Author: Harold E. Marr
Publisher:
ISBN:
Category : Copper alloys
Languages : en
Pages : 24
Book Description
Rapid Identification of Copper-base Alloys
Author: Harold E. Marr
Publisher:
ISBN:
Category : Copper alloys
Languages : en
Pages : 24
Book Description
Publisher:
ISBN:
Category : Copper alloys
Languages : en
Pages : 24
Book Description
Atomic Absorption Methods of Analysis of Oilfield Brines: Barium, Calcium, Copper, Iron, Lead, Lithium, Magnesium, Manganese, Potassium, Sodium, Strontium, and Zinc
Author: A. Gene Collins
Publisher:
ISBN:
Category : Automobiles
Languages : en
Pages : 656
Book Description
Publisher:
ISBN:
Category : Automobiles
Languages : en
Pages : 656
Book Description
Report of Investigations
Author:
Publisher:
ISBN:
Category : Mineral industries
Languages : en
Pages : 730
Book Description
Publisher:
ISBN:
Category : Mineral industries
Languages : en
Pages : 730
Book Description
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 658
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 658
Book Description
Information Circular
Author:
Publisher:
ISBN:
Category : Mines and mineral resources
Languages : en
Pages : 712
Book Description
Publisher:
ISBN:
Category : Mines and mineral resources
Languages : en
Pages : 712
Book Description
A Review of Methods for Identifying Scrap Metals
Author:
Publisher:
ISBN:
Category : Scrap metals
Languages : en
Pages : 28
Book Description
Publisher:
ISBN:
Category : Scrap metals
Languages : en
Pages : 28
Book Description
Nuclear Science Abstracts
Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1068
Book Description
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 1068
Book Description
Advances in X-ray Analysis
Author:
Publisher:
ISBN:
Category : X-rays
Languages : en
Pages : 626
Book Description
Publisher:
ISBN:
Category : X-rays
Languages : en
Pages : 626
Book Description
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 652
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 652
Book Description
Advances in X-Ray Analysis
Author: C. Grant
Publisher: Springer
ISBN:
Category : Science
Languages : en
Pages : 624
Book Description
The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi ders the problem of sampling. If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.
Publisher: Springer
ISBN:
Category : Science
Languages : en
Pages : 624
Book Description
The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi ders the problem of sampling. If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.