Statistical Concepts in Metrology, with a Postscript on Statistical Graphics PDF Download
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Author: Harry H. Ku
Publisher:
ISBN:
Category : Mathematical statistics
Languages : en
Pages : 52
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Author: Harry H. Ku
Publisher:
ISBN:
Category : Mathematical statistics
Languages : en
Pages : 52
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Book Description
Author: Stephen Crowder
Publisher: Springer Nature
ISBN: 3030533298
Category : Mathematics
Languages : en
Pages : 357
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Book Description
This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.
Author: Rebecca J. Pardee
Publisher:
ISBN:
Category :
Languages : en
Pages : 360
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Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 360
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Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 816
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Book Description
Lists citations with abstracts for aerospace related reports obtained from world wide sources and announces documents that have recently been entered into the NASA Scientific and Technical Information Database.
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 620
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Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1240
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Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 526
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Book Description
![IEEE/CPMT International Electronic Manufacturing Technology Symposium : [proceedings]. PDF](https://books.google.com/books/content/images/frontcover/kvlVAAAAMAAJ?fife=w80-h100)
Author:
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 538
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Author: Walt Trybula
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 536
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