Author: M. M. Bretscher
Publisher:
ISBN:
Category : Magnetic fields
Languages : en
Pages : 64
Book Description
Focusing Properties of Inhomogeneous Magnetic Sector Fields
Author: M. M. Bretscher
Publisher:
ISBN:
Category : Magnetic fields
Languages : en
Pages : 64
Book Description
Publisher:
ISBN:
Category : Magnetic fields
Languages : en
Pages : 64
Book Description
The focusing Properties of inhomogeneous magnetic sector fields
Author: Nils Svartholm
Publisher:
ISBN:
Category :
Languages : de
Pages : 4
Book Description
Publisher:
ISBN:
Category :
Languages : de
Pages : 4
Book Description
FOCUSING PROPERTIES OF INHOMOGENEOUS MAGNETIC SECTOR FIELDS.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1200
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1200
Book Description
Aberration Theory in Electron and Ion Optics
Author: Peter W. Hawkes
Publisher: Elsevier
ISBN: 0443193215
Category : Technology & Engineering
Languages : en
Pages : 376
Book Description
Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Publisher: Elsevier
ISBN: 0443193215
Category : Technology & Engineering
Languages : en
Pages : 376
Book Description
Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series
Advances in Imaging and Electron Physics
Author:
Publisher: Academic Press
ISBN: 0080912168
Category : Technology & Engineering
Languages : en
Pages : 406
Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
Publisher: Academic Press
ISBN: 0080912168
Category : Technology & Engineering
Languages : en
Pages : 406
Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading international scholars and industry experts - Discusses hot topic areas and presents current and future research trends - Invaluable reference and guide for physicists, engineers and mathematicians
Optics of Charged Particles
Author: Hermann Wollnik
Publisher: Academic Press
ISBN: 012821466X
Category : Science
Languages : en
Pages : 319
Book Description
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition
Publisher: Academic Press
ISBN: 012821466X
Category : Science
Languages : en
Pages : 319
Book Description
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition
A Review of the Magnetic Field Shaping Methods Used in the Development of the 255
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 163
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 163
Book Description
Beam Transport
Author: Robert R. Kepple
Publisher:
ISBN:
Category : Beam dynamics
Languages : en
Pages : 296
Book Description
References applicable to the problems of transporting charged particles in the areas external to accelerators are presented. The 891 references cover the period 1949 to 1981, with a few references both prior and subsequent to this period included. Part I is concerned with the more general aspects of electron optics. Part II contains the references that deal more directly with applications to particle accelerators. Arrangement within each part is by broad subject with cross references listed at the end of each section. An author index is included.
Publisher:
ISBN:
Category : Beam dynamics
Languages : en
Pages : 296
Book Description
References applicable to the problems of transporting charged particles in the areas external to accelerators are presented. The 891 references cover the period 1949 to 1981, with a few references both prior and subsequent to this period included. Part I is concerned with the more general aspects of electron optics. Part II contains the references that deal more directly with applications to particle accelerators. Arrangement within each part is by broad subject with cross references listed at the end of each section. An author index is included.
Science Abstracts
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 2344
Book Description
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 2344
Book Description