Author: David Geoffrey Vincent
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Studies of electrical resistivity in thin metallic films at low temperature
Author: David Geoffrey Vincent
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Electrical Resistivity of Thin Metal Films
Author: Peter Wissmann
Publisher: Springer Science & Business Media
ISBN: 3540484884
Category : Science
Languages : en
Pages : 135
Book Description
The intent of this book is to report on the electrical, optical, and structural properties of silver and gold films in dependence on substrate material, annealing treatment, and gas adsorption. A main point is the calculation of the scattering cross section of the conduction electrons. All results are substantiated by extended experimental data, as well as numerous illustrations and tables.
Publisher: Springer Science & Business Media
ISBN: 3540484884
Category : Science
Languages : en
Pages : 135
Book Description
The intent of this book is to report on the electrical, optical, and structural properties of silver and gold films in dependence on substrate material, annealing treatment, and gas adsorption. A main point is the calculation of the scattering cross section of the conduction electrons. All results are substantiated by extended experimental data, as well as numerous illustrations and tables.
Electrical Resistivity of Thin Metal Films
Author: Peter Wissmann
Publisher: Springer
ISBN: 3540484906
Category : Science
Languages : en
Pages : 134
Book Description
The intent of this book is to report on the electrical, optical, and structural properties of silver and gold films in dependence on substrate material, annealing treatment, and gas adsorption. A main point is the calculation of the scattering cross section of the conduction electrons. All results are substantiated by extended experimental data, as well as numerous illustrations and tables.
Publisher: Springer
ISBN: 3540484906
Category : Science
Languages : en
Pages : 134
Book Description
The intent of this book is to report on the electrical, optical, and structural properties of silver and gold films in dependence on substrate material, annealing treatment, and gas adsorption. A main point is the calculation of the scattering cross section of the conduction electrons. All results are substantiated by extended experimental data, as well as numerous illustrations and tables.
Metal Based Thin Films for Electronics
Author: Klaus Wetzig
Publisher: John Wiley & Sons
ISBN: 3527606475
Category : Science
Languages : en
Pages : 388
Book Description
This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers, such as metallization and barrier layers for microelectronics, magnetoresistive layers for GMR and TMR, sensor and resistance layers. As such, the book addresses materials specialists in industry, especially in microelectronics, as well as scientists, and can also be recommended for advanced studies in materials science, analytics, surface and solid state science.
Publisher: John Wiley & Sons
ISBN: 3527606475
Category : Science
Languages : en
Pages : 388
Book Description
This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers, such as metallization and barrier layers for microelectronics, magnetoresistive layers for GMR and TMR, sensor and resistance layers. As such, the book addresses materials specialists in industry, especially in microelectronics, as well as scientists, and can also be recommended for advanced studies in materials science, analytics, surface and solid state science.
The Physical Properties of Thin Metal Films
Author: G.P. Zhigal'skii
Publisher: CRC Press
ISBN: 9781420024074
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Publisher: CRC Press
ISBN: 9781420024074
Category : Technology & Engineering
Languages : en
Pages : 234
Book Description
Thin films of conducting materials, such as metals, alloys and semiconductors are currently in use in many areas of science and technology, particularly in modern integrated circuit microelectronics that require high quality thin films for the manufacture of connection layers, resistors and ohmic contacts. These conducting films are also important for fundamental investigations in physics, radio-physics and physical chemistry. Physical Properties of Thin Metal Films provides a clear presentation of the complex physical properties particular to thin conducting films and includes the necessary theory, confirming experiments and applications. The volume will be an invaluable reference for graduates, engineers and scientists working in the electronics industry and fields of pure and applied science.
Survey of Electrical Resistivity Measurements on 16 Pure Metals in the Temperature Range 0 to 2730 K
Author: L. A. Hall
Publisher:
ISBN:
Category : Electric resistance
Languages : en
Pages : 120
Book Description
Publisher:
ISBN:
Category : Electric resistance
Languages : en
Pages : 120
Book Description
The Electrical Behavior of Thin Metallic Films Condensed at Low Temperatures
Author: Henry Rees Mitchell
Publisher:
ISBN:
Category : Electric conductivity
Languages : en
Pages : 76
Book Description
Publisher:
ISBN:
Category : Electric conductivity
Languages : en
Pages : 76
Book Description
Theoretical and Experimental Studies on Non-Fourier Heat Conduction Based on Thermomass Theory
Author: Hai-Dong Wang
Publisher: Springer Science & Business Media
ISBN: 3642539777
Category : Science
Languages : en
Pages : 124
Book Description
This book mainly focuses on the theoretical and experimental study of non-Fourier heat conduction behavior. A novel thermomass theory is used as the theoretical basis, which provides a general heat conduction equation for the accurate prediction of non-Fourier heat conduction. In order to prove the validity of this thermomass theory, a large current was used to heat the metallic nanofilm at the minimum temperature of 3 K. The measured average temperature of the nanofilm was notably higher than the prediction of Fourier’s heat diffusion equation, while matching well with the general heat conduction equation. This is the first time that steady non-Fourier heat conduction has been observed. Moreover, this book concerns the role of electron-phonon interaction in metallic nanofilms, which involves the breakdown of the Wiedemann-Franz law at low temperatures and interfacial thermal resistance at femtosecond timescales. Readers will find useful information on non-Fourier heat conduction and the latest advances in the study of charge and heat transport in metallic nanofilms.
Publisher: Springer Science & Business Media
ISBN: 3642539777
Category : Science
Languages : en
Pages : 124
Book Description
This book mainly focuses on the theoretical and experimental study of non-Fourier heat conduction behavior. A novel thermomass theory is used as the theoretical basis, which provides a general heat conduction equation for the accurate prediction of non-Fourier heat conduction. In order to prove the validity of this thermomass theory, a large current was used to heat the metallic nanofilm at the minimum temperature of 3 K. The measured average temperature of the nanofilm was notably higher than the prediction of Fourier’s heat diffusion equation, while matching well with the general heat conduction equation. This is the first time that steady non-Fourier heat conduction has been observed. Moreover, this book concerns the role of electron-phonon interaction in metallic nanofilms, which involves the breakdown of the Wiedemann-Franz law at low temperatures and interfacial thermal resistance at femtosecond timescales. Readers will find useful information on non-Fourier heat conduction and the latest advances in the study of charge and heat transport in metallic nanofilms.
Survey of Electrical Resistivity Measurements on 8 Additional Pure Metals in the Temperature Range 0 to 273 K
Author: L. A. Hall
Publisher:
ISBN:
Category : Electric resistance
Languages : en
Pages : 96
Book Description
Publisher:
ISBN:
Category : Electric resistance
Languages : en
Pages : 96
Book Description
Journal of Research of the National Institute of Standards and Technology
Author:
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 842
Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 842
Book Description
Reports NIST research and development in the physical and engineering sciences in which the Institute is active. These include physics, chemistry, engineering, mathematics, and computer sciences. Emphasis on measurement methodology and the basic technology underlying standardization.