Proceedings of the Conference on Design, Automation and Test in Europe PDF Download
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Author: Donatella Sciuto
Publisher:
ISBN: 9783981080131
Category : Computer science
Languages : en
Pages : 1575
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Book Description
Author: Donatella Sciuto
Publisher:
ISBN: 9783981080131
Category : Computer science
Languages : en
Pages : 1575
Get Book
Book Description
Author:
Publisher:
ISBN: 9780818654107
Category : Computer engineering
Languages : en
Pages : 676
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Book Description
Proceedings of the conference jointly presented by EDAC, ETC, and EuroASIC--and therefore the premier European event in the field of CAD, design, and test of circuits and systems. The major emphasis of the CAD portion is on high level design and verification tools, but information on the latest developments in logic synthesis and layout automation is also supplied. The key area of focus in design is in digital design and design methodologies, but papers on mixed digital/analog and full system design are also presented. The emphasis in test is on design for testability and novel methods for fault simulation and test generation, with sessions on new test techniques such as inductive fault analysis and IDDQ testing. No index. Acidic paper. Annotation copyright by Book News, Inc., Portland, OR
Author:
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages : 714
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Author:
Publisher:
ISBN: 9780818670398
Category :
Languages : en
Pages :
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Author: Enrico Macii
Publisher:
ISBN: 9781581131215
Category :
Languages : en
Pages : 1944
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Author:
Publisher:
ISBN:
Category : Automatic test equipment
Languages : en
Pages : 578
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Book Description
Author:
Publisher:
ISBN: 9781450321532
Category : Computer-aided design
Languages : en
Pages : 1944
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Author:
Publisher:
ISBN:
Category : Computer-aided design
Languages : en
Pages : 648
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Book Description
Author:
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN:
Category : Computers
Languages : en
Pages : 648
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Book Description
Author: Dominique Borrione
Publisher: IEEE
ISBN: 9780769500782
Category : Computers
Languages : en
Pages : 798
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Book Description
This collection of essays provides a forum for the exchange of information on relevant issues and topics including: sequential circuits; architecture issues in low power design; mixed signal characterization and test; and testing regular structures and delay faults.
