Off-specular X-ray Scattering Studies of the Morphology of Thin Films PDF Download
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 17
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Book Description
We discuss the scattering of x-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 17
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Book Description
We discuss the scattering of x-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.
Author: Metin Tolan
Publisher: Springer
ISBN:
Category : Medical
Languages : en
Pages : 216
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Book Description
The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
Author: Mario Birkholz
Publisher: Wiley-VCH
ISBN: 9783527310524
Category : Technology & Engineering
Languages : en
Pages : 378
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Book Description
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author: Andrew P. Warren
Publisher:
ISBN:
Category :
Languages : en
Pages : 128
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Book Description
Nanometric thin films are used widely throughout various industries and for various applications. Metallic thin films, specifically, are relied upon extensively in the microelectronics industry, among others. For example, alloy thin films are being investigated for CMOS applications, tungsten films find uses as contacts and diffusion barriers, and copper is used often as interconnect material. Appropriate metrology methods must therefore be used to characterize the physical properties of these films. X-ray scattering experiments are well suited for the investigation of nano-scaled systems, and are the focus of this doctoral dissertation. Emphasis is placed on (1) phase identification of polycrystalline thin films, (2) the evaluation of the grain size and microstrain of metallic thin films by line profile analysis, and (3) the study of morphological evolution in solid/solid interfaces. To illustrate the continued relevance of x-ray diffraction for phase identification of simple binary alloy systems, Pt-Ru thin films, spanning the compositional range from pure Pt to pure Ru were investigated. In these experiments, a meta-stable extension of the HCP phase is observed in which the steepest change in the electronic work function coincides with a rapid change in the c/a ratio of the HCP phase. For grain size and microstrain analysis, established line profile methods are discussed in terms of Cu and W thin film analysis. Grain sizes obtained by x-ray diffraction are compared to transmission electron microscopy based analyses. Significant discrepancies between x-ray and electron microscopy are attributed to sub-grain misorientations arising from dislocation core spreading at the film/substrate interface. A novel "residual" full width half max parameter is introduced for examining the contribution of strain to x-ray peak broadening. The residual width is subsequently used to propose an empirical method of line profile analysis for thin films on substrates. X-ray reflectivity was used to study the evolution of interface roughness with annealing for a series of Cu thin films that were encapsulated in both SiO2 and Ta/SiO2. While all samples follow similar growth dynamics, notable differences in the roughness evolution with high temperature ex-situ annealing were observed. The annealing resulted in a smoothing of only one interface for the SiO2 encapsulated films, while neither interface of the Ta/SiO2 encapsulated films evolved significantly. The fact that only the upper Cu/SiO2 interface evolves is attributed to mechanical pinning of the lower interface to the rigid substrate. The lack of evolution of the Cu/Ta/SiO2 interface is consistent with the lower diffusivity expected of Cu in a Cu/Ta interface as compared to that in a Cu/SiO2 interface. The smoothing of the upper Cu/SiO2 interface qualitatively follows that expected for capillarity driven surface diffusion but with notable quantitative deviation.
Author: Christian Hermann Frank
Publisher:
ISBN:
Category : Organic thin films
Languages : en
Pages :
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Book Description
Author: Peter S. Pershan
Publisher: Cambridge University Press
ISBN: 0521814014
Category : Science
Languages : en
Pages : 335
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Book Description
A practical guide for graduate students and researchers on all aspects of x-ray scattering experiments on liquid surfaces and interfaces.
Author: C.A. Melendres
Publisher: Springer Science & Business Media
ISBN: 9401732000
Category : Science
Languages : en
Pages : 483
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Book Description
Proceedings of the NATO Advanced Research Workshop, Funchal, Madeira, Portugal, December 14--18, 1992
Author: Nathan Ida
Publisher: Springer
ISBN: 9783319265520
Category : Science
Languages : en
Pages : 0
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Book Description
This handbook is a comprehensive source of information on all aspects of non-destructive testing (NDT), for use by professionals, educators, and most of all, by the practitioners of testing. The art of NDT consists of dozens of methods, some classical, and some emerging. As the pace of industrial work and discovery intensifies and materials are utilized to their physical limits, the role of NDT becomes ever more important. As a result, the methods of testing are themselves evolving, and it is the intent of this book to capture this evolution. Handbook of Modern Non-Destructive Testing broadens the scope from traditional books on the subject. In addition to classical, emerging and exotic methods of evaluation, the book will also cover the use of NDT techniques in other fields, such as archaeology or resource exploration. With contributions from experts in all areas of the field, the reader will find balanced coverage of a variety of testing methods, with no bias against or endorsements of any particular method. The book treats many areas in depth, covering all aspects of testing, and will include case studies where appropriate. Additional coverage of statistical methods and their use, as well as simulations‘ role in testing and test design, are included.
Author: Vaclav Holy
Publisher: Springer
ISBN: 9783662147429
Category : Technology & Engineering
Languages : en
Pages : 258
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Book Description
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
Author: S. P. Sen Gupta
Publisher: Allied Publishers
ISBN: 9788177642629
Category : Diffraction
Languages : en
Pages : 182
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Book Description
