Author:
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 720
Book Description
SPIE ... Publications Index
Author:
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 720
Book Description
Publisher:
ISBN:
Category : Optics
Languages : en
Pages : 720
Book Description
Laser Beam Propagation in the Atmosphere
Author: Hugo Weichel
Publisher: SPIE Press
ISBN: 9780819404879
Category : Science
Languages : en
Pages : 114
Book Description
Publisher: SPIE Press
ISBN: 9780819404879
Category : Science
Languages : en
Pages : 114
Book Description
Current Catalog
Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 704
Book Description
First multi-year cumulation covers six years: 1965-70.
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 704
Book Description
First multi-year cumulation covers six years: 1965-70.
Field Guide to Digital Micro-optics
Author: Bernard C. Kress
Publisher:
ISBN: 9781628411843
Category : Diffraction gratings
Languages : en
Pages : 172
Book Description
Traditional macro-optics can be designed without complex design software tools. However, digital optics, especially wafer-scale micro-optics, require specific software and tools. There is often no analytical solution, and thus complex iterative optimization algorithms may be required. This book covers refractive and diffractive micro-optics, the iterative optimization process, and modeling and fabrication techniques crucial to this field. The ability to create hybrid systems capable of producing analog and digital functionality is also addressed.
Publisher:
ISBN: 9781628411843
Category : Diffraction gratings
Languages : en
Pages : 172
Book Description
Traditional macro-optics can be designed without complex design software tools. However, digital optics, especially wafer-scale micro-optics, require specific software and tools. There is often no analytical solution, and thus complex iterative optimization algorithms may be required. This book covers refractive and diffractive micro-optics, the iterative optimization process, and modeling and fabrication techniques crucial to this field. The ability to create hybrid systems capable of producing analog and digital functionality is also addressed.
Optical Engineering
Author:
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 1142
Book Description
Publishes papers reporting on research and development in optical science and engineering and the practical applications of known optical science, engineering, and technology.
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 1142
Book Description
Publishes papers reporting on research and development in optical science and engineering and the practical applications of known optical science, engineering, and technology.
Wavefront Optics for Vision Correction
Author: Guang-ming Dai
Publisher: SPIE Press
ISBN: 0819469661
Category : Ophthalmology
Languages : en
Pages : 367
Book Description
This book addresses some of the issues in visual optics with a functional analysis of ocular aberrations, especially for the purpose of vision correction. The basis is the analytical representation of ocular aberrations with a set of orthonormal polynomials, such as Zernike polynomials or the Fourier series. Although the aim of this book is the application of wavefront optics to laser vision correction, most of the theories discussed are equally applicable to other methods of vision correction, such as contact lenses and intraocular lenses.
Publisher: SPIE Press
ISBN: 0819469661
Category : Ophthalmology
Languages : en
Pages : 367
Book Description
This book addresses some of the issues in visual optics with a functional analysis of ocular aberrations, especially for the purpose of vision correction. The basis is the analytical representation of ocular aberrations with a set of orthonormal polynomials, such as Zernike polynomials or the Fourier series. Although the aim of this book is the application of wavefront optics to laser vision correction, most of the theories discussed are equally applicable to other methods of vision correction, such as contact lenses and intraocular lenses.
How to Write a Good Scientific Paper
Author: CHRIS A. MACK
Publisher:
ISBN: 9781510619135
Category : Academic writing
Languages : en
Pages : 122
Book Description
Many scientists and engineers consider themselves poor writers or find the writing process difficult. The good news is that you do not have to be a talented writer to produce a good scientific paper, but you do have to be a careful writer. In particular, writing for a peer-reviewed scientific or engineering journal requires learning and executing a specific formula for presenting scientific work. This book is all about teaching the style and conventions of writing for a peer-reviewed scientific journal. From structure to style, titles to tables, abstracts to author lists, this book gives practical advice about the process of writing a paper and getting it published.
Publisher:
ISBN: 9781510619135
Category : Academic writing
Languages : en
Pages : 122
Book Description
Many scientists and engineers consider themselves poor writers or find the writing process difficult. The good news is that you do not have to be a talented writer to produce a good scientific paper, but you do have to be a careful writer. In particular, writing for a peer-reviewed scientific or engineering journal requires learning and executing a specific formula for presenting scientific work. This book is all about teaching the style and conventions of writing for a peer-reviewed scientific journal. From structure to style, titles to tables, abstracts to author lists, this book gives practical advice about the process of writing a paper and getting it published.
Optical Scattering
Author: John C. Stover
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
Publisher: SPIE-International Society for Optical Engineering
ISBN: 9780819492517
Category : Light
Languages : en
Pages : 0
Book Description
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light.
National Library of Medicine Current Catalog
Author: National Library of Medicine (U.S.)
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1032
Book Description
Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1032
Book Description
State-of-the-art Infrared Detector Technology
Author: Michael A. Kinch
Publisher:
ISBN: 9781628412895
Category : Infrared detectors
Languages : en
Pages : 0
Book Description
Examines both the current and future performance of infrared focal plane arrays that use the various device architectures associated with these two materials technologies. All spectral bands from long wavelength (LWIR) through mid-wavelength (MWIR) to short wavelength (SWIR) are considered, with a view to achieving background and diffraction-limited system performance at room temperature for all wavelengths.
Publisher:
ISBN: 9781628412895
Category : Infrared detectors
Languages : en
Pages : 0
Book Description
Examines both the current and future performance of infrared focal plane arrays that use the various device architectures associated with these two materials technologies. All spectral bands from long wavelength (LWIR) through mid-wavelength (MWIR) to short wavelength (SWIR) are considered, with a view to achieving background and diffraction-limited system performance at room temperature for all wavelengths.