Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures

Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures PDF Author:
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 386

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Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures

Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures PDF Author:
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 386

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Book Description


Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592

Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 PDF Author: D. A. Buchanan
Publisher: Mrs Proceedings
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 408

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.

Chemical Processing of Dielectrics, Insulators and Electronic Ceramics: Volume 606

Chemical Processing of Dielectrics, Insulators and Electronic Ceramics: Volume 606 PDF Author: Anthony C. Jones
Publisher:
ISBN:
Category : Crafts & Hobbies
Languages : en
Pages : 336

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Amorphous and Heterogeneous Silicon Thin Films - 2000: Volume 609

Amorphous and Heterogeneous Silicon Thin Films - 2000: Volume 609 PDF Author: Robert W. Collins
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 1118

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability

Oxide Reliability: A Summary Of Silicon Oxide Wearout, Breakdown, And Reliability PDF Author: David J Dumin
Publisher: World Scientific
ISBN: 981448945X
Category : Technology & Engineering
Languages : en
Pages : 281

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Book Description
This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

Amorphous and Heterogeneous Silicon Thin Films

Amorphous and Heterogeneous Silicon Thin Films PDF Author:
Publisher:
ISBN:
Category : Amorphous semiconductors
Languages : en
Pages :

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Thin Films - Stresses and Mechanical Properties VIII: Volume 594

Thin Films - Stresses and Mechanical Properties VIII: Volume 594 PDF Author: Richard Vinci
Publisher: Mrs Proceedings
ISBN:
Category : Science
Languages : en
Pages : 576

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Magnetic Materials, Structures and Processing for Information Storage: Volume 614

Magnetic Materials, Structures and Processing for Information Storage: Volume 614 PDF Author: Materials Research Society. Fall Meeting
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 200

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Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Ferroelectric Thin Films VIII: Volume 596

Ferroelectric Thin Films VIII: Volume 596 PDF Author: R. W. Schwartz
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 610

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Book Description
This book, the eighth in a popular series from MRS, features the latest technical information on ferroelectric thin films from an international mix of academia, industry and government organizations. Recent results for DRAM and FERAM devices, as well as enhancements in material performance for these applications, are presented. Significant advances in understanding leakage current, frequency dependence of the coercive field, hydrogen annealing effects, piezoelectric constants, and domain switching responses are highlighted. The development of ferroelectric thin films for piezoelectric applications are also reviewed, as are improved film-fabrication procedures including chemical vapor deposition and chemical solution deposition. Topics include: BST thin films and DRAM; integration and electrodes; Bi-based thin-film ferroelectrics; Pb-based thin-film ferroelectrics; fundamental properties of thin-film ferroelectrics; ferroelectric gate materials and devices; and piezoelectric, pyro-electric and capacitor devices and novel processing strategies.

Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics

Materials, Technology, and Reliability for Advanced Interconnects and Low-k Dielectrics PDF Author:
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 624

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Book Description