Transient-radiation Effects on Electronics Handbook PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Transient-radiation Effects on Electronics Handbook PDF full book. Access full book title Transient-radiation Effects on Electronics Handbook by Richard K. Thatcher. Download full books in PDF and EPUB format.
Author: Richard K. Thatcher
Publisher:
ISBN:
Category :
Languages : en
Pages : 380
Get Book Here
Book Description
It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.
Author: Richard K. Thatcher
Publisher:
ISBN:
Category :
Languages : en
Pages : 380
Get Book Here
Book Description
It is the purpose of this document to present information which will be useful to the circuit design engineer when designing electronic systems for survival in a nuclear burst environment. The information presented covers only those areas directly related to electronic parts, circuits and systems. The nuclear burst environment which is covered is both transient and steady state and includes all radiation effects except EMP. Areas which are covered in detail are the interaction of transient radiation with matter, discrete semi-conductor devices, integrated circuits, capacitors, resistors, circuit hardening and circuit analysis techniques. Supplementing this document is a classified TREE Handbook which discusses the nuclear weapon burst environment, interaction of transient radiation with matter, and system hardening.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 507
Get Book Here
Book Description
The objectives of the Transient Radiation Effects on Electronics (TREE) Handbook are to (1) provide information about radiation effects on semiconductor devices and materials, (2) provide guidelines for microelectronic radiation hardening technology, and (3) serve as a reference for radiation hardness assurance and microelectronic radiation testing. The radiation environments addressed in this handbook include those produced by nuclear weapons effects (NWE) and natural space. The NWE environment includes x rays, gamma rays, and neutrons. The natural space environment includes photons and electrons trapped in the Van Allen belt, and neutrons, heavy ions, and cosmic rays found in space.
Author: Joseph J. Kalonowski
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages :
Get Book Here
Book Description
Author: D. C. Jones
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 122
Get Book Here
Book Description
Author: N. J. Rudie
Publisher:
ISBN:
Category :
Languages : en
Pages : 230
Get Book Here
Book Description
Author: Marta Bagatin
Publisher: CRC Press
ISBN: 1498722636
Category : Technology & Engineering
Languages : en
Pages : 394
Get Book Here
Book Description
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Author: Dale C. Jones
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 209
Get Book Here
Book Description
Author: Ronald D Schrimpf
Publisher: World Scientific
ISBN: 9814482153
Category : Technology & Engineering
Languages : en
Pages : 349
Get Book Here
Book Description
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Author: Andrew Holmes-Siedle
Publisher: Oxford University Press, USA
ISBN:
Category : Science
Languages : en
Pages : 512
Get Book Here
Book Description
Of requirements for steady-state radiation sources -- Cosmic ray upset simulation -- Heavy ions -- Fission fragments -- Laser light -- Dosimetry for radiation testing -- Test procedures for semiconductor devices -- Comparison of space with military requirements -- Radiation response specifications -- Product assurance techniques and special radiation assessment -- ESA/SCC and ECSS specifications (Europe) -- BS 9000 specifications and CECC (Europe) -- MIL specifications (USA) -- ASTM specifications (USA) -- Electronic Industries Association EIA (USA) -- Comparison of standards -- Engineering materials -- Time-dependent effects and post-irradiation effects -- Radiation-hardening of semiconductor parts -- Methodology of total-dose hardening -- Hardening of a process -- Material preparation and cleaning -- Oxide growth -- Oxide anneal -- Gate electrode -- Modified gate insulators -- Field oxide hardening -- Other processing steps -- Hardening for total dose by 'layout' -- Hardening against transient radiation -- Pulsed gamma rays -- Single-event upsets -- Commercial radiation-hard and radiation-tolerant technologies -- Deep submicron technology -- Silicon on insulator (SOI) -- Standard products -- 'Fabless' manufacturer -- Hardening of parts other than silicon -- Equipment hardening and hardness assurance -- Elementary rules of hardening -- Hardening measures at the systems level -- Robots, diagnostics and military vehicles in penetrating radiation -- Manipulators for nuclear plant -- Hardening of a robotic vehicle.
Author: Norman J. Rudie
Publisher:
ISBN:
Category : Atomic bomb
Languages : en
Pages :
Get Book Here
Book Description
