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Author: Louis Y. Ungar
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 472
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Book Description
Author: Louis Y. Ungar
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 406
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Book Description
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 796
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Book Description
Author: Edward B. Hakim
Publisher: Artech House Publishers
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 400
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Book Description
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Author: Erik Larsson
Publisher: Springer Science & Business Media
ISBN: 9781402032073
Category : Technology & Engineering
Languages : en
Pages : 418
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Book Description
Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective. Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution. SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.
Author: Jose Moreira
Publisher: Artech House
ISBN: 1608079864
Category : Technology & Engineering
Languages : en
Pages : 709
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Book Description
This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Author: Fred Liguori
Publisher: IEEE Computer Society Press
ISBN:
Category : Computers
Languages : en
Pages : 272
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Book Description
Author: Gerard Meszaros
Publisher: Pearson Education
ISBN: 0132797461
Category : Computers
Languages : en
Pages : 890
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Book Description
Automated testing is a cornerstone of agile development. An effective testing strategy will deliver new functionality more aggressively, accelerate user feedback, and improve quality. However, for many developers, creating effective automated tests is a unique and unfamiliar challenge. xUnit Test Patterns is the definitive guide to writing automated tests using xUnit, the most popular unit testing framework in use today. Agile coach and test automation expert Gerard Meszaros describes 68 proven patterns for making tests easier to write, understand, and maintain. He then shows you how to make them more robust and repeatable--and far more cost-effective. Loaded with information, this book feels like three books in one. The first part is a detailed tutorial on test automation that covers everything from test strategy to in-depth test coding. The second part, a catalog of 18 frequently encountered "test smells," provides trouble-shooting guidelines to help you determine the root cause of problems and the most applicable patterns. The third part contains detailed descriptions of each pattern, including refactoring instructions illustrated by extensive code samples in multiple programming languages.
Author:
Publisher:
ISBN:
Category : Automatic control
Languages : en
Pages : 1468
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Book Description
Author: Paul Ammann
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 352
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Book Description
Extensively class-tested, this textbook takes an innovative approach to software testing: it defines testing as the process of applying a few well-defined, general-purpose test criteria to a structure or model of the software. It incorporates the latest innovations in testing, including techniques to test modern types of software such as OO, web applications, and embedded software. The book contains numerous examples throughout. An instructor's solution manual, PowerPoint slides, sample syllabi, additional examples and updates, testing tools for students, and example software programs in Java are available on an extensive website.
Author: Karl Johan Åström
Publisher: Princeton University Press
ISBN: 069121347X
Category : Technology & Engineering
Languages : en
Pages :
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Book Description
The essential introduction to the principles and applications of feedback systems—now fully revised and expanded This textbook covers the mathematics needed to model, analyze, and design feedback systems. Now more user-friendly than ever, this revised and expanded edition of Feedback Systems is a one-volume resource for students and researchers in mathematics and engineering. It has applications across a range of disciplines that utilize feedback in physical, biological, information, and economic systems. Karl Åström and Richard Murray use techniques from physics, computer science, and operations research to introduce control-oriented modeling. They begin with state space tools for analysis and design, including stability of solutions, Lyapunov functions, reachability, state feedback observability, and estimators. The matrix exponential plays a central role in the analysis of linear control systems, allowing a concise development of many of the key concepts for this class of models. Åström and Murray then develop and explain tools in the frequency domain, including transfer functions, Nyquist analysis, PID control, frequency domain design, and robustness. Features a new chapter on design principles and tools, illustrating the types of problems that can be solved using feedback Includes a new chapter on fundamental limits and new material on the Routh-Hurwitz criterion and root locus plots Provides exercises at the end of every chapter Comes with an electronic solutions manual An ideal textbook for undergraduate and graduate students Indispensable for researchers seeking a self-contained resource on control theory
