Author: Behnam Ghavami
Publisher: Springer Nature
ISBN: 3030516105
Category : Technology & Engineering
Languages : en
Pages : 114
Book Description
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Soft Error Reliability of VLSI Circuits
Author: Behnam Ghavami
Publisher: Springer Nature
ISBN: 3030516105
Category : Technology & Engineering
Languages : en
Pages : 114
Book Description
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Publisher: Springer Nature
ISBN: 3030516105
Category : Technology & Engineering
Languages : en
Pages : 114
Book Description
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today’s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Probability, Reliability, and Statistical Methods in Engineering Design
Author: Achintya Haldar
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 328
Book Description
Learn the tools to assess product reliability! Haldar and Mahadevan crystallize the research and experience of the last few decades into the most up-to-date book on risk-based design concepts in engineering available. The fundamentals of reliability and statistics necessary for risk-based engineering analysis and design are clearly presented. And with the help of many practical examples integrated throughout the text, the material is made very relevant to today's practice. Key Features * Covers all the fundamental concepts and mathematical skills needed to conduct reliability assessments. * Presents the most widely-used reliability assessment methods. * Concepts that are required for the implementation of risk-based design in practical problems are developed gradually. * Both risk-based and deterministic design concepts are included to show the transition from traditional to modern design practice.
Publisher:
ISBN:
Category : Mathematics
Languages : en
Pages : 328
Book Description
Learn the tools to assess product reliability! Haldar and Mahadevan crystallize the research and experience of the last few decades into the most up-to-date book on risk-based design concepts in engineering available. The fundamentals of reliability and statistics necessary for risk-based engineering analysis and design are clearly presented. And with the help of many practical examples integrated throughout the text, the material is made very relevant to today's practice. Key Features * Covers all the fundamental concepts and mathematical skills needed to conduct reliability assessments. * Presents the most widely-used reliability assessment methods. * Concepts that are required for the implementation of risk-based design in practical problems are developed gradually. * Both risk-based and deterministic design concepts are included to show the transition from traditional to modern design practice.
Scientific and Technical Aerospace Reports
Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
Book Description
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 704
Book Description
Advanced Techniques in Logic Synthesis, Optimizations and Applications
Author: Kanupriya Gulati
Publisher: Springer Science & Business Media
ISBN: 1441975187
Category : Technology & Engineering
Languages : en
Pages : 423
Book Description
This book covers recent advances in the field of logic synthesis and design, including Boolean Matching, Logic Decomposition, Boolean satisfiability, Advanced Synthesis Techniques and Applications of Logic Design. All of these topics are valuable to CAD engineers working in Logic Design, Logic Optimization, and Verification. Engineers seeking opportunities for optimizing VLSI integrated circuits will find this book as an invaluable reference, since there is no existing book that covers this material in a systematic fashion.
Publisher: Springer Science & Business Media
ISBN: 1441975187
Category : Technology & Engineering
Languages : en
Pages : 423
Book Description
This book covers recent advances in the field of logic synthesis and design, including Boolean Matching, Logic Decomposition, Boolean satisfiability, Advanced Synthesis Techniques and Applications of Logic Design. All of these topics are valuable to CAD engineers working in Logic Design, Logic Optimization, and Verification. Engineers seeking opportunities for optimizing VLSI integrated circuits will find this book as an invaluable reference, since there is no existing book that covers this material in a systematic fashion.
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author: Ruijing Shen
Publisher: Springer Science & Business Media
ISBN: 1461407885
Category : Technology & Engineering
Languages : en
Pages : 326
Book Description
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Publisher: Springer Science & Business Media
ISBN: 1461407885
Category : Technology & Engineering
Languages : en
Pages : 326
Book Description
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.
Reliability Abstracts and Technical Reviews
Author:
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
Book Description
Publisher:
ISBN:
Category : Reliability (Engineering)
Languages : en
Pages : 556
Book Description
Reliability and Risk Analysis
Author: Mohammad Modarres
Publisher: CRC Press
ISBN: 1000864138
Category : Technology & Engineering
Languages : en
Pages : 511
Book Description
Completely updated for a new edition, this book introduces reliability and risks analysis, for both practicing engineers and engineering students at the undergraduate and graduate levels. Since reliability analysis is a multidisciplinary subject, this book draws together a wide range of topics and presents them in a way that applies to most engineering disciplines. What Every Engineer Should Know About Reliability and Risk Analysis, Second Edition, emphasizes an introduction and explanation of the practical methods used in reliability and risk studies, with a discussion of their uses and limitations. It offers basic and advanced methods in reliability analysis that are commonly used in daily practice and provides methods that address unique topics such as dependent failure analysis, importance analysis, and analysis of repairable systems. The book goes on to present a comprehensive overview of modern probabilistic life assessment methods such as Bayesian estimation, system reliability analysis, and human reliability. End-of-chapter problems and a solutions manual are available to support any course adoptions. This book is refined, simple, and focuses on fundamentals. The audience is the beginner with no background in reliability engineering and rudimentary knowledge of probability and statistics. It can be used by new practitioners, undergraduates, and first-year graduate students.
Publisher: CRC Press
ISBN: 1000864138
Category : Technology & Engineering
Languages : en
Pages : 511
Book Description
Completely updated for a new edition, this book introduces reliability and risks analysis, for both practicing engineers and engineering students at the undergraduate and graduate levels. Since reliability analysis is a multidisciplinary subject, this book draws together a wide range of topics and presents them in a way that applies to most engineering disciplines. What Every Engineer Should Know About Reliability and Risk Analysis, Second Edition, emphasizes an introduction and explanation of the practical methods used in reliability and risk studies, with a discussion of their uses and limitations. It offers basic and advanced methods in reliability analysis that are commonly used in daily practice and provides methods that address unique topics such as dependent failure analysis, importance analysis, and analysis of repairable systems. The book goes on to present a comprehensive overview of modern probabilistic life assessment methods such as Bayesian estimation, system reliability analysis, and human reliability. End-of-chapter problems and a solutions manual are available to support any course adoptions. This book is refined, simple, and focuses on fundamentals. The audience is the beginner with no background in reliability engineering and rudimentary knowledge of probability and statistics. It can be used by new practitioners, undergraduates, and first-year graduate students.
Principles of VLSI Design - Symmetry, Structures and Methods
Author: Hongjiang Song
Publisher: Lulu.com
ISBN: 1365161730
Category : Technology & Engineering
Languages : en
Pages : 510
Book Description
This is the textbook for Dr. Hongjiang Song's EEE598: VLSI Analog Circuit Design Based Symmetry class in Ira A. Fulton Schools of Engineering at Arizona State University. The course introduces structural VLSI analog circuit design concepts and techniques for analog circuit blocks and systems, such as the operational amplifiers, PLL/DLL, bandgap reference, A/D D/A converters. Symmetry principles and associated circuit constraints, structures and methods are adopted to mitigate VLSI PVT and other variations for better circuit performance, functionality, and design productivity across multiple VLSI process nodes.
Publisher: Lulu.com
ISBN: 1365161730
Category : Technology & Engineering
Languages : en
Pages : 510
Book Description
This is the textbook for Dr. Hongjiang Song's EEE598: VLSI Analog Circuit Design Based Symmetry class in Ira A. Fulton Schools of Engineering at Arizona State University. The course introduces structural VLSI analog circuit design concepts and techniques for analog circuit blocks and systems, such as the operational amplifiers, PLL/DLL, bandgap reference, A/D D/A converters. Symmetry principles and associated circuit constraints, structures and methods are adopted to mitigate VLSI PVT and other variations for better circuit performance, functionality, and design productivity across multiple VLSI process nodes.
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author: Smita Krishnaswamy
Publisher: Springer Science & Business Media
ISBN: 9048196434
Category : Technology & Engineering
Languages : en
Pages : 130
Book Description
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
Publisher: Springer Science & Business Media
ISBN: 9048196434
Category : Technology & Engineering
Languages : en
Pages : 130
Book Description
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
The VLSI Handbook
Author: Wai-Kai Chen
Publisher: CRC Press
ISBN: 9781420049671
Category : Technology & Engineering
Languages : en
Pages : 1788
Book Description
Over the years, the fundamentals of VLSI technology have evolved to include a wide range of topics and a broad range of practices. To encompass such a vast amount of knowledge, The VLSI Handbook focuses on the key concepts, models, and equations that enable the electrical engineer to analyze, design, and predict the behavior of very large-scale integrated circuits. It provides the most up-to-date information on IC technology you can find. Using frequent examples, the Handbook stresses the fundamental theory behind professional applications. Focusing not only on the traditional design methods, it contains all relevant sources of information and tools to assist you in performing your job. This includes software, databases, standards, seminars, conferences and more. The VLSI Handbook answers all your needs in one comprehensive volume at a level that will enlighten and refresh the knowledge of experienced engineers and educate the novice. This one-source reference keeps you current on new techniques and procedures and serves as a review for standard practice. It will be your first choice when looking for a solution.
Publisher: CRC Press
ISBN: 9781420049671
Category : Technology & Engineering
Languages : en
Pages : 1788
Book Description
Over the years, the fundamentals of VLSI technology have evolved to include a wide range of topics and a broad range of practices. To encompass such a vast amount of knowledge, The VLSI Handbook focuses on the key concepts, models, and equations that enable the electrical engineer to analyze, design, and predict the behavior of very large-scale integrated circuits. It provides the most up-to-date information on IC technology you can find. Using frequent examples, the Handbook stresses the fundamental theory behind professional applications. Focusing not only on the traditional design methods, it contains all relevant sources of information and tools to assist you in performing your job. This includes software, databases, standards, seminars, conferences and more. The VLSI Handbook answers all your needs in one comprehensive volume at a level that will enlighten and refresh the knowledge of experienced engineers and educate the novice. This one-source reference keeps you current on new techniques and procedures and serves as a review for standard practice. It will be your first choice when looking for a solution.