Selected Papers on Speckle Metrology PDF Download
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Author: R. S. Sirohi
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 692
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Book Description
Author: R. S. Sirohi
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 692
Get Book Here
Book Description
Author: R.S. Sirohi
Publisher: CRC Press
ISBN: 1000104958
Category : Technology & Engineering
Languages : en
Pages : 572
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Book Description
This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Author: Guillermo H. Kaufmann
Publisher: John Wiley & Sons
ISBN: 3527633871
Category : Science
Languages : en
Pages : 322
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Book Description
Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more powerful digital computers, and novel data processing approaches. This most up-to-date overview of the topic describes new techniques developed in the field of speckle metrology over the last decade, as well as applications to experimental mechanics, material science, optical testing, and fringe analysis.
Author: R. S. Sirohi
Publisher:
ISBN:
Category : Holographic interferometry
Languages : en
Pages : 700
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Book Description
Author: S. C. Kaushik
Publisher: Allied Publishers
ISBN: 9788177642698
Category : Optics
Languages : en
Pages : 568
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Book Description
In Indian context.
Author: Daniel Malacara
Publisher: CRC Press
ISBN: 9780203908266
Category : Science
Languages : en
Pages : 1008
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Book Description
This handbook explains principles, processes, methods, and procedures of optical engineering in a concise and practical way. It emphasizes fundamental approaches and provides useful formulas and step-by-step worked-out examples to demonstrate applications and clarify calculation methods. The book covers refractive, reflective, and diffractive optical components; lens optical devices; modern fringe pattern analysis; optical metrology; Fourier optics and optical image processing; electro-optical and acousto-optical devices; spatial and spectral filters; optical fibers and accessories; optical fabrication; and more. It includes over 2,000 tables, flow charts, graphs, schematics, drawings, photographs, and mathematical expressions.
Author: Rajpal Sirohi
Publisher: CRC Press
ISBN: 1420017764
Category : Technology & Engineering
Languages : en
Pages : 317
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Book Description
Optical Methods of Measurement: Wholefield Techniques, Second Edition provides a comprehensive collection of wholefield optical measurement techniques for engineering applications. Along with the reorganization of contents, this edition includes a new chapter on optical interference, new material on nondiffracting and singular beams and their applications, and updated bibliography and additional reading sections. The book explores the propagation of laser beams, metrological applications of phase-singular beams, various detectors such as CCD and CMOS devices, and recording materials. It also covers interference, diffraction, and digital fringe pattern measurement techniques, with special emphasis on phase measurement interferometry and algorithms. The remainder of the book focuses on theory, experimental arrangements, and applications of wholefield techniques. The author discusses digital hologram interferometry, digital speckle photography, digital speckle pattern interferometry, Talbot interferometry, and holophotoelasticity. This updated book compiles the major wholefield methods of measurement in one volume. It provides a solid understanding of the techniques by describing the physics behind them. In addition, the examples given illustrate how the techniques solve measurement problems.
Author: Peter Meinlschmidt
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 556
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Book Description
This collection of papers offers the principles and practices of electronic speckle pattern interferometry (ESPI). It covers topics such as: parameters for design and optimization; measurment of static and dynamic surface displacements; pulsed lasers; and TV holography.
Author: Rajpal S. Sirohi
Publisher: CRC Press
ISBN: 1482236117
Category : Technology & Engineering
Languages : en
Pages : 437
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Book Description
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.
Author: R Erf
Publisher: Elsevier
ISBN: 0323154972
Category : Technology & Engineering
Languages : en
Pages : 346
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Book Description
Speckle Metrology presents a diverse and wide collection of metrological speckle techniques and applications. The book discusses both theoretical concepts and experimental methods in speckle-based measurements. Some chapters introduce speckle terminology and the physical characteristics of speckle. Other aspects also covered in the book include methodology, system geometries, data reduction procedures, and specific applications. These applications are discussed in detail in individual chapters, such as structures inspection. Adaptation of speckle measurement techniques in video recording and processing technology is also given emphasis in one chapter. Finally, one chapter is dedicated to a discussion on the speckle interferometer as one of the most used instrument in metrological speckle application. This text is a valuable reference to students in the fields of engineering and applied science.
