Process, Equipment, and Materials Control in Integrated Circuit Manufacturing IV PDF Download
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Author: Anthony J. Toprac
Publisher: Society of Photo Optical
ISBN: 9780819429667
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
A discussion of process, equipment, and materials control in integrated circuit manufacturing. It examines real-time and run-to-run modelling and control in integrated circuit manufacturing, the process of optimization in integrated circuit manufacturing, and more.
Author: Anthony J. Toprac
Publisher: Society of Photo Optical
ISBN: 9780819429667
Category : Technology & Engineering
Languages : en
Pages : 322
Get Book Here
Book Description
A discussion of process, equipment, and materials control in integrated circuit manufacturing. It examines real-time and run-to-run modelling and control in integrated circuit manufacturing, the process of optimization in integrated circuit manufacturing, and more.
Author: Anthony J. Toprac
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 322
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Book Description
Author:
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 332
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Book Description
Author: Anant G. Sabnis
Publisher: Society of Photo Optical
ISBN: 9780819420039
Category : Technology & Engineering
Languages : en
Pages : 238
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Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 176
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Book Description
Author: Robert Zorich
Publisher: Academic Press
ISBN: 0323140556
Category : Technology & Engineering
Languages : en
Pages : 604
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Book Description
Here is a comprehensive practical guide to entire wafer fabrication process from A to Z. Written by a practicing process engineer with years of experience, this book provides a thorough introduction to the complex field of IC manufacturing, including wafer area layout and design, yield optimization, just-in-time management systems, statistical quality control, fabrication equipment and its setup, and cleanroom techniques. In addition, it contains a wealth of information on common process problems: How to detect them, how to confirm them, and how to solve them. Whether you are a new enginner or technician just entering the field, a fabrication manager looking for ways to improve quality and production, or someone who would just like to know more about IC manufacturing, this is the book you're looking for. - Provides a readable, practical overview of the entire wafer fabrication process for new engineers and those just entering this complex field - Enables engineers and managers to improve production, raise quality levels, and solve problems that commonly occur in the fabrication process - Presents the latest techniques and gives special attention to Japanese IC manufacturing techniques, showing how they obtain outstanding quality
Author:
Publisher:
ISBN:
Category : American literature
Languages : en
Pages : 2520
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Book Description
Author: M. Meyyappan
Publisher: The Electrochemical Society
ISBN: 9781566771368
Category : Technology & Engineering
Languages : en
Pages : 366
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Book Description
Author: Bernd O. Kolbesen
Publisher: The Electrochemical Society
ISBN: 9781566773485
Category : Technology & Engineering
Languages : en
Pages : 572
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Book Description
.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.
Author: Spie
Publisher:
ISBN: 9788022448000
Category : Technology & Engineering
Languages : en
Pages :
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Book Description
