Author: Anthony J. Toprac
Publisher: Society of Photo Optical
ISBN: 9780819429667
Category : Technology & Engineering
Languages : en
Pages : 322
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Book Description
A discussion of process, equipment, and materials control in integrated circuit manufacturing. It examines real-time and run-to-run modelling and control in integrated circuit manufacturing, the process of optimization in integrated circuit manufacturing, and more.
Author: Anthony John Toprac
Publisher: Society of Photo Optical
ISBN: 9780819434791
Category : Technology & Engineering
Languages : en
Pages : 310
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Book Description
These papers on the manufacture of integrated circuitry focus on the areas of process, equipment and materials control.
Author: Society of Photo-optical Instrumentation Engineers
Publisher: Society of Photo Optical
ISBN: 9780819426451
Category : Technology & Engineering
Languages : en
Pages : 270
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Book Description
Author:
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 332
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Book Description
Author: Anthony J. Toprac
Publisher:
ISBN:
Category : Dielectric films
Languages : en
Pages : 322
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Book Description
Author: Anant G. Sabnis
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 238
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Book Description
Author: Armando Iturralde
Publisher: Society of Photo Optical
ISBN: 9780819422743
Category : Technology & Engineering
Languages : en
Pages : 258
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Book Description
Author: Gary S. May
Publisher: John Wiley & Sons
ISBN: 0471790273
Category : Technology & Engineering
Languages : en
Pages : 428
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Book Description
A practical guide to semiconductor manufacturing from processcontrol to yield modeling and experimental design Fundamentals of Semiconductor Manufacturing and Process Controlcovers all issues involved in manufacturing microelectronic devicesand circuits, including fabrication sequences, process control,experimental design, process modeling, yield modeling, and CIM/CAMsystems. Readers are introduced to both the theory and practice ofall basic manufacturing concepts. Following an overview of manufacturing and technology, the textexplores process monitoring methods, including those that focus onproduct wafers and those that focus on the equipment used toproduce wafers. Next, the text sets forth some fundamentals ofstatistics and yield modeling, which set the foundation for adetailed discussion of how statistical process control is used toanalyze quality and improve yields. The discussion of statistical experimental design offers readers apowerful approach for systematically varying controllable processconditions and determining their impact on output parameters thatmeasure quality. The authors introduce process modeling concepts,including several advanced process control topics such asrun-by-run, supervisory control, and process and equipmentdiagnosis. Critical coverage includes the following: * Combines process control and semiconductor manufacturing * Unique treatment of system and software technology and managementof overall manufacturing systems * Chapters include case studies, sample problems, and suggestedexercises * Instructor support includes electronic copies of the figures andan instructor's manual Graduate-level students and industrial practitioners will benefitfrom the detailed exami?nation of how electronic materials andsupplies are converted into finished integrated circuits andelectronic products in a high-volume manufacturingenvironment. An Instructor's Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. An Instructor Support FTP site is also available.
Author: Robert Zorich
Publisher: Academic Press
ISBN: 0323140556
Category : Technology & Engineering
Languages : en
Pages : 604
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Book Description
Here is a comprehensive practical guide to entire wafer fabrication process from A to Z. Written by a practicing process engineer with years of experience, this book provides a thorough introduction to the complex field of IC manufacturing, including wafer area layout and design, yield optimization, just-in-time management systems, statistical quality control, fabrication equipment and its setup, and cleanroom techniques. In addition, it contains a wealth of information on common process problems: How to detect them, how to confirm them, and how to solve them. Whether you are a new enginner or technician just entering the field, a fabrication manager looking for ways to improve quality and production, or someone who would just like to know more about IC manufacturing, this is the book you're looking for. - Provides a readable, practical overview of the entire wafer fabrication process for new engineers and those just entering this complex field - Enables engineers and managers to improve production, raise quality levels, and solve problems that commonly occur in the fabrication process - Presents the latest techniques and gives special attention to Japanese IC manufacturing techniques, showing how they obtain outstanding quality
Author: National Research Council
Publisher: National Academies Press
ISBN: 0309176670
Category : Technology & Engineering
Languages : en
Pages : 228
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Book Description
Manufacturing, reduced to its simplest form, involves the sequencing of product forms through a number of different processes. Each individual step, known as an unit manufacturing process, can be viewed as the fundamental building block of a nation's manufacturing capability. A committee of the National Research Council has prepared a report to help define national priorities for research in unit processes. It contains an organizing framework for unit process families, criteria for determining the criticality of a process or manufacturing technology, examples of research opportunities, and a prioritized list of enabling technologies that can lead to the manufacture of products of superior quality at competitive costs. The study was performed under the sponsorship of the National Science Foundation and the Defense Department's Manufacturing Technology Program.
