The Components of the Photoionization Cross Section in the VUV and Soft X-ray Region PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download The Components of the Photoionization Cross Section in the VUV and Soft X-ray Region PDF full book. Access full book title The Components of the Photoionization Cross Section in the VUV and Soft X-ray Region by . Download full books in PDF and EPUB format.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
The photoionization cross section is partitioned into its components by analyzing the emitted photoelectrons according to energy and intensity. the principle of the method is outlined and experimental results on neon, krypton, manganese and beryllium are discussed. 9 refs., 7 figs.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
The photoionization cross section is partitioned into its components by analyzing the emitted photoelectrons according to energy and intensity. the principle of the method is outlined and experimental results on neon, krypton, manganese and beryllium are discussed. 9 refs., 7 figs.
Author: Uwe Becker
Publisher: Springer Science & Business Media
ISBN: 9780306450389
Category : Science
Languages : en
Pages : 698
Get Book Here
Book Description
Leading investigators offer the first comprehensive study of gas phase photoionization research in the VUV and soft X-ray regime since the massive employment of synchrotron radiation as a spectroscopic tool. Chapters cover all aspects of photoionization phenomena from total cross sections to highly differentiated measurements such as coincidence experiments and spin-resolved electron spectroscopy. This work is abundant with illustrations.
Author: Uwe Becker
Publisher: Springer Science & Business Media
ISBN: 146130315X
Category : Science
Languages : en
Pages : 678
Get Book Here
Book Description
Leading investigators offer the first comprehensive study of gas phase photoionization research in the VUV and soft X-ray regime since the massive employment of synchrotron radiation as a spectroscopic tool. Chapters cover all aspects of photoionization phenomena from total cross sections to highly differentiated measurements such as coincidence experiments and spin-resolved electron spectroscopy. This work is abundant with illustrations.
Author: A.S. Schlachter
Publisher: Springer Science & Business Media
ISBN: 9401108684
Category : Science
Languages : en
Pages : 400
Get Book Here
Book Description
Soft X-rays are a powerful probe of matter. They interact selectively with electrons in atoms and molecules and can be used to study atomic physics, chemical reactions, surfaces and solids, and biological entities. Over the past 20 years, synchrotrons have emerged as powerful sources of soft X-rays for experimental use. A new, third generation of synchrotron light sources is scheduled to start operation over the next few years, beginning in 1993. These facilities are distinguished by their ultra-low emittance electron beams and by their undulators -- precisely engineered magnetic devices that cause the electrons passing through them to produce highly coherent X-rays and ultraviolet light of unprecedented spectral brightness. This volume emphasizes third-generation sources that produce light in the 10 eV--10 KeV energy range. It describes potential applications ranging from the purely scientific to the commercially viable and includes chapters on the practical aspects of designing undulators and beam line optics. Unique in its coverage, the book is a vital addition to the library of any scientist who needs information on the world's most advanced imaging and spectroscopic techniques. (ABSTRACT) This volume emphasizes the applications of new third generation synchrotron radiation sources that produce light in the ultraviolet and soft X-ray range of the spectrum. The unprecedented brightness of this light enables experiments to be conducted with greatly increased spatial and spectral resolution. Scientists can exploit these properties for imaging and spectroscopic applications that until now were impossible or impractical. Prominent researchers in the field describe these applications and others made possible by the light's pulsed time structure and polarization. The volume also includes chapters on the practical aspects of designing undulators and beam line optics.
Author:
Publisher:
ISBN:
Category : Power resources
Languages : en
Pages : 444
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1132
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 1058
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1132
Get Book Here
Book Description
Author: Tsun-kong Sham
Publisher: World Scientific
ISBN: 9814492027
Category : Science
Languages : en
Pages : 1302
Get Book Here
Book Description
The synchrotron light source is becoming widely available, after its evolution from its infancy in the sixties to the present third generation source with insertion devices. It is timely to examine the impact that synchrotron light has made and will continue to make on chemical research. With this objective in mind, the editor of this invaluable book invited contributions from practitioners who are in the forefront of the research. The book summarizes most of the significant developments in the last decade in chemical and related research using synchrotron light. The utilization of the light as a probe as well as an energy source is emphasized.This book is organized into two parts, in order of increasing photon energy. Part I deals with the applications of low energy photons and covers areas such as gas phase photodissociation reactions and dynamics, soft X-ray fluorescence, IR and photoemission analysis of surfaces, spectroscopy of organic and polymeric materials, catalysts, electronic and magnetic materials, and spectromicroscopy. Part II encompasses applications using soft to hard X-rays, including spectroscopy of surface and thin films, XAFS, diffraction and scattering, and several technological applications, namely the microprobe, photoetching and tribology.
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 1162
Get Book Here
Book Description
