Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1420019163
Category : Science
Languages : en
Pages : 524
Book Description
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.
Optical Inspection of Microsystems
Optical Inspection of Microsystems, Second Edition
Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 1498779506
Category : Science
Languages : en
Pages : 585
Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
Publisher: CRC Press
ISBN: 1498779506
Category : Science
Languages : en
Pages : 585
Book Description
Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS
Microsystems Metrology and Inspection
Author: Christophe Gorecki
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 200
Book Description
Publisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 200
Book Description
Springer Handbook of Experimental Solid Mechanics
Author: William N. Sharpe, Jr.
Publisher: Springer Science & Business Media
ISBN: 0387268839
Category : Mathematics
Languages : en
Pages : 1100
Book Description
The Springer Handbook of Experimental Solid Mechanics documents both the traditional techniques as well as the new methods for experimental studies of materials, components, and structures. The emergence of new materials and new disciplines, together with the escalating use of on- and off-line computers for rapid data processing and the combined use of experimental and numerical techniques have greatly expanded the capabilities of experimental mechanics. New exciting topics are included on biological materials, MEMS and NEMS, nanoindentation, digital photomechanics, photoacoustic characterization, and atomic force microscopy in experimental solid mechanics. Presenting complete instructions to various areas of experimental solid mechanics, guidance to detailed expositions in important references, and a description of state-of-the-art applications in important technical areas, this thoroughly revised and updated edition is an excellent reference to a widespread academic, industrial, and professional engineering audience.
Publisher: Springer Science & Business Media
ISBN: 0387268839
Category : Mathematics
Languages : en
Pages : 1100
Book Description
The Springer Handbook of Experimental Solid Mechanics documents both the traditional techniques as well as the new methods for experimental studies of materials, components, and structures. The emergence of new materials and new disciplines, together with the escalating use of on- and off-line computers for rapid data processing and the combined use of experimental and numerical techniques have greatly expanded the capabilities of experimental mechanics. New exciting topics are included on biological materials, MEMS and NEMS, nanoindentation, digital photomechanics, photoacoustic characterization, and atomic force microscopy in experimental solid mechanics. Presenting complete instructions to various areas of experimental solid mechanics, guidance to detailed expositions in important references, and a description of state-of-the-art applications in important technical areas, this thoroughly revised and updated edition is an excellent reference to a widespread academic, industrial, and professional engineering audience.
Microsystem Engineering of Lab-on-a-chip Devices
Author: Oliver Geschke
Publisher: John Wiley & Sons
ISBN: 352760636X
Category : Science
Languages : en
Pages : 270
Book Description
Written by an interdisciplinary team of chemists, biologists and engineers from one of the leading European centers for microsystem research, MIC in Lyngby, Denmark, this book introduces and discusses the different aspects of (bio)chemical microsystem development. Unlike other, far more voluminous and theoretical books on this topic, this is a concise, practical handbook, dealing with analytical applications, particularly in the life sciences. Topics include: * microfluidics * silicon micromachining * glass and polymer micromachining * packaging * analytical chemistry illustrated with examples taken mainly from ongoing research projects at MIC.
Publisher: John Wiley & Sons
ISBN: 352760636X
Category : Science
Languages : en
Pages : 270
Book Description
Written by an interdisciplinary team of chemists, biologists and engineers from one of the leading European centers for microsystem research, MIC in Lyngby, Denmark, this book introduces and discusses the different aspects of (bio)chemical microsystem development. Unlike other, far more voluminous and theoretical books on this topic, this is a concise, practical handbook, dealing with analytical applications, particularly in the life sciences. Topics include: * microfluidics * silicon micromachining * glass and polymer micromachining * packaging * analytical chemistry illustrated with examples taken mainly from ongoing research projects at MIC.
Handbook of Optical Metrology
Author: Toru Yoshizawa
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Publisher: CRC Press
ISBN: 1351831844
Category : Technology & Engineering
Languages : en
Pages : 866
Book Description
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text: Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements Addresses interferometry, holography, and speckle methods and applications Explains Moiré metrology and the optical heterodyne measurement method Delves into the specifics of diffraction, scattering, polarization, and near-field optics Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
Optical Imaging and Metrology
Author: Wolfgang Osten
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471
Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
Publisher: John Wiley & Sons
ISBN: 3527648461
Category : Science
Languages : en
Pages : 471
Book Description
A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
The Nature of Light
Author: Chandra Roychoudhuri
Publisher: CRC Press
ISBN: 1420044257
Category : Science
Languages : en
Pages : 454
Book Description
Focusing on the unresolved debate between Newton and Huygens from 300 years ago, The Nature of Light: What is a Photon? discusses the reality behind enigmatic photons. It explores the fundamental issues pertaining to light that still exist today. Gathering contributions from globally recognized specialists in electrodynamics and quantum optics, the book begins by clearly presenting the mainstream view of the nature of light and photons. It then provides a new and challenging scientific epistemology that explains how to overcome the prevailing paradoxes and confusions arising from the accepted definition of a photon as a monochromatic Fourier mode of the vacuum. The book concludes with an array of experiments that demonstrate the innovative thinking needed to examine the wave-particle duality of photons. Looking at photons from both mainstream and out-of-box viewpoints, this volume is sure to inspire the next generation of quantum optics scientists and engineers to go beyond the Copenhagen interpretation and formulate new conceptual ideas about light–matter interactions and substantiate them through inventive applications.
Publisher: CRC Press
ISBN: 1420044257
Category : Science
Languages : en
Pages : 454
Book Description
Focusing on the unresolved debate between Newton and Huygens from 300 years ago, The Nature of Light: What is a Photon? discusses the reality behind enigmatic photons. It explores the fundamental issues pertaining to light that still exist today. Gathering contributions from globally recognized specialists in electrodynamics and quantum optics, the book begins by clearly presenting the mainstream view of the nature of light and photons. It then provides a new and challenging scientific epistemology that explains how to overcome the prevailing paradoxes and confusions arising from the accepted definition of a photon as a monochromatic Fourier mode of the vacuum. The book concludes with an array of experiments that demonstrate the innovative thinking needed to examine the wave-particle duality of photons. Looking at photons from both mainstream and out-of-box viewpoints, this volume is sure to inspire the next generation of quantum optics scientists and engineers to go beyond the Copenhagen interpretation and formulate new conceptual ideas about light–matter interactions and substantiate them through inventive applications.
Photonic Signal Processing
Author: Le Nguyen Binh
Publisher: CRC Press
ISBN: 142001952X
Category : Science
Languages : en
Pages : 382
Book Description
The potential of photonic signal processing (PSP) to overcome electronic limits for processing ultra-wideband signals, provide signal conditioning that can be integrated in line with fiber optic systems, and improve signal quality makes this technology extremely attractive for improvement in receiver sensitivity performance. Spanning the current transitional period, Photonic Signal Processing: Techniques and Applications addresses the merging techniques of processing and manipulating signals propagating in the optical domain. The book begins with a historical perspective of PSP and introduces photonic components essential for photonic processing systems, such as optical amplification devices, optical fibers, and optical modulators. The author demonstrates the representation of photonic circuits via a signal flow graph technique adapted for photonic domain. He describes photonic signal processors, such as differentiators and integrators, and their applications for the generation of solitons, and then covers the application of these solitons in optically amplified fiber transmission systems. The book illustrates the compensation dispersion using a photonic processor, the design of optical filters using photonic processor techniques, and the filtering of microwave signals in the optical domain. Exploring methods for the processing of signals in the optical domain, the book includes solutions to photonic circuits that use signal flow techniques and significant applications in short pulse generation, the filtering of signals, differentiation, and the integration of signals. It delineates fundamental techniques on the processing of signals in the optical domain as well as their applications that lead to advanced aspects of performing generation of short pulses, integration, differentiation, and filtering for optical communications systems and networks and processing of ultra-high speed signals.
Publisher: CRC Press
ISBN: 142001952X
Category : Science
Languages : en
Pages : 382
Book Description
The potential of photonic signal processing (PSP) to overcome electronic limits for processing ultra-wideband signals, provide signal conditioning that can be integrated in line with fiber optic systems, and improve signal quality makes this technology extremely attractive for improvement in receiver sensitivity performance. Spanning the current transitional period, Photonic Signal Processing: Techniques and Applications addresses the merging techniques of processing and manipulating signals propagating in the optical domain. The book begins with a historical perspective of PSP and introduces photonic components essential for photonic processing systems, such as optical amplification devices, optical fibers, and optical modulators. The author demonstrates the representation of photonic circuits via a signal flow graph technique adapted for photonic domain. He describes photonic signal processors, such as differentiators and integrators, and their applications for the generation of solitons, and then covers the application of these solitons in optically amplified fiber transmission systems. The book illustrates the compensation dispersion using a photonic processor, the design of optical filters using photonic processor techniques, and the filtering of microwave signals in the optical domain. Exploring methods for the processing of signals in the optical domain, the book includes solutions to photonic circuits that use signal flow techniques and significant applications in short pulse generation, the filtering of signals, differentiation, and the integration of signals. It delineates fundamental techniques on the processing of signals in the optical domain as well as their applications that lead to advanced aspects of performing generation of short pulses, integration, differentiation, and filtering for optical communications systems and networks and processing of ultra-high speed signals.
Organic Field-Effect Transistors
Author: Zhenan Bao
Publisher: CRC Press
ISBN: 1351837575
Category : Technology & Engineering
Languages : en
Pages : 578
Book Description
The remarkable development of organic thin film transistors (OTFTs) has led to their emerging use in active matrix flat-panel displays, radio frequency identification cards, and sensors. Exploring one class of OTFTs, Organic Field-Effect Transistors provides a comprehensive, multidisciplinary survey of the present theory, charge transport studies, synthetic methodology, materials characterization, and current applications of organic field-effect transistors (OFETs). Covering various aspects of OFETs, the book begins with a theoretical description of charge transport in organic semiconductors at the molecular level. It then discusses the current understanding of charge transport in single-crystal devices, small molecules and oligomers, conjugated polymer devices, and charge injection issues in organic transistors. After describing the design rationales and synthetic methodologies used for organic semiconductors and dielectric materials, the book provides an overview of a variety of characterization techniques used to probe interfacial ordering, microstructure, molecular packing, and orientation crucial to device performance. It also describes the different processing techniques for molecules deposited by vacuum and solution, followed by current technological examples that employ OTFTs in their operation. Featuring respected contributors from around the world, this thorough, up-to-date volume presents both the theory behind OFETs and the latest applications of this promising technology.
Publisher: CRC Press
ISBN: 1351837575
Category : Technology & Engineering
Languages : en
Pages : 578
Book Description
The remarkable development of organic thin film transistors (OTFTs) has led to their emerging use in active matrix flat-panel displays, radio frequency identification cards, and sensors. Exploring one class of OTFTs, Organic Field-Effect Transistors provides a comprehensive, multidisciplinary survey of the present theory, charge transport studies, synthetic methodology, materials characterization, and current applications of organic field-effect transistors (OFETs). Covering various aspects of OFETs, the book begins with a theoretical description of charge transport in organic semiconductors at the molecular level. It then discusses the current understanding of charge transport in single-crystal devices, small molecules and oligomers, conjugated polymer devices, and charge injection issues in organic transistors. After describing the design rationales and synthetic methodologies used for organic semiconductors and dielectric materials, the book provides an overview of a variety of characterization techniques used to probe interfacial ordering, microstructure, molecular packing, and orientation crucial to device performance. It also describes the different processing techniques for molecules deposited by vacuum and solution, followed by current technological examples that employ OTFTs in their operation. Featuring respected contributors from around the world, this thorough, up-to-date volume presents both the theory behind OFETs and the latest applications of this promising technology.