Nondestructive Evaluation of Semiconductor Materials and Devices PDF Download
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Author: J. Zemel
Publisher: Springer Science & Business Media
ISBN: 1475713525
Category : Technology & Engineering
Languages : en
Pages : 791
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Book Description
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Author: J. Zemel
Publisher: Springer Science & Business Media
ISBN: 1475713525
Category : Technology & Engineering
Languages : en
Pages : 791
Get Book Here
Book Description
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Author: Jay N. Zemel
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 782
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 572
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Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 684
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Author: 国立国会図書館 (Japan)
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 672
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Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 668
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Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 680
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Book Description
Author: R S Sharpe
Publisher: Butterworth-Heinemann
ISBN: 148316408X
Category : Technology & Engineering
Languages : en
Pages : 492
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Book Description
Quality Technology Handbook, Fourth Edition offers a wide discussion on technology and its related subtopics. After giving some information on its background, content, and authors, the book then informs the readers about the quality problem check-list and enumerates the questions one has to ask to ensure that a problem will be solved. This part is followed by a discussion on non-destructive testing (NDT) and the several committees formed for it, among which are the British National Committee and the Harwell NDT Center. The book also includes information on two organizations that are closely related to the topic, the Institute of Quality Assurance (IQA) and The Welding Institute (TWI). A directory of international organizations related to quality assurance and non-destructive testing is provided in the latter part of the text. The book serves as valuable reference to undergraduates or postgraduates of courses that are related to science and technology.
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 116
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Book Description
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category :
Languages : en
Pages : 548
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Book Description
