Records of the IEEE International Workshop on Memory Technology, Design and Testing PDF Download
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Author: David Lepejian
Publisher: IEEE Computer Society Press
ISBN:
Category : Cardiology
Languages : en
Pages : 524
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Book Description
Annotation The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc.
Author: David Lepejian
Publisher: IEEE Computer Society Press
ISBN:
Category : Cardiology
Languages : en
Pages : 524
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Book Description
Annotation The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc.
Author: Rochit Rajsuman
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 158
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Book Description
Author: Giovanni Campardo
Publisher: Springer Science & Business Media
ISBN: 9783540201984
Category : Computers
Languages : en
Pages : 616
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Book Description
VLSI-Design for Non-Volatile Memories is intended for electrical engineers and graduate students who want to enter into the integrated circuit design world. Non-volatile memories are treated as an example to explain general design concepts. Practical illustrative examples of non-volatile memories, including flash types, are showcased to give insightful examples of the discussed design approaches. A collection of photos is included to make the reader familiar with silicon aspects. Throughout all parts of this book, the authors have taken a practical and applications-driven point of view, providing a comprehensive and easily understood approach to all the concepts discussed. Giovanni Campardo and Rino Micheloni have a solid track record of leading design activities at the STMicroelectronics Flash Division. David Novosel is President and founder of Intelligent Micro Design, Inc., Pittsburg, PA.
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 864
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Book Description
Author: IEEE International Workshop on Memory Technology, Design and Testing
Publisher:
ISBN:
Category : Random access memory
Languages : en
Pages :
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Book Description
Author: Ian A. Grout
Publisher: Springer Science & Business Media
ISBN: 1846281733
Category : Technology & Engineering
Languages : en
Pages : 380
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Book Description
Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Author:
Publisher:
ISBN:
Category : Electronic circuit design
Languages : en
Pages : 298
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Book Description
Author: Yervant Zorian
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769512426
Category : Computers
Languages : en
Pages : 122
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Book Description
Annotation The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc.
Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 0306479729
Category : Technology & Engineering
Languages : en
Pages : 252
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Book Description
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.
Author: Zarin Tasnim Sandhie
Publisher: Springer Nature
ISBN: 3031161955
Category : Technology & Engineering
Languages : en
Pages : 110
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Book Description
This book provides readers with an overview of the fundamental definitions and features of Multiple-Valued Logic (MVL). The authors include a brief discussion of the historical development of MVL technologies, while the main goal of the book is to present a comprehensive review of different technologies that are being explored to implement multiple-valued or beyond-binary memory circuits and systems. The discussion includes the basic features, prospects, and challenges of each technology, while highlighting the significant works done on different branches of MVL memory architecture, such as sequential circuits, random access memory, Flash memory, etc.
