Optical Techniques for Solid-State Materials Characterization PDF Download
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Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 9780367576929
Category :
Languages : en
Pages : 748
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Book Description
With chapters written by pioneering experts in various optical techniques, this comprehensive reference provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. It explains how to use the techniques to acquire, analyze, and interpret data for gaining insight into ma
Author: Rohit P. Prasankumar
Publisher: CRC Press
ISBN: 9780367576929
Category :
Languages : en
Pages : 748
Get Book Here
Book Description
With chapters written by pioneering experts in various optical techniques, this comprehensive reference provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. It explains how to use the techniques to acquire, analyze, and interpret data for gaining insight into ma
Author: University of Michigan. College of Engineering
Publisher: UM Libraries
ISBN:
Category : Engineering schools
Languages : en
Pages : 1094
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Book Description
Author: University of Michigan
Publisher: UM Libraries
ISBN:
Category : Education, Higher
Languages : en
Pages : 1202
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Book Description
Each number is the catalogue of a specific school or college of the University.
Author: Frank Träger
Publisher: Springer Science & Business Media
ISBN: 3642194095
Category : Science
Languages : en
Pages : 1704
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Book Description
This new edition features numerous updates and additions. Especially 4 new chapters on Fiber Optics, Integrated Optics, Frequency Combs and Interferometry reflect the changes since the first edition. In addition, major complete updates for the chapters: Optical Materials and Their Properties, Optical Detectors, Nanooptics, and Optics far Beyond the Diffraction Limit. Features Contains over 1000 two-color illustrations. Includes over 120 comprehensive tables with properties of optical materials and light sources. Emphasizes physical concepts over extensive mathematical derivations. Chapters with summaries, detailed index Delivers a wealth of up-to-date references.
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
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Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Author: Sam-Shajing Sun
Publisher: CRC Press
ISBN: 1466585129
Category : Technology & Engineering
Languages : en
Pages : 1394
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Book Description
This book covers the combined subjects of organic electronic and optoelectronic materials/devices. It is designed for classroom instruction at the senior college level. Highlighting emerging organic and polymeric optoelectronic materials and devices, it presents the fundamentals, principle mechanisms, representative examples, and key data.
Author: F. Kajzar
Publisher: Springer Science & Business Media
ISBN: 9401140561
Category : Science
Languages : en
Pages : 555
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Book Description
Proceedings of the NATO Advanced Research Workshop, Menton, France, 26-31 August, 1999
Author: Nuggehalli Ravindra
Publisher: Woodhead Publishing
ISBN: 008102813X
Category : Technology & Engineering
Languages : en
Pages : 352
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Book Description
Microbolometers: Fundamentals, Materials, and Recent Developments describes the fundamentals of microbolometers, their historic evolution, operational principles and material choices. It also explains the impact of materials on the processing and development of device characteristics. Sections address various aspects of optical properties and recommend models of properties of materials of interest for the fabrication of the uncooled microbolometers. In addition, the book presents two case studies, Honeywell and Texas Instruments, that focus on the design and manufacture of microbolometers. Finally, recent developments, applications, patents and future trends are presented. The chapter on patents will summarize the strengths and weaknesses of each of the technologies. "Please note that there is an error on the Dedication page, it should read: "To my sister, Math. G.Y. Premalatha, and my brother-in-law, the late Professor G.N. Yoganarasimhan, Professor of Water Resources Engineering and Management, for showing me the direction - Describes the fundamentals of uncooled infrared detectors, operational principles and material approaches - Includes case studies based on Honeywell and Texas Instruments' work on microbolometers - Provides analyses of current patents with a look towards their strengths and weaknesses
Author: Habib, Maki K.
Publisher: IGI Global
ISBN: 1799801381
Category : Technology & Engineering
Languages : en
Pages : 484
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Book Description
Advanced research in the field of mechatronics and robotics represents a unifying interdisciplinary and intelligent engineering science paradigm. It is a holistic, concurrent, and interdisciplinary engineering science that identifies novel possibilities of synergizing and fusing different disciplines. The Handbook of Research on Advanced Mechatronic Systems and Intelligent Robotics is a collection of innovative research on the methods and applications of knowledge in both theoretical and practical skills of intelligent robotics and mechatronics. While highlighting topics including green technology, machine learning, and virtual manufacturing, this book is ideally designed for researchers, students, engineers, and computer practitioners seeking current research on developing innovative ideas for intelligent robotics and autonomous and smart interdisciplinary mechatronic products.
Author: Simonpietro Agnello
Publisher: John Wiley & Sons
ISBN: 1119697328
Category : Technology & Engineering
Languages : en
Pages : 500
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Book Description
SPECTROSCOPY FOR MATERIALS CHARACTERIZATION Learn foundational and advanced spectroscopy techniques from leading researchers in physics, chemistry, surface science, and nanoscience In Spectroscopy for Materials Characterization, accomplished researcher Simonpietro Agnello delivers a practical and accessible compilation of various spectroscopy techniques taught and used to today. The book offers a wide-ranging approach taught by leading researchers working in physics, chemistry, surface science, and nanoscience. It is ideal for both new students and advanced researchers studying and working with spectroscopy. Topics such as confocal and two photon spectroscopy, as well as infrared absorption and Raman and micro-Raman spectroscopy, are discussed, as are thermally stimulated luminescence and spectroscopic studies of radiation effects on optical materials. Each chapter includes a basic introduction to the theory necessary to understand a specific technique, details about the characteristic instrumental features and apparatuses used, including tips for the appropriate arrangement of a typical experiment, and a reproducible case study that shows the discussed techniques used in a real laboratory. Readers will benefit from the inclusion of: Complete and practical case studies at the conclusion of each chapter to highlight the concepts and techniques discussed in the material Citations of additional resources ideal for further study A thorough introduction to the basic aspects of radiation matter interaction in the visible-ultraviolet range and the fundamentals of absorption and emission A rigorous exploration of time resolved spectroscopy at the nanosecond and femtosecond intervals Perfect for Master and Ph.D. students and researchers in physics, chemistry, engineering, and biology, Spectroscopy for Materials Characterization will also earn a place in the libraries of materials science researchers and students seeking a one-stop reference to basic and advanced spectroscopy techniques.
