Optical Characterization of Real Surfaces and Films PDF Download
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Author: K. Vedam
Publisher: Academic Press
ISBN: 1483288935
Category : Science
Languages : en
Pages : 345
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Book Description
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Author: K. Vedam
Publisher: Academic Press
ISBN: 1483288935
Category : Science
Languages : en
Pages : 345
Get Book
Book Description
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
Author: Olaf Stenzel
Publisher: Springer
ISBN: 3319753258
Category : Science
Languages : en
Pages : 462
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Book Description
This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.
Author: Dick Bedeaux
Publisher: World Scientific
ISBN: 1860944507
Category : Science
Languages : en
Pages : 465
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Book Description
This invaluable book represents a substantial body of work describing the theory of the optical properties of thin island films and rough surfaces. In both cases the feature sizes are small compared to the wavelength of light. The approach is extremely rigorous and theoretically very thorough. The reflection, transmission and absorption of light are described. Computer programs that provide exact solutions for theoretical properties of thin island films are available, and this makes the book of great practical use. The early chapters present a comprehensive theoretical framework. In this new edition a chapter on reflection from gyrotropic media has been added. Contributions due to the gyrotropic nature of the interfacial layer are discussed.
Author: Udo W. Pohl
Publisher: Springer Nature
ISBN: 3030438694
Category : Technology & Engineering
Languages : en
Pages : 546
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Book Description
The extended and revised edition of this textbook provides essential information for a comprehensive upper-level graduate course on the crystalline growth of semiconductor heterostructures. Heteroepitaxy is the basis of today’s advanced electronic and optoelectronic devices, and it is considered one of the most important fields in materials research and nanotechnology. The book discusses the structural and electronic properties of strained epitaxial layers, the thermodynamics and kinetics of layer growth, and it describes the major growth techniques: metalorganic vapor-phase epitaxy, molecular-beam epitaxy, and liquid-phase epitaxy. It also examines in detail cubic and hexagonal semiconductors, strain relaxation by misfit dislocations, strain and confinement effects on electronic states, surface structures, and processes during nucleation and growth. Requiring only minimal knowledge of solid-state physics, it provides natural sciences, materials science and electrical engineering students and their lecturers elementary introductions to the theory and practice of epitaxial growth, supported by references and over 300 detailed illustrations. In this second edition, many topics have been extended and treated in more detail, e.g. in situ growth monitoring, application of surfactants, properties of dislocations and defects in organic crystals, and special growth techniques like vapor-liquid-solid growth of nanowires and selective-area epitaxy.
Author: F C Matacotta
Publisher: World Scientific
ISBN: 9814500747
Category : Technology & Engineering
Languages : en
Pages : 368
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Book Description
This book brings together detailed discussions by leading experts on the various innovative aspects of thin films growth, deposition and characterization techniques, and new thin film materials and devices. It addresses through the different viewpoints of the contributors, the major problem of thin films science - the relation between the energy of the condensing species and the resulting properties of the films. Some of the issues considered include energetic condensation, bombardment stabilization, pulsed electron beam ablation, orientation and self-organization of organic, ferroelectric and nanoparticle thin films. Several chapters focus on applications such as the recent developments in organic optoelectronics, large area electronic technology and superconducting thin film devices. Contents:Growth Mechanisms of Polycrystalline Thin Films (P B Barna & M Adamik)Heteroepitaxy (H von Känel et al.)Fundamental Properties and Developments of Metallic and Semiconducting Nanoparticles (A Stella et al.)Thin Film Deposition by Means of Pulsed Electron Beam Ablation (G Müller et al.)Bombardment Stabilization of Cubic Boron Nitride (L B Hackenberger et al.)Orientation-Controlled Organic Thin Films (H Yanagi)Applications of Spectroscopic Ellipsometry to Thin Film Characterisation (B Drévillon)XRD Line Broadening and Texture of Thin Films (P Scardi)The SQUID Magnetometer: An Application of Thin-Film Superconductors (M S Colclough)Thin Films for Large Area Electronics (D Pribat et al.) Readership: Scientists and graduate students. keywords:
Author:
Publisher: Elsevier
ISBN: 9780080480015
Category : Science
Languages : en
Pages : 800
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Book Description
The book is devoted to the consideration of the different processes taking place in thin films and at surfaces. Since the most important physico-chemical phenomena in such media are accompanied by the rearrangement of an intra- and intermolecular coordinates and consequently a surrounding molecular ensemble, the theory of radiationless multi-vibrational transitions is used for its description. The second part of the book considers the numerous surface phenomena. And in the third part is described the preparation methods and characteristics of different types of thin films. Both experimental and theoretical descriptions are represented. Media rearrangement coupled with the reagent transformation largely determines the absolute value and temperature dependence of the rate constants and other characteristics of the considered processes. These effects are described at the atomic or molecular level based on the multi-phonon theory, starting from the first pioneering studies through to contemporary studies. A number of questions are included at the end of many chapters to further reinforce the material presented. · Unified approach to the description of numerous physico-chemical phenomena in different materials · Based on the pioneering research work of the authors · Explantion of a variety of experimental observations · Material is presented at two levels of complexity for specialists and non-specialists · Identifies existing and potential applications of the processes and phenomena · Includes questions at the end of some chapters to further reinforce the material discussed
Author:
Publisher: Academic Press
ISBN: 0080542913
Category : Technology & Engineering
Languages : en
Pages : 543
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Book Description
Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems.In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films.
Author: Mario Rocca
Publisher: Springer Nature
ISBN: 3030469069
Category : Science
Languages : en
Pages : 1273
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Book Description
This handbook delivers an up-to-date, comprehensive and authoritative coverage of the broad field of surface science, encompassing a range of important materials such metals, semiconductors, insulators, ultrathin films and supported nanoobjects. Over 100 experts from all branches of experiment and theory review in 39 chapters all major aspects of solid-state surfaces, from basic principles to applications, including the latest, ground-breaking research results. Beginning with the fundamental background of kinetics and thermodynamics at surfaces, the handbook leads the reader through the basics of crystallographic structures and electronic properties, to the advanced topics at the forefront of current research. These include but are not limited to novel applications in nanoelectronics, nanomechanical devices, plasmonics, carbon films, catalysis, and biology. The handbook is an ideal reference guide and instructional aid for a wide range of physicists, chemists, materials scientists and engineers active throughout academic and industrial research.
Author: Subba Ramaiah Kodigala
Publisher: Academic Press
ISBN: 0080920322
Category : Science
Languages : en
Pages : 700
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Book Description
Cu(In1-xGax)Se2 Based Thin Film Solar Cells provides valuable contents about the fabrication and characterization of chalcopyrite Cu(In1-xGax)Se2 based thin film solar cells and modules. The growth of chalcopyrite Cu(In1-xGax)(S1-ySey)2 absorbers, buffers, window layers, antireflection coatings, and finally metallic grids, which are the sole components of solar cells, is clearly illustrated. The absorber, which contains multiple elements, segregates secondary phases if the growth conditions are not well optimized i.e., the main drawback in the fabrication of solar cells. More importantly the solutions for the growth of thin films are given in detail. The properties of all the individual layers and single crystals including solar cells analyzed by different characterization techniques such as SEM, AFM, XPS, AES, TEM, XRD, optical, photoluminescence, and Raman spectroscopy are explicitly demonstrated. The electrical analyses such as conductivities, Hall mobilities, deep level transient spectroscopy measurements etc., provide a broad picture to understand thin films or single crystals and their solar cells. The book clearly explains the working principle of energy conversion from solar to electrical with basic sciences for the chalcopyrite based thin film solar cells. Also, it demonstrates important criteria on how to enhance efficiency of the solar cells and modules. The effect of environmental factors such as temperature, humidity, aging etc., on the devices is mentioned by citing several examples. Illustrates a number of growth techniques to prepare thin film layers for solar cells Discusses characterization techniques such as XRD, TEM, XPS, AFM, SEM, PL, CL, Optical measurements, and Electrical measurements Includes I-V, C-V measurements illustrations Provides analysis of solar cell efficiency Presents current trends in thin film solar cells research and marketing
Author:
Publisher: Elsevier
ISBN: 0080542875
Category : Technology & Engineering
Languages : en
Pages : 293
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Book Description
Physics of Thin Films is one of the longest running continuing series in thin film science, consisting of 25 volumes since 1963. The series contains quality studies of the properties of various thin films materials and systems. In order to be able to reflect the development of today's science and to cover all modern aspects of thin films, the series, starting with Volume 20, has moved beyond the basic physics of thin films. It now addresses the most important aspects of both inorganic and organic thin films, in both their theoretical and their technological aspects. Starting with Volume 30, the title of the series, Thin Films, is being changed to Thin Films and Nanostructures. We feel that this new titlereflects more accurately the rapidly growing inclusion of research anddevelopment efforts on nanostructures, especially in relation to novel solid-state device formats
