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Author: Vittal Kini
Publisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 134
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Book Description
Author: Vittal Kini
Publisher:
ISBN:
Category : Fault-tolerant computing
Languages : en
Pages : 134
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Book Description
Author: Daniel P. Siewiorek
Publisher:
ISBN:
Category : Multiprocessors
Languages : en
Pages : 135
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Book Description
Author: D. P. Siewiorek
Publisher:
ISBN:
Category :
Languages : en
Pages : 135
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Book Description
Author: Anup Kumar Das
Publisher: Springer
ISBN: 3319693743
Category : Technology & Engineering
Languages : en
Pages : 158
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Book Description
This book discusses analysis, design and optimization techniques for streaming multiprocessor systems, while satisfying a given area, performance, and energy budget. The authors describe design flows for both application-specific and general purpose streaming systems. Coverage also includes the use of machine learning for thermal optimization at run-time, when an application is being executed. The design flow described in this book extends to thermal and energy optimization with multiple applications running sequentially and concurrently.
Author: Daniel P. Siewiorek
Publisher:
ISBN:
Category :
Languages : en
Pages : 141
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Book Description
This report consists of two papers that treat reliability of the multiprocessor systems at CMU. The first paper discusses the multiprocessor architectures, reliability features (hardware and software), and measured reliability data. The second paper presents hard failure data from one of the systems, calibrates a hard failure rate model, and analytically models the reliability of the three systems.
Author: Ashok D. Inglé
Publisher:
ISBN:
Category : C.mmp (Computer)
Languages : en
Pages : 36
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Book Description
Multiprocessor systems, although designed for speed and processing power, lend inherently to redundancy. Appropriately designed distributed intelligence systems that use system reconfiguration and graceful degradation can be substantially more reliable than uniprocessor systems. Reliability models for two multiprocessor systems, C.mmp and Cm*, are presented and compared to a single LSI-11 processor. With the exception of spaceborne systems, most systems may be subjected to tests to ensure proper functioning. When performed regularly, these integrity checks enhance confidence in the system, and its expected mean time to failure. Effect of such periodic maintenance is modeled. The expected life is seen to depend strongly on the efficiency of the tests. The improvement in expected life, however, is observed to be limited by non-redundant parts of a system. Under periodic maintenance, Cm* system offers greater life than C.mmp for tasks allowing considerable redundancy.
Author: Anatoly Lisnianski
Publisher: Springer
ISBN: 3319634232
Category : Technology & Engineering
Languages : en
Pages : 378
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Book Description
This book addresses a modern topic in reliability: multi-state and continuous-state system reliability, which has been intensively developed in recent years. It offers an up-to-date overview of the latest developments in reliability theory for multi-state systems, engineering applications to a variety of technical problems, and case studies that will be of interest to reliability engineers and industrial managers. It also covers corresponding theoretical issues, as well as case studies illustrating the applications of the corresponding theoretical advances. The book is divided into two parts: Modern Mathematical Methods for Multi-state System Reliability Analysis (Part 1), and Applications and Case Studies (Part 2), which examines real-world multi-state systems. It will greatly benefit scientists and researchers working in reliability, as well as practitioners and managers with an interest in reliability and performability analysis. It can also be used as a textbook or as a supporting text for postgraduate courses in Industrial Engineering, Electrical Engineering, Mechanical Engineering, Applied Mathematics, and Operations Research.
Author: Zheng Wang
Publisher: Springer
ISBN: 9811010730
Category : Technology & Engineering
Languages : en
Pages : 210
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Book Description
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.
Author: J. R. Taylor
Publisher:
ISBN:
Category :
Languages : en
Pages : 90
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Book Description
Author: Roberto Abraham Valdivia
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
