Optical Properties of Dielectric Films PDF Download
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Author: Norman N. Axelrod
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 302
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Book Description
Author: Norman N. Axelrod
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 302
Get Book
Book Description
Author: Norman N. Axelrod
Publisher:
ISBN:
Category : Dielectrics
Languages : en
Pages : 283
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Book Description
Author: Rolf E. Hummel
Publisher: CRC Press
ISBN: 9780849324840
Category : Science
Languages : en
Pages : 378
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Book Description
Thin Films for Optical Coating emphasizes the applications of thin films, deposition of thin films, and thin film characterization. Unlike monographs on this subject, this book presents the views of many expert authors. Individual chapters span a wide arc of topics within this field of study. The book offers an introduction to usual and unusual applications of optical thin films, treating in a more qualitative way general topics such as anticounterfeiting coatings, decorative coatings, light switches, contrast enhancement coatings, multiplexers, optical memories, and more. Contributors review thin film media for optical data storage, UV broadband and narrow-band filters, and optically active thin film coatings. Ion beam sputtering and magnetron sputtering deposition methods are described in detail. Characterization techniques are provided, including Raman spectroscopy and absorption measurements. The book also offers theories on light scattering of thin dielectric films and the electromagnetic properties of nanocermet thin films. This reference incorporates recent research by the individual authors with their views of current developments in their respective fields. Of particular interest to the reader will be an assessment of the historical developments of thin film physics written by one of the fathers of thin film technology, Professor M. Auwärter.
Author: O. S. Heavens
Publisher: Courier Corporation
ISBN: 0486669246
Category : Science
Languages : en
Pages : 276
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Book Description
Authoritative reference treats the formation, structure, optical properties, and uses of thin solid films, emphasizing causes of their unusual qualities. 162 figures. 19 tables. 1955 edition.
Author: Frederick Wooten
Publisher: Academic Press
ISBN: 1483220761
Category : Science
Languages : en
Pages : 273
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Book Description
Optical Properties of Solids covers the important concepts of intrinsic optical properties and photoelectric emission. The book starts by providing an introduction to the fundamental optical spectra of solids. The text then discusses Maxwell's equations and the dielectric function; absorption and dispersion; and the theory of free-electron metals. The quantum mechanical theory of direct and indirect transitions between bands; the applications of dispersion relations; and the derivation of an expression for the dielectric function in the self-consistent field approximation are also encompassed. The book further tackles current-current correlations; the fluctuation-dissipation theorem; and the effect of surface plasmons on optical properties and photoemission. People involved in the study of the optical properties of solids will find the book invaluable.
Author: Dick Bedeaux
Publisher: Imperial College Press
ISBN: 1860945430
Category : Science
Languages : en
Pages : 465
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Book Description
Annotation - An extremely rigorous theoretical description- For thin films computer programs are available for obtaining the optical properties exactly- Presents optical properties of rough surfaces, including capillary waves and oxide layers- Provides a new discussion on reflection from a gyrotropic surface- Describes reflection from a self-affine rough surface.
Author: Olaf Stenzel
Publisher: Springer Science & Business Media
ISBN: 3540231471
Category : Science
Languages : en
Pages : 285
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Book Description
The present monograph represents itself as a tutorial to the ?eld of optical properties of thin solid ?lms. It is neither a handbook for the thin ?lm prac- tioner,noranintroductiontointerferencecoatingsdesign,norareviewonthe latest developments in the ?eld. Instead, it is a textbook which shall bridge the gap between ground level knowledge on optics, electrodynamics, qu- tummechanics,andsolidstatephysicsononehand,andthemorespecialized level of knowledge presumed in typical thin ?lm optical research papers on the other hand. In writing this preface, I feel it makes sense to comment on three points, which all seem to me equally important. They arise from the following (- tually interconnected) three questions: 1. Who can bene?t from reading this book? 2. What is the origin of the particular material selection in this book? 3. Who encouraged and supported me in writing this book? Let me start with the ?rst question, the intended readership of this book. It should be of use for anybody, who is involved into the analysis of - tical spectra of a thin ?lm sample, no matter whether the sample has been prepared for optical or other applications. Thin ?lm spectroscopy may be r- evant in semiconductor physics, solar cell development, physical chemistry, optoelectronics, and optical coatings development, to give just a few ex- ples. The book supplies the reader with the necessary theoretical apparatus for understanding and modelling the features of the recorded transmission and re?ection spectra.
Author:
Publisher: Cuvillier Verlag
ISBN: 3736918550
Category : Science
Languages : en
Pages : 178
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Book Description
We have measured the optical properties of films of the organic semiconductors PTCDA and HBC, prepared by Organic Molecular Beam Expitaxy (OMBE), on different substrates by means of Differential Reflectance Spectroscopy (DRS). The optical setup used [51] allows to characterize the samples in situ and during the film growth. This enables us to directly follow the thickness dependent optical properties of the organic films, starting from submonolayer coverage up to thicker films on the order of 20 monolayers (ML) film thickness. However, due to the different optical nature of the different substrates used, i.e., mica, glass, Au(111), and HOPG, the DRS signal can not directly be interpreted in terms of the absorption of the films. Rather, the optical constants n (index of refraction) and k (absorption index) of the organic films have to be calculated to be able to discuss the spectral absorption of the films. We have proposed a method by which the calculation of the optical constants of thin films on arbitrary substrates from just one spectral measurement (in our case the DRS) becomes possible. The results fulfill a priori a Kramers-Kronig consistency, characteristic for physically meaningful values of the optical constants, and no specific model is needed to express the spectral behavior of the optical constants. Still, the requirement that the absorption index has to approach zero sufficiently at the measurement intervals restricts the application of our method to a class of materials, which exhibit distinct and well-separated absorption bands, like e.g. organic semiconductors. By means of appropriate extrapolation procedures, the method is able to account for small non-zero values of the absorption index at the boundaries of the measurement interval. Although we exclusively discussed the application of our method to differential reflectance spectra, it is anticipated that it works for all other optical quantities likewise.
Author: Yitzhak Mastai
Publisher: BoD – Books on Demand
ISBN: 953511140X
Category : Science
Languages : en
Pages : 563
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Book Description
Today modern materials science is a vibrant, emerging scientific discipline at the forefront of physics, chemistry, engineering, biology and medicine, and is becoming increasingly international in scope as demonstrated by emerging international and intercontinental collaborations and exchanges. The overall purpose of this book is to provide timely and in-depth coverage of selected advanced topics in materials science. Divided into five sections, this book provides the latest research developments in many aspects of materials science. This book is of interest to both fundamental research and also to practicing scientists and will prove invaluable to all chemical engineers, industrial chemists and students in industry and academia.
Author: K. Vedam
Publisher: Academic Press
ISBN: 1483288935
Category : Science
Languages : en
Pages : 345
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Book Description
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
