Random Testing of Digital Circuits PDF Download
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Author: Rene David
Publisher: CRC Press
ISBN: 1000146014
Category : Technology & Engineering
Languages : en
Pages : 508
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Book Description
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author: Rene David
Publisher: CRC Press
ISBN: 1000146014
Category : Technology & Engineering
Languages : en
Pages : 508
Get Book Here
Book Description
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author: Rene David
Publisher: CRC Press
ISBN: 1000110168
Category : Technology & Engineering
Languages : en
Pages : 496
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Book Description
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
Author: Hubert Alan Miller
Publisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 312
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Book Description
Author: Kenneth David Wagner
Publisher:
ISBN:
Category :
Languages : en
Pages : 492
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Book Description
Author: David
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Author: B. R. Wilkins
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216
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Book Description
Author: Francis C. Wong
Publisher: Elsevier
ISBN: 0080504345
Category : Technology & Engineering
Languages : en
Pages : 248
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Book Description
Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
Author: N. K. Jha
Publisher: Cambridge University Press
ISBN: 9781139437431
Category : Computers
Languages : en
Pages : 1022
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Book Description
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through automatic test pattern generation, design for testability and built-in self-test of digital circuits before moving on to more advanced topics such as IDDQ testing, functional testing, delay fault testing, memory testing, and fault diagnosis. The book includes detailed treatment of the latest techniques including test generation for various fault models, discussion of testing techniques at different levels of integrated circuit hierarchy and a chapter on system-on-a-chip test synthesis. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Author: Stanford University Stanford Electronics Laboratories. Digital Systems Laboratory
Publisher:
ISBN:
Category :
Languages : en
Pages : 50
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Book Description
Compact testing uses random inputs to test digital circuits. Detection is achieved by comparison between some statistic property of the circuit under test, like the frequency of ones on the output line, and the same property for the fault-free circuit. This paper shows that compact testing can be used efficiently for sequential machines, although it has some inherent limitations. Synchronization is achieved by a long sequence of random inputs whose length is circuit dependent. However, for most sequential circuits, synchronization can be achieved in a few seconds. The great majority of failures inside the memory elements are easily detected even with short tests. Compact testing also detects most of the failures in the combinational parts. There, its efficiency is largely dependent upon the test length and also the characteristics of the random number generators. However, even the most subtle failures may be detected if the test has sufficient length. Some of the requirements and trade-offs to achieve efficient detection are presented.
Author: Parag K. Lala
Publisher: Academic Press
ISBN: 9780124343306
Category : Computers
Languages : en
Pages : 222
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Book Description
An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter.
