On the Methodology of Assessing Hot-carrier Reliability of Analog Circuits PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download On the Methodology of Assessing Hot-carrier Reliability of Analog Circuits PDF full book. Access full book title On the Methodology of Assessing Hot-carrier Reliability of Analog Circuits by Huy X. P. Le. Download full books in PDF and EPUB format.
Author: Huy X. P. Le
Publisher:
ISBN:
Category :
Languages : en
Pages : 232
Get Book Here
Book Description
Author: Huy X. P. Le
Publisher:
ISBN:
Category :
Languages : en
Pages : 232
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 202
Get Book Here
Book Description
Author: Huy X. P. Le
Publisher:
ISBN:
Category :
Languages : en
Pages : 108
Get Book Here
Book Description
Author: Khandker Nazrul Quader
Publisher:
ISBN:
Category :
Languages : en
Pages : 368
Get Book Here
Book Description
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 850
Get Book Here
Book Description
Author: John V. Guttag
Publisher:
ISBN:
Category : Computer science
Languages : en
Pages : 400
Get Book Here
Book Description
Author: Elie Maricau
Publisher: Springer Science & Business Media
ISBN: 1461461634
Category : Technology & Engineering
Languages : en
Pages : 208
Get Book Here
Book Description
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Author: Nadine Azemard
Publisher: Springer
ISBN: 3540744428
Category : Computers
Languages : en
Pages : 596
Get Book Here
Book Description
This volume features the refereed proceedings of the 17th International Workshop on Power and Timing Modeling, Optimization and Simulation. Papers cover high level design, low power design techniques, low power analog circuits, statistical static timing analysis, power modeling and optimization, low power routing optimization, security and asynchronous design, low power applications, modeling and optimization, and more.
Author: Rui Zheng
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 70
Get Book Here
Book Description
Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are important reliability issues impacting analog circuit performance and lifetime. Compact reliability models and efficient simulation methods are essential for circuit level reliability prediction. This work proposes a set of compact models of NBTI and CHC effects for analog and mixed-signal circuit, and a direct prediction method which is different from conventional simulation methods. This method is applied in circuit benchmarks and evaluated. This work helps with improving efficiency and accuracy of circuit aging prediction.
Author: Herman Casier
Publisher: Springer Science & Business Media
ISBN: 9400703910
Category : Technology & Engineering
Languages : en
Pages : 369
Get Book Here
Book Description
Analog Circuit Design contains the contribution of 18 tutorials of the 19th workshop on Advances in Analog Circuit Design. Each part discusses a specific to-date topic on new and valuable design ideas in the area of analog circuit design. Each part is presented by six experts in that field and state of the art information is shared and overviewed. This book is number 20 in this successful series of Analog Circuit Design, providing valuable information and excellent overviews of: Robust Design, chaired by Herman Casier, Consultant Sigma Delta Converters, chaired by Prof. Michiel Steyaert, Catholic University Leuven RFID, chaired by Prof. Arthur van Roermund, Eindhoven University of Technology Analog Circuit Design is an essential reference source for analog circuit designers and researchers wishing to keep abreast with the latest development in the field. The tutorial coverage also makes it suitable for use in an advanced design course.
