Author: Laurence T. Yang
Publisher:
ISBN:
Category :
Languages : en
Pages : 132

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Book Description

Author: Raimund Ubar
Publisher: IGI Global
ISBN: 1609602145
Category : Computers
Languages : en
Pages : 550

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Book Description
"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC)"--

Author: Erik Larsson
Publisher: Springer Science & Business Media
ISBN: 0387256245
Category : Technology & Engineering
Languages : en
Pages : 397

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Book Description
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Author: Krishnendu Chakrabarty
Publisher:
ISBN:
Category :
Languages : en
Pages : 199

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Author: Bart Vermeulen
Publisher: Springer
ISBN: 3319062425
Category : Technology & Engineering
Languages : en
Pages : 314

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Book Description
This book describes an approach and supporting infrastructure to facilitate debugging the silicon implementation of a System-on-Chip (SOC), allowing its associated product to be introduced into the market more quickly. Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors. The authors’ novel communication-centric, scan-based, abstraction-based, run/stop-based (CSAR) debug approach is discussed in detail, showing how it helps to meet debug requirements and address the nine, previously identified factors that complicate debugging silicon implementations of SOCs. The authors also derive the debug infrastructure requirements to support debugging of a silicon implementation of an SOC with their CSAR debug approach. This debug infrastructure consists of a generic on-chip debug architecture, a configurable automated design-for-debug flow to be used during the design of an SOC, and customizable off-chip debugger software. Coverage includes an evaluation of the efficiency and effectiveness of the CSAR approach and its supporting infrastructure, using six industrial SOCs and an illustrative, example SOC model. The authors also quantify the hardware cost and design effort to support their approach.

Author: Christos Koulamas
Publisher: MDPI
ISBN: 3038975095
Category : Computers
Languages : en
Pages : 189

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Book Description
This book is a printed edition of the Special Issue "Real-Time Embedded Systems" that was published in Electronics

Author: Krishnendu Chakrabarty
Publisher: Springer Science & Business Media
ISBN: 9781402072055
Category : Computers
Languages : en
Pages : 218

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Book Description
Various aspects of system-on-a-chip (SOC) integrated circuit testing are addressed in 13 papers on test planning, access, and scheduling; test data compression; and interconnect, crosstalk, and signal integrity. Topics include concurrent test of core-based SOC design and testing for interconnect crosstalk defects using on-chip embedded processor cores. The editor is affiliated with Duke University. The book is reprinted from a Special Issue of the Journal of Electronic Testing, vol. 18, nos. 4 & 5. There is no subject index. Annotation (c)2003 Book News, Inc., Portland, OR (booknews.com).

Author: Ravi Shankar
Publisher: Academic Press
ISBN: 1483217841
Category : Technology & Engineering
Languages : en
Pages : 502

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Book Description
VLSI Electronics Microstructure Science, Volume 20: VLSI and Computer Architecture reviews the approaches in design principles and techniques and the architecture for computer systems implemented in VLSI. This volume is divided into two parts. The first section is concerned with system design. Chapters under this section focus on the discussion of such topics as the evolution of VLSI; system performance and processor design considerations; and VLSI system design and processing tools. Part II of the book focuses on the architectural possibilities that have become cost effective with the development of VLSI circuits. Topics on architectural requirements and various architectures such as the Reduced Instruction Set, Extended Von Neumann, Language-Oriented, and Microprogrammable architectures are elaborated in detail. Also included are chapters that discuss the evaluation of architecture, multiprocessing configurations, and the future of VLSI. Computer designers, those evaluating computer systems, researchers, and students of computer architecture will find the book very useful.

Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 9781846280238
Category : Technology & Engineering
Languages : en
Pages : 396

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Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively

Author: Luciano Lavagno
Publisher: CRC Press
ISBN: 1351830996
Category : Technology & Engineering
Languages : en
Pages : 773

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Book Description
The first of two volumes in the Electronic Design Automation for Integrated Circuits Handbook, Second Edition, Electronic Design Automation for IC System Design, Verification, and Testing thoroughly examines system-level design, microarchitectural design, logic verification, and testing. Chapters contributed by leading experts authoritatively discuss processor modeling and design tools, using performance metrics to select microprocessor cores for integrated circuit (IC) designs, design and verification languages, digital simulation, hardware acceleration and emulation, and much more. New to This Edition: Major updates appearing in the initial phases of the design flow, where the level of abstraction keeps rising to support more functionality with lower non-recurring engineering (NRE) costs Significant revisions reflected in the final phases of the design flow, where the complexity due to smaller and smaller geometries is compounded by the slow progress of shorter wavelength lithography New coverage of cutting-edge applications and approaches realized in the decade since publication of the previous edition—these are illustrated by new chapters on high-level synthesis, system-on-chip (SoC) block-based design, and back-annotating system-level models Offering improved depth and modernity, Electronic Design Automation for IC System Design, Verification, and Testing provides a valuable, state-of-the-art reference for electronic design automation (EDA) students, researchers, and professionals.