Spectroscopic Infrared Ellipsometry on Functional Polymer Films PDF Download
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Author: Andreas Furchner
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Andreas Furchner
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Author: Arnulf Röseler
Publisher: VCH
ISBN:
Category : Ellipsometry
Languages : en
Pages : 168
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Author: Karsten Hinrichs
Publisher: Springer
ISBN: 3319758950
Category : Science
Languages : en
Pages : 549
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Book Description
This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.
Author: Michael Claybourn
Publisher: Global Press LLC
ISBN:
Category : Science
Languages : en
Pages : 256
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Author: Andrew T. S. Wee
Publisher: John Wiley & Sons
ISBN: 3527833951
Category : Technology & Engineering
Languages : en
Pages : 213
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Book Description
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
Author: H. Ishida
Publisher: Springer Science & Business Media
ISBN: 1468477765
Category : Science
Languages : en
Pages : 447
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Book Description
This book contains the proceedings of the Symposium on FT-IR Characterization of Polymers, which was held under the auspices of the Division of Polymer Chemistry, American Chemical Society (ACS) during the annual ACS meeting in Philadelphia, August, 1984. The content of each paper has been substantially extended from the papers presented during the conference. Due to the accidental, irrecoverable loss of the entire contents of the book by the computer system used for editorial purposes, the publication of this book has been delayed more than one year over the initial scheduled date. It has been a continuous, frustrating experience for the editor as well as for the authors. An extended Murphy's law, -anything can go wrong goes multiply wrong- has been demonstrated in editor's office. It necessitated, otherwise unnecessary, repeated proof reading during which time the editor had valuable experience ~n familiarizing himself with each paper much more than usual. The papers in this book are state-of-the-art even after such a delay. It is the authors pride and integrity toward the quality of each paper that makes the value of this book long lasting, while responsibility of the loss of any timeliness rests at the editor's hand. For the purpose of official records, submission and acceptance dates must be stated. All papers had been submitted by September, 1984, and had been accepted for publication by November, 1984, after the critical review processes.
Author: Hiroyuki Fujiwara
Publisher: John Wiley & Sons
ISBN: 9780470060186
Category : Technology & Engineering
Languages : en
Pages : 388
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Book Description
Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.
Author: Harland G. Tompkins
Publisher: Momentum Press
ISBN: 1606507281
Category : Technology & Engineering
Languages : en
Pages : 138
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Book Description
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Author: Shangzhi Chen
Publisher: Linköping University Electronic Press
ISBN: 9179297455
Category :
Languages : en
Pages : 142
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Book Description
Intrinsically conducting polymers forms a category of doped conjugated polymers that can conduct electricity. Since their discovery in the late 1970s, they have been widely applied in many fields, ranging from optoelectronic devices to biosensors. The most common type of conducting polymers is poly(3,4-ethylenedioxythiophene), or PEDOT. PEDOT has been popularly used as electrodes for solar cells or light-emitting diodes, as channels for organic electrochemical transistors, and as p-type legs for organic thermoelectric generators. Although many studies have been dedicated to PEDOT-based materials, there has been a lack of a unified model to describe their optical properties across different spectral ranges. In addition, the interesting optical properties of PEDOT-based materials, benefiting from its semi-metallic character, have only been rarely studied and utilized, and could potentially enable new applications. Plasmonics is a research field focusing on interactions between light and metals, such as the noble metals (gold and silver). It has enabled various opportunities in fundamental photonics as well as practical applications, varying from biosensors to colour displays. This thesis explores highly conducting polymers as alternatives to noble metals and as a new type of active plasmonic materials. Despite high degrees of microstructural disorder, conducting polymers can possess electrical conductivity approaching that of poor metals, with particularly high conductivity for PEDOT deposited via vapour phase polymerization (VPP). In this thesis, we systematically studied the optical and structural properties of VPP PEDOT thin films and their nanostructures for plasmonics and other optical applications. We employed ultra-wide spectral range ellipsometry to characterize thin VPP PEDOT films and proposed an anisotropic Drude-Lorentz model to describe their optical conductivity, covering the ultraviolet, visible, infrared, and terahertz ranges. Based on this model, PEDOT doped with tosylate (PEDOT:Tos) presented negative real permittivity in the near infrared range. While this indicated optical metallic character, the material also showed comparably large imaginary permittivity and associated losses. To better understand the VPP process, we carefully examined films with a collection of microstructural and spectroscopic characterization methods and found a vertical layer stratification in these polymer films. We unveiled the cause as related to unbalanced transport of polymerization precursors. By selection of suitable counterions, e.g., trifluoromethane sulfonate (OTf), and optimization of reaction conditions, we were able to obtain PEDOT films with electrical conductivity exceeding 5000 S/cm. In the near infrared range from 1 to 5 µm, these PEDOT:OTf films provided a well-defined plasmonic regime, characterized by negative real permittivity and lower magnitude imaginary component. Using a colloidal lithography-based approach, we managed to fabricate nanodisks of PEDOT:OTf and showed that they exhibited clear plasmonic absorption features. The experimental results matched theoretical calculations and numerical simulations. Benefiting from their mixed ionic-electronic conducting characters, such organic plasmonic materials possess redox-tunable properties that make them promising as tuneable optical nanoantennas for spatiotemporally dynamic systems. Finally, we presented a low-cost and efficient method to create structural colour surfaces and images based on UV-treated PEDOT films on metallic mirrors. The concept generates beautiful and vivid colours through-out the visible range utilizing a synergistic effect of simultaneously modulating polymer absorption and film thickness. The simplicity of the device structure, facile fabrication process, and tunability make this proof-of-concept device a potential candidate for future low-cost backlight-free displays and labels.
Author: Luigia Sabbatini
Publisher: Walter de Gruyter GmbH & Co KG
ISBN: 3110701146
Category : Technology & Engineering
Languages : en
Pages : 527
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Book Description
This fully updated edition provides a broad approach to the surface analysis of polymers being of high technological interest. Modern analytical techniques, potential applications and recent advances in instrumental apparatus are discussed. The self-consistent chapters are devoted to spectroscopic and microscopic techniques which represent powerful tools for the characterization of morphology and chemical, physical, mechanical properties of polymer surfaces, interfaces, and thin fi lms. Selection of techniques which can properly address very shallow depth of surfaces, spanning from few angstroms to tens of nanometers Interaction of polymer surfaces with their surroundings is pointed out as a critical issue for specifi c applications
