Proceedings of the Ninth International Vacuum Congress and Fifth International Conference on Solid Surfaces: Extended abstracts PDF Download
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Author: J. L. de Segovia
Publisher:
ISBN:
Category : Solids
Languages : en
Pages : 228
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Book Description
Author: J. L. de Segovia
Publisher:
ISBN:
Category : Solids
Languages : en
Pages : 228
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Book Description
Author: H. Neddermeyer
Publisher: Springer Science & Business Media
ISBN: 9401118124
Category : Science
Languages : en
Pages : 275
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Book Description
The publication entitled "Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.
Author:
Publisher:
ISBN:
Category : Electric engineering
Languages : en
Pages : 724
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Author: American Chemical Society. Chemical Abstracts Service
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 2064
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Book Description
A key source to journal and conference abbreviations in the sciences. Although it focuses on chemistry, other scientific and engineering disciplines are also well represented. In addition to the abbreviation and full title, each entry also contains publishing info, title changes, language and frequency of publication, and libraries owning that title. Over 130,000 entries representing more than 70,000 publications dating back to 1907 are included.
Author: Yves Martin
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Atomic force microscopy
Languages : en
Pages : 508
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Book Description
SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.
Author:
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 370
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Author: D. Briggs
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 694
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Book Description
The aim of this text is to present the background, the important concepts, and tabulated data of Auger electron spectroscopy (AES) and x-ray photoelectron spectroscopy (XPS) in a practical context for those involved in applied surface analysis techniques.
Author:
Publisher:
ISBN:
Category : Physics
Languages : en
Pages : 1006
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Author:
Publisher:
ISBN:
Category : Ceramics
Languages : en
Pages : 416
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Author:
Publisher:
ISBN:
Category : Optical instruments
Languages : en
Pages : 708
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