Surface Displacement Measurements, Strain and Vibrational Analysis Using Speckle Metrology Techniques PDF Download
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Author: Alan Bernard Lerchbacker
Publisher:
ISBN:
Category :
Languages : en
Pages : 154
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Book Description
Double-exposure specklegrams were made of aluminum 2024-T4 rectangular plates. The double-exposure speckle technique was applied to the aluminum plate to measure in-plane translation and rotation and out-of-plane tilt. Strain and vibrational analyses were also conducted. The vibrational results were compared with results previously obtained using double-exposure time average holography to ascertain their applicability to Naval Engineering. Background in Fourier transforms, wave theory, Fraunhofer diffraction theory, and other areas of physical optics were investigated to enhance the development of speckle metrology techniques. Results of the experiments indicate that speckle metrology, used in conjunction with holography, has significant potential for Naval Engineering applications. Further research is required to develop these techniques. These procedures currently are being utilized extensively in the aerospace industry and automotive research and development areas. (Author).
Author: Alan Bernard Lerchbacker
Publisher:
ISBN:
Category :
Languages : en
Pages : 154
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Book Description
Double-exposure specklegrams were made of aluminum 2024-T4 rectangular plates. The double-exposure speckle technique was applied to the aluminum plate to measure in-plane translation and rotation and out-of-plane tilt. Strain and vibrational analyses were also conducted. The vibrational results were compared with results previously obtained using double-exposure time average holography to ascertain their applicability to Naval Engineering. Background in Fourier transforms, wave theory, Fraunhofer diffraction theory, and other areas of physical optics were investigated to enhance the development of speckle metrology techniques. Results of the experiments indicate that speckle metrology, used in conjunction with holography, has significant potential for Naval Engineering applications. Further research is required to develop these techniques. These procedures currently are being utilized extensively in the aerospace industry and automotive research and development areas. (Author).
Author: R.S. Sirohi
Publisher: CRC Press
ISBN: 1000148165
Category : Technology & Engineering
Languages : en
Pages : 584
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Book Description
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Author: R Erf
Publisher: Elsevier
ISBN: 0323154972
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data reduction procedures, and specific applications. These applications are discussed in detail in individual chapters, such as structures inspection. Adaptation of speckle measurement techniques in video recording and processing technology is also given emphasis in one chapter. Finally, one chapter is dedicated to a discussion on the speckle interferometer as one of the most used instrument in metrological speckle application. This text is a valuable reference to students in the fields of engineering and applied science.
Author: R.S. Sirohi
Publisher: CRC Press
ISBN: 1000104958
Category : Technology & Engineering
Languages : en
Pages : 572
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Book Description
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Author: Nikita A. Fomin
Publisher: Springer Science & Business Media
ISBN: 3662037076
Category : Technology & Engineering
Languages : en
Pages : 253
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Book Description
Speckle photography is an advanced experimental technique used for quantitatve determination of density, velocity and temperature fields in gas, liquid, and plasma flows. This book presents the most important equations for the diffraction theory of speckle formation and the statistical properties of speckle fields. It also describes experimental set-ups and the equipment needed to implement these methods. Speckle photography methods for automatic data acquisition and processing are considered and examples for their use are given.
Author: W. H. Shafer
Publisher: Springer Science & Business Media
ISBN: 1468442295
Category : Science
Languages : en
Pages : 311
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Book Description
Masters Theses in the Pure and Applied Sciences was first conceived, published, and dis seminated by the Center for Information and Numerical Data Analysis and Synthesis (CINDAS) * at Purdue University in 1957, starting its coverage of theses with the academic year 1955. Beginning with Volume 13, the printing and dissemination phases of the ac tivity were transferred to University Microfilms/Xerox of Ann Arbor, Michigan, with the thought that such an arrangement would be more beneficial to the academic and general scientific and technical community. After five years of this joint undertaking we had concluded that it was in the interest of all concerned if the printing and distribution of the volume were handled by an international publishing. house to assure improved service and broader dissemination. Hence, starting with Volume 18, Masters Theses in the Pure and Applied Sciences has been disseminated on a worldwide basis by Plenum Publishing Corporation of New York, and in the same year the coverage was broadened to include Canadian universities. All back issues can also be ordered from Plenum. We have reported in Volume 25 (thesis year 1980) a total of 10,308 theses titles from 27 Canadian and 214 United States universities. We are sure that this broader base for theses titles reported will greatly enhance the value of this important annual reference work. While Volume 25 reports theses submitted in 1980, on occasion, certain universities do report theses submitted in previous years but not reported at the time.
Author: Rajpal Sirohi
Publisher: CRC Press
ISBN: 1351837249
Category : Technology & Engineering
Languages : en
Pages : 218
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Book Description
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 956
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Book Description
Author: Pierre-Alexandre Blanche
Publisher: Elsevier
ISBN: 012817255X
Category : Science
Languages : en
Pages : 222
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Book Description
Optical Holography: Materials, Theory and Applications provides researchers the fundamentals of holography through diffraction optics and an overview of the most relevant materials and applications, ranging from computer holograms to holographic data storage. Dr. Pierre Blanche leads a team of thought leaders in academia and industry in this practical reference for researchers and engineers in the field of holography. This book presents all the information readers need in order to understand how holographic techniques can be applied to a variety of applications, the benefits of those techniques, and the materials that enable these technologies. Researchers and engineers will gain comprehensive knowledge on how to select the best holographic techniques for their needs. Covers current applications of holographic techniques in areas such as 3D television, solar concentration, non-destructive testing and data storage Describes holographic recording materials and their most relevant applications Provides the fundamentals of holography and diffraction optics
Author: Maciej Jaroszewski
Publisher: John Wiley & Sons
ISBN: 1119128641
Category : Technology & Engineering
Languages : en
Pages : 464
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Book Description
A comprehensive review of the field of materials that shield people and sensitive electronic devices from electromagnetic fields Advanced Materials for Electromagnetic Shielding offers a thorough review of the most recent advances in the processing and characterization of the electromagnetic shielding materials. In this groundbreaking book, the authors—noted experts in the field—discuss the fundamentals of shielding theory as well as the practice of electromagnetic field measuring techniques and systems. They also explore applications of shielding materials used as absorbers of electromagnetic radiation, or as magnetic shields and explore coverage of new advanced materials for EMI shielding in aerospace applications. In addition, the text contains methods of preparation and applicability of metal foams. This comprehensive text examines the influence of technology on the micro-and macrostructure of polymers enabling their use in screening technology, technologies of shielding materials based on textiles, and analyses of its effectiveness in screening. The book also details the method of producing nanowires and their applications in EM shielding. This important resource: Explores the burgeoning market of electromagnetic shielding materials as we create, depend upon, and are exposed to more electronic devices than ever Addresses the most comprehensive issues relating to electromagnetic fields Contains information on the manufacturing, characterization methods, and properties of materials used to protect against them Discusses the important characterization techniques compared with one another, thus allowing scientists to select the best approach to a problem Written for materials scientists, electrical and electronics engineers, physicists, and industrial researchers, Advanced Materials for Electromagnetic Shielding explores all aspects in the area of electromagnetic shielding materials and examines the current state-of-the-art and new challenges in this rapidly growing area.
