Author: J. Zemel
Publisher: Springer Science & Business Media
ISBN: 1475713525
Category : Technology & Engineering
Languages : en
Pages : 791
Book Description
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Nondestructive Evaluation of Semiconductor Materials and Devices
Author: J. Zemel
Publisher: Springer Science & Business Media
ISBN: 1475713525
Category : Technology & Engineering
Languages : en
Pages : 791
Book Description
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Publisher: Springer Science & Business Media
ISBN: 1475713525
Category : Technology & Engineering
Languages : en
Pages : 791
Book Description
From September 19-29, a NATO Advanced Study Institute on Non destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub stantial immediate concern to the device technologies and end users.
Nondestructive Evaluation of Semiconductor Materials and Devices
Author: Zemel JN Ed
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Non-destructive Evaluation of Semiconductor Materials and Devices
Author: J. N. Zemel
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Nondestructive Tests Used to Insure the Integrity of Semiconductor Devices, with Emphasis on Acoustic Emission Techniques
Author: George G. Harman
Publisher:
ISBN:
Category : Acoustic emission
Languages : en
Pages : 80
Book Description
Publisher:
ISBN:
Category : Acoustic emission
Languages : en
Pages : 80
Book Description
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 684
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 684
Book Description
Nondestructive Evaluation Activities in the Semiconductor Materials and Processes Division
Author: R. D. Larrabee
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Electronics Reliability and Measurement Technology
Author: Joseph S. Heyman
Publisher: Elsevier
ISBN: 0815517009
Category : Technology & Engineering
Languages : en
Pages : 145
Book Description
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Publisher: Elsevier
ISBN: 0815517009
Category : Technology & Engineering
Languages : en
Pages : 145
Book Description
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.
Journal of Research of the National Bureau of Standards
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 572
Book Description
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 572
Book Description
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 680
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 680
Book Description
Publications
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 668
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 668
Book Description