Total Least Squares and Constrained Least Squares Applied to Frequency Domain System Identification PDF Download
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Author: William Ronald Young
Publisher:
ISBN:
Category : Automatic control
Languages : en
Pages : 0
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Book Description
Author: William Ronald Young
Publisher:
ISBN:
Category : Automatic control
Languages : en
Pages : 0
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Book Description
Author: Don Paul McLane
Publisher:
ISBN:
Category :
Languages : en
Pages : 252
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Book Description
Author: Sabine van Huffel
Publisher: SIAM
ISBN: 9780898713930
Category : Mathematics
Languages : en
Pages : 404
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Book Description
An overview of the computational issues; statistical, numerical, and algebraic properties, and new generalizations and applications of advances on TLS and EIV models. Experts from several disciplines prepared overview papers which were presented at the conference and are included in this book.
Author: Bo Wahlberg
Publisher:
ISBN:
Category :
Languages : en
Pages : 25
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Book Description
Author: Tobin H. Van Pelt
Publisher:
ISBN:
Category :
Languages : en
Pages : 336
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Book Description
Author: Chung-Jung Chiang
Publisher:
ISBN:
Category :
Languages : en
Pages : 85
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Author:
Publisher:
ISBN:
Category : Electronic data processing
Languages : en
Pages : 632
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Book Description
Author: Sabine Van Huffel
Publisher: SIAM
ISBN: 0898712750
Category : Mathematics
Languages : en
Pages : 302
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Book Description
This is the first book devoted entirely to total least squares. The authors give a unified presentation of the TLS problem. A description of its basic principles are given, the various algebraic, statistical and sensitivity properties of the problem are discussed, and generalizations are presented. Applications are surveyed to facilitate uses in an even wider range of applications. Whenever possible, comparison is made with the well-known least squares methods. A basic knowledge of numerical linear algebra, matrix computations, and some notion of elementary statistics is required of the reader; however, some background material is included to make the book reasonably self-contained.
Author: Tien C. Hsia
Publisher: Free Press
ISBN:
Category : Science
Languages : en
Pages : 200
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Book Description
Author: S. van Huffel
Publisher: Springer Science & Business Media
ISBN: 9401735522
Category : Mathematics
Languages : en
Pages : 389
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Book Description
In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems.
