Reliability Characterization of Digital Microcircuits PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Reliability Characterization of Digital Microcircuits PDF full book. Access full book title Reliability Characterization of Digital Microcircuits by Chung P. Wu. Download full books in PDF and EPUB format.
Author: Chung P. Wu
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Get Book Here
Book Description
Author: Chung P. Wu
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Get Book Here
Book Description
Author: Chung P. Wu
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 888
Get Book Here
Book Description
Author: David B. Nicholls
Publisher:
ISBN:
Category :
Languages : en
Pages : 354
Get Book Here
Book Description
This report of digital evaluation and generic failure analysis data is one of a series of annual microcircuit device reliability data publications compiled by the Reliability Analysis Center. This compendium provides burn-in and environmental/screening data on SSI and MSI digital microcircuits. Each document in the series contains analyzed reliability information in addition to a detailed presentation of field and test results. This information aids in determining device fallout rates and the operational test and field characteristics of devices. Life test results can be reviewed. The relative risks of screening decisions may also be determined. Additionally, information is available to form the foundation for failure mode effects and criticality analyses(FMECA). Through the data presented, these publications are intended to actively complement such publications as MIL-STD-883 and MIL-HDBK-217B. The user is cautioned, however, that the listed data may not be used in lieu of contractually cited references.
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 436
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 412
Get Book Here
Book Description
Author: Mark R. Klein
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 344
Get Book Here
Book Description
Author: Roy C. Walker
Publisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 260
Get Book Here
Book Description
Author: Mark R. Klein
Publisher:
ISBN:
Category :
Languages : en
Pages : 226
Get Book Here
Book Description
Author: RELIABILITY ANALYSIS CENTER GRIFFISS AFB NY.
Publisher:
ISBN:
Category :
Languages : en
Pages : 403
Get Book Here
Book Description
This report concerns itself with the presentation and analysis of digital microcircuit reliability data, which has been compiled from a wide spectrum of military and commercial sources. The individual data elements represent both component life test and equipment reliability demonstration results, as well as actual field experience. For analysis purposes, this report separates these sources into two major sections. The first section presents the summarized results of test and field data, while the second section contains failure information derived from failure analysis of digital devices. In each of these sections, the data summaries are followed by a detailed listing of line entries which allow the reader to make the maximum use of the information compiled in this compendium. In addition to providing field and test results, MDR-17 presents comparisons between actual field experienced failure rates and MIL-HDBK-217C, Notice 1, predicted failure rates. The use of tables and graphs results in high visibility into the parameters which affect device failure rates, allowing correlation between observed and predicted failure rates to be made effectively. (Author).
