on Adaptive Techniques. The book looks at the underlying process technology for adaptive designs and then examines different circuits, architecture and software that address the different aspects. The chapters are written by people both in academia and the industry to show the scope of alternative practices.
