Author:
Publisher: WPI Surface Metrology Lab
ISBN: 1450742904
Category : Surfaces (Technology)
Languages : en
Pages : 189

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Book Description

Author: Tom R. Thomas
Publisher: Université de Saint-Etienne
ISBN: 9782862723891
Category :
Languages : en
Pages : 498

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Book Description

Author: Jerzy A. Sładek
Publisher: Springer
ISBN: 366248465X
Category : Technology & Engineering
Languages : en
Pages : 472

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Book Description
This book focuses on effective methods for assessing the accuracy of both coordinate measuring systems and coordinate measurements. It mainly reports on original research work conducted by Sladek’s team at Cracow University of Technology’s Laboratory of Coordinate Metrology. The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements. Moreover, the book includes an introduction to the theory of measurement uncertainty and to key techniques for assessing measurement accuracy. All methods and tools are presented in detail, using suitable mathematical formulations and illustrated with numerous examples. The book fills an important gap in the literature, providing readers with an advanced text on a topic that has been rapidly developing in recent years. The book is intended for master and PhD students, as well as for metrology engineers working at industrial and research laboratories. It not only provides them with a solid background for using existing coordinate metrology methods; it is also meant to inspire them to develop the state-of-the-art technologies that will play an important role in supporting quality growth and innovation in advanced manufacturing.

Author: Ken J Stout
Publisher: Elsevier
ISBN: 0080542980
Category : Science
Languages : en
Pages : 309

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Book Description
This fully illustrated text explains the basic measurement techniques, describes the commercially available instruments and provides an overview of the current perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography. It also includes new sections providing full treatment of surface characterization, filtering technology and engineered surfaces, as well as a fully updated bibliography.

Author: Brian Griffiths
Publisher: CRC Press
ISBN: 9781560329701
Category : Technology & Engineering
Languages : en
Pages : 262

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Book Description

Author: Vidosav D. Majstorovic
Publisher: Springer
ISBN: 3030181774
Category : Technology & Engineering
Languages : en
Pages : 343

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Book Description
This book gathers the proceedings of the 12th International Conference on Measurement and Quality Control – Cyber Physical Issues (IMEKO TC 14 2019), held in Belgrade, Serbia, on 4–7 June 2019. The event marks the latest in a series of high-level conferences that bring together experts from academia and industry to exchange knowledge, ideas, experiences, research findings, and information in the field of measurement of geometrical quantities. The book addresses a wide range of topics, including: 3D measurement of GPS characteristics, measurement of gears and threads, measurement of roughness, micro- and nano-metrology, laser metrology for precision measurements, cyber physical metrology, optical measurement techniques, industrial computed tomography, multisensor techniques, intelligent measurement systems, evaluating measurement uncertainty, dimensional management in industry, product quality assurance methods, and big data analytics. By providing updates on key issues and highlighting recent advances in measurement and quality control, the book supports the transfer of vital knowledge to the next generation of academics and practitioners.

Author: Vidosav Majstorovic
Publisher: Springer
ISBN: 3319564307
Category : Technology & Engineering
Languages : en
Pages : 468

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Book Description
This book presents the proceedings from the 5th NEWTECH conference (Belgrade, Serbia, 5–9 June 2017), the latest in a series of high-level conferences that bring together experts from academia and industry in order to exchange knowledge, ideas, experiences, research results, and information in the field of manufacturing. The range of topics addressed is wide, including, for example, machine tool research and in-machine measurements, progress in CAD/CAM technologies, rapid prototyping and reverse engineering, nanomanufacturing, advanced material processing, functional and protective surfaces, and cyber-physical and reconfigurable manufacturing systems. The book will benefit readers by providing updates on key issues and recent progress in manufacturing engineering and technologies and will aid the transfer of valuable knowledge to the next generation of academics and practitioners. It will appeal to all who work or conduct research in this rapidly evolving field.

Author: Ivan Padron
Publisher: BoD – Books on Demand
ISBN: 9535104047
Category : Technology & Engineering
Languages : en
Pages : 233

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Book Description
This book provides a current overview of the theoretical and experimental aspects of some interferometry techniques applied to Topography and Astronomy. The first two chapters comprise interferometry techniques used for precise measurement of surface topography in engineering applications; while chapters three through eight are dedicated to interferometry applications related to Earth's topography. The last chapter is an application of interferometry in Astronomy, directed specifically to detection of planets outside our solar system. Each chapter offers an opportunity to expand the knowledge about interferometry techniques and encourage researchers in development of new interferometry applications.

Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 0429532652
Category : Technology & Engineering
Languages : en
Pages : 692

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Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS

Author: John C. Russ
Publisher: CRC Press
ISBN: 1498733085
Category : Law
Languages : en
Pages : 276

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Book Description
Fully updated, the second edition of this book covers the widespread advances in digital imaging technology, techniques, and devices. It discusses the increased power, storage capacity, and use of digital cameras, laptop computers, tablets, and cell phones in forensic science. It addresses methods for presenting evidence in a courtroom, including under Frye and Daubert rules. It also explains concepts with minimal jargon, making it accessible to a wide range of photography, criminal justice, forensic, and legal professionals.