On-Loom Fabric Defect Inspection Using Contact Image Sensors and Activation Layer Embedded Convolutional Neural Network PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download On-Loom Fabric Defect Inspection Using Contact Image Sensors and Activation Layer Embedded Convolutional Neural Network PDF full book. Access full book title On-Loom Fabric Defect Inspection Using Contact Image Sensors and Activation Layer Embedded Convolutional Neural Network by Wenbin Ouyang. Download full books in PDF and EPUB format.
Author: Wenbin Ouyang
Publisher:
ISBN:
Category : Image converters
Languages : en
Pages : 106
Get Book Here
Book Description
Malfunctions on loom machines are the main causes of faulty fabric production. An on-loom fabric inspection system is a real-time monitoring device that enables immediate defect detection for human intervention. This dissertation presented a solution for the on-loom fabric defect inspection, including the new hardware design-the configurable contact image sensor (CIS) module-for on-loom fabric scanning and the defect detection algorithms. The main contributions of this work include (1) creating a configurable CIS module adaptable to a loom width, which brings CIS unique features, such as sub-millimeter resolution, compact size, short working distance and low cost, to the fabric defect inspection system, (2) designing a two-level hardware architecture that can be efficiently deployed in a weaving factory with hundreds of looms, (3) developing a two-level inspecting scheme, with which the initial defect screening is performed on the Raspberry Pi and the intensive defect verification is processed on the cloud server, (4) introducing the novel pairwise-potential activation layer to a convolutional neural network that leads to high accuracies of defect segmentation on fabrics with fine and imbalanced structures, (5) achieving a real-time defect detection that allows a possible defect to be examined multiple times, and (6) implementing a new color segmentation technique suitable for processing multi-color fabric defects. The novel CIS-based on-loom scanning system offered real-time and high-resolution fabric images, which was able to deliver the information of single thread on a fabric. The algorithm evaluation on the fabric defect datasets showed a non-miss-detection rate on defect-free fabrics. The average precision of defect existed images reached above 90% at the pixel level. The detected defect pixels' integrity-the recall scored around 70%. Possible defect regions overestimated on ground truth images and the morphologies of fine defects similar to regular fabric pattern were the two major reasons that caused the imperfection in defect pixel locating. The experiments showed the defect areas on multi-color fabrics could be precisely located under the proposed color segmentation algorithm.
Author: Wenbin Ouyang
Publisher:
ISBN:
Category : Image converters
Languages : en
Pages : 106
Get Book Here
Book Description
Malfunctions on loom machines are the main causes of faulty fabric production. An on-loom fabric inspection system is a real-time monitoring device that enables immediate defect detection for human intervention. This dissertation presented a solution for the on-loom fabric defect inspection, including the new hardware design-the configurable contact image sensor (CIS) module-for on-loom fabric scanning and the defect detection algorithms. The main contributions of this work include (1) creating a configurable CIS module adaptable to a loom width, which brings CIS unique features, such as sub-millimeter resolution, compact size, short working distance and low cost, to the fabric defect inspection system, (2) designing a two-level hardware architecture that can be efficiently deployed in a weaving factory with hundreds of looms, (3) developing a two-level inspecting scheme, with which the initial defect screening is performed on the Raspberry Pi and the intensive defect verification is processed on the cloud server, (4) introducing the novel pairwise-potential activation layer to a convolutional neural network that leads to high accuracies of defect segmentation on fabrics with fine and imbalanced structures, (5) achieving a real-time defect detection that allows a possible defect to be examined multiple times, and (6) implementing a new color segmentation technique suitable for processing multi-color fabric defects. The novel CIS-based on-loom scanning system offered real-time and high-resolution fabric images, which was able to deliver the information of single thread on a fabric. The algorithm evaluation on the fabric defect datasets showed a non-miss-detection rate on defect-free fabrics. The average precision of defect existed images reached above 90% at the pixel level. The detected defect pixels' integrity-the recall scored around 70%. Possible defect regions overestimated on ground truth images and the morphologies of fine defects similar to regular fabric pattern were the two major reasons that caused the imperfection in defect pixel locating. The experiments showed the defect areas on multi-color fabrics could be precisely located under the proposed color segmentation algorithm.
Author: Samit Chakraborty
Publisher:
ISBN:
Category :
Languages : en
Pages : 139
Get Book Here
Book Description
Author: Tin-Chi Lee
Publisher: Open Dissertation Press
ISBN: 9781374716933
Category : Technology & Engineering
Languages : en
Pages : 172
Get Book Here
Book Description
This dissertation, "Fabric Defect Detection by Wavelet Transform and Neural Network" by Tin-chi, Lee, 李天賜, was obtained from The University of Hong Kong (Pokfulam, Hong Kong) and is being sold pursuant to Creative Commons: Attribution 3.0 Hong Kong License. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation. All rights not granted by the above license are retained by the author. Abstract: Abstract of thesis entitled Submitted by LEE Tin Chi for the degree of Master of Philosophy at The University of Hong Kong in July 2004 Textile inspection plays an important role in maintaining the quality of products. In this thesis, three methods which utilize matched masks, wavelet transform and neural network are proposed for fabric defect detection. An evaluation of the performance of the methods was conducted on eight classes of fabric defects (Broken End, Dirty Yarn, Mispick, Netting Multiples, Slack End, Thick Bar, Thin Bar, and Wrong Draw). In the first method, a multi-channel filtering bank equipped with five matched masks was used. Matched masks are 2-D filters that characterize specific texture properties. They are designed to emphasize the Wrong Draw texture, the Mispick texture, the horizontal edges, the bars structure and the filled regions on fabric images. At the filter outputs, segmentation by thresholds is applied, followed by a logical OR operation. The total number of pixels exceeding the threshold on the resulting image determines whether the fabric image is defective or defect-free. Using this method, 96% of fabric defects were successfully detected, and the false alarm rate was 6%. The method achieved a 90% - 100% detection rate for most fabric defects, though the detection rate for Thin Bar defects was only 75%. The second method employed wavelet transform to decompose fabric images into multi-scales and orientations. During the training stage, the parameters to be optimized include the rotation angles and the two thresholds applied on the horizontal and vertical transformed images. The variation in rotation angles determines the selection of wavelet bases. During the detection stage, the discrimination criterion is based on the total number of defect windows. Using this method, only 76% of fabric defects were identified, and the false alarm rate was 7%. The detection rate for Dirty Yarn was high, but much lower for Broken End and Wrong Draw defects. The last method took advantage of the fault tolerance and learning ability of neural networks. We explored the texture structure of defect-free images so that feature extraction was conducted on repeating units with proper selection of locations. For defect images, similar feature vectors were extracted and passed to the neural network. Using this method, the detection rate was as high as 92% and the false alarm rate was 6%. Dirty Yarn, Netting Multiples, Mispick, Thin Bar and Wrong Draw defects were completely identified, while 75% of Broken End and Slack End defects were detected. However, only 73% of Thin Bar defects were detected. The method employing matched masks proved the most effective in detecting fabric defects. The neural network method was next best. The wavelet transform method was the least effective, because it was only able to detect effectively certain classes of fabric defects. Dirty Yarn, Netting Multiples, Mispick and Slack End defects are relatively easy to identify correctly. Wrong Draw and Thin Bar defects are less easy to detect and Broken End and Thick Bar defects are the most difficult to detect. DOI: 10.5353/th_b2928728 Subjects: Wavelets (Mathematics) Neural networks (Computer science) Textile fabrics - Testing
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 11
Get Book Here
Book Description
A noncontact, on-loom ultrasonic inspection technique was developed for real-time 100% defect inspection of fabrics. A prototype was built and tested successfully on loom. The system is compact, rugged, low cost, requires minimal maintenance, is not sensitive to fabric color and vibration, and can easily be adapted to current loom configurations. Moreover, it can detect defects in both the pick and warp directions. The system is capable of determining the size, location, and orientation of each defect. To further improve the system, air-coupled transducers with higher efficiency and sensitivity need to be developed. Advanced detection algorithms also need to be developed for better classification and categorization of defects in real-time.
Author: Dorian Schneider
Publisher:
ISBN:
Category :
Languages : en
Pages : 0
Get Book Here
Book Description
Author: A. J. Hyman
Publisher:
ISBN:
Category :
Languages : en
Pages :
Get Book Here
Book Description
Author: Mathew Salvaris
Publisher: Apress
ISBN: 1484236793
Category : Computers
Languages : en
Pages : 298
Get Book Here
Book Description
Get up-to-speed with Microsoft's AI Platform. Learn to innovate and accelerate with open and powerful tools and services that bring artificial intelligence to every data scientist and developer. Artificial Intelligence (AI) is the new normal. Innovations in deep learning algorithms and hardware are happening at a rapid pace. It is no longer a question of should I build AI into my business, but more about where do I begin and how do I get started with AI? Written by expert data scientists at Microsoft, Deep Learning with the Microsoft AI Platform helps you with the how-to of doing deep learning on Azure and leveraging deep learning to create innovative and intelligent solutions. Benefit from guidance on where to begin your AI adventure, and learn how the cloud provides you with all the tools, infrastructure, and services you need to do AI. What You'll Learn Become familiar with the tools, infrastructure, and services available for deep learning on Microsoft Azure such as Azure Machine Learning services and Batch AI Use pre-built AI capabilities (Computer Vision, OCR, gender, emotion, landmark detection, and more) Understand the common deep learning models, including convolutional neural networks (CNNs), recurrent neural networks (RNNs), generative adversarial networks (GANs) with sample code and understand how the field is evolving Discover the options for training and operationalizing deep learning models on Azure Who This Book Is For Professional data scientists who are interested in learning more about deep learning and how to use the Microsoft AI platform. Some experience with Python is helpful.
Author: Boris Murmann
Publisher: Springer Nature
ISBN: 3030183386
Category : Science
Languages : en
Pages : 597
Get Book Here
Book Description
In this book, a global team of experts from academia, research institutes and industry presents their vision on how new nano-chip architectures will enable the performance and energy efficiency needed for AI-driven advancements in autonomous mobility, healthcare, and man-machine cooperation. Recent reviews of the status quo, as presented in CHIPS 2020 (Springer), have prompted the need for an urgent reassessment of opportunities in nanoelectronic information technology. As such, this book explores the foundations of a new era in nanoelectronics that will drive progress in intelligent chip systems for energy-efficient information technology, on-chip deep learning for data analytics, and quantum computing. Given its scope, this book provides a timely compendium that hopes to inspire and shape the future of nanoelectronics in the decades to come.
Author: Bryan P. Bergeron
Publisher: Prentice Hall Professional
ISBN: 9780131008250
Category : Computers
Languages : en
Pages : 472
Get Book Here
Book Description
Comprehensive and concise, this handbook has chapters on computing visualization, large database designs, advanced pattern matching and other key bioinformatics techniques. It is a practical guide to computing in the growing field of Bioinformatics--the study of how information is represented and transmitted in biological systems, starting at the molecular level.
Author: Omid Bozorg-Haddad
Publisher: Springer
ISBN: 9811052212
Category : Technology & Engineering
Languages : en
Pages : 166
Get Book Here
Book Description
This book, compiles, presents, and explains the most important meta-heuristic and evolutionary optimization algorithms whose successful performance has been proven in different fields of engineering, and it includes application of these algorithms to important engineering optimization problems. In addition, this book guides readers to studies that have implemented these algorithms by providing a literature review on developments and applications of each algorithm. This book is intended for students, but can be used by researchers and professionals in the area of engineering optimization.
