Proceedings of the 2nd International Conference on Surface Metrology PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Proceedings of the 2nd International Conference on Surface Metrology PDF full book. Access full book title Proceedings of the 2nd International Conference on Surface Metrology by . Download full books in PDF and EPUB format.
Author:
Publisher: WPI Surface Metrology Lab
ISBN: 1450742904
Category : Surfaces (Technology)
Languages : en
Pages : 189
Get Book Here
Book Description
Author:
Publisher: WPI Surface Metrology Lab
ISBN: 1450742904
Category : Surfaces (Technology)
Languages : en
Pages : 189
Get Book Here
Book Description
Author: International Conference on Metrology and Properties of Engineering Surfaces (7, 1997, Göteborg)
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: Tom R. Thomas
Publisher: Université de Saint-Etienne
ISBN: 9782862723891
Category :
Languages : en
Pages : 498
Get Book Here
Book Description
Author: Christopher A. Brown
Publisher:
ISBN:
Category : Images, Photographic
Languages : en
Pages :
Get Book Here
Book Description
Author: United States. Army. European Research Office
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: Brian Griffiths
Publisher: CRC Press
ISBN: 9781560329701
Category : Technology & Engineering
Languages : en
Pages : 262
Get Book Here
Book Description
Author: Jerzy A. Sładek
Publisher: Springer
ISBN: 366248465X
Category : Technology & Engineering
Languages : en
Pages : 472
Get Book Here
Book Description
This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book is intended for master and PhD students, as well as for metrology engineers working at industrial and research laboratories. It not only provides them with a solid background for using existing coordinate metrology methods; it is also meant to inspire them to develop the state-of-the-art technologies that will play an important role in supporting quality growth and innovation in advanced manufacturing.
Author: International Conference on Metrology and Properties of Engineering Surfaces
Publisher:
ISBN: 9789163154553
Category :
Languages : en
Pages : 311
Get Book Here
Book Description
Author: International Conference on Metrology and Properties of Engineering Surfaces (7, 1997, Göteborg)
Publisher:
ISBN:
Category :
Languages : en
Pages : 278
Get Book Here
Book Description
Author: Ken J Stout
Publisher: Elsevier
ISBN: 0080542980
Category : Science
Languages : en
Pages : 309
Get Book Here
Book Description
This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.