Author: S.T. Chadradhar
Publisher: Springer Science & Business Media
ISBN: 1461539587
Category : Computers
Languages : en
Pages : 187

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Book Description
References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy Minimization. . . . . . . . . . . . . 94 9. 5. 1 Transitive Oosure . . . . . . . . . . . . . . . . . 94 9. 5. 2 Additional Pairwise Relationships 96 9. 5. 3 Path Sensitization . . . . . . . . . . . . . . . . . 97 9. 6 Experimental Results 98 9. 7 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 100 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 10 TRANSITIVE CLOSURE AND TESTING 103 10. 1 Background . . . . . . . . . . . . . . . . . . . . . . . . 104 10. 2 Transitive Oosure Definition 105 10. 3 Implication Graphs 106 10. 4 A Test Generation Algorithm 107 10. 5 Identifying Necessary Assignments 112 10. 5. 1 Implicit Implication and Justification 113 10. 5. 2 Transitive Oosure Does More Than Implication and Justification 115 10. 5. 3 Implicit Sensitization of Dominators 116 10. 5. 4 Redundancy Identification 117 10. 6 Summary 119 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 119 11 POLYNOMIAL-TIME TESTABILITY 123 11. 1 Background 124 11. 1. 1 Fujiwara's Result 125 11. 1. 2 Contribution of the Present Work . . . . . . . . . 126 11. 2 Notation and Tenninology 127 11. 3 A Polynomial TlDle Algorithm 128 11. 3. 1 Primary Output Fault 129 11. 3. 2 Arbitrary Single Fault 135 11. 3. 3 Multiple Faults. . . . . . . . . . . . . . . . . . . 137 11. 4 Summary. . . . . . . . . . . . . . . . . . . . . . . . . . 139 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139 ix 12 SPECIAL CASES OF HARD PROBLEMS 141 12. 1 Problem Statement 142 12. 2 Logic Simulation 143 12. 3 Logic Circuit Modeling . 146 12. 3. 1 Modelfor a Boolean Gate . . . . . . . . . . . . . 147 12. 3. 2 Circuit Modeling 148 12.

Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 0306470403
Category : Technology & Engineering
Languages : en
Pages : 690

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Book Description
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Author: Abhijit Ghosh
Publisher: Springer Science & Business Media
ISBN: 1461536464
Category : Technology & Engineering
Languages : en
Pages : 224

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Book Description
In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.

Author: A. Nejat Ince
Publisher: Springer Science & Business Media
ISBN: 147572148X
Category : Technology & Engineering
Languages : en
Pages : 254

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Book Description
After alm ost three scores of years of basic and applied research, the field of speech processing is, at present, undergoing a rapid growth in terms of both performance and applications and this is fueHed by the advances being made in the areas of microelectronics, computation and algorithm design.Speech processing relates to three aspects of voice communications: -Speech Coding and transmission which is mainly concerned with man-to man voice communication. -Speech Synthesis which deals with machine-to-man communication. -Speech Recognition which is related to man-to-machine communication. Widespread application and use of low-bit rate voice codec.>, synthesizers and recognizers which are all speech processing products requires ideaHy internationally accepted quality assessment and evaluation methods as weH as speech processing standards so that they may be interconnected and used independently of their designers and manufacturers without costly interfaces. This book presents, in a tutorial manner, both fundamental and applied aspects of the above topics which have been prepared by weH-known specialists in their respective areas. The book is based on lectures which were sponsored by AGARD/NATO and delivered by the authors, in several NATO countries, to audiences consisting mainly of academic and industrial R&D engineers and physicists as weH as civil and military C3I systems planners and designers.

Author: Sherif H.K. Embabi
Publisher: Springer Science & Business Media
ISBN: 1461531748
Category : Technology & Engineering
Languages : en
Pages : 413

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Book Description
Digital BiCMOS Integrated Circuit Design is the first book devoted entirely to the analysis and design of digital BiCMOS integrated circuits. BiCMOS Integrated Circuit Design also reviews CMOS and CML integrated circuit design. The application of BiCMOS in the design of digital subsystems, e.g. adders, multipliers, RAMs and PLAs is addressed. The book also introduces the reader to IC process technology: CMOS, bipolar and BiCMOS. The modeling of both the bipolar and MOS devices are covered. Many process/device/circuit design issues are discussed. Digital BiCMOS Integrated Circuit Design can be used by engineers, researchers, graduate and senior undergraduate students working in the area of digital integrated circuits, digital circuits and system design, BiCMOS process and device modeling.

Author: Kenneth M. Butler
Publisher: Springer Science & Business Media
ISBN: 1461536065
Category : Computers
Languages : en
Pages : 142

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Book Description
For many years, the dominant fault model in automatic test pattern gen eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.

Author: Pranav Ashar
Publisher: Springer Science & Business Media
ISBN: 1461536286
Category : Technology & Engineering
Languages : en
Pages : 238

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Book Description
3. 2 Input Encoding Targeting Two-Level Logic . . . . . . . . 27 3. 2. 1 One-Hot Coding and Multiple-Valued Minimization 28 3. 2. 2 Input Constraints and Face Embedding 30 3. 3 Satisfying Encoding Constraints . . . . . . . 32 3. 3. 1 Definitions . . . . . . . . . . . . . . . 32 3. 3. 2 Column-Based Constraint Satisfaction 33 3. 3. 3 Row-Based Constraint Satisfaction . . 37 3. 3. 4 Constraint Satisfaction Using Dichotomies . 38 3. 3. 5 Simulated Annealing for Constraint Satisfaction 41 3. 4 Input Encoding Targeting Multilevel Logic. . 43 3. 4. 1 Kernels and Kernel Intersections . . . 44 3. 4. 2 Kernels and Multiple-Valued Variables 46 3. 4. 3 Multiple-Valued Factorization. . . . . 48 3. 4. 4 Size Estimation in Algebraic Decomposition . 53 3. 4. 5 The Encoding Step . 54 3. 5 Conclusion . . . . . . . . . 55 4 Encoding of Symbolic Outputs 57 4. 1 Heuristic Output Encoding Targeting Two-Level Logic. 59 4. 1. 1 Dominance Relations. . . . . . . . . . . . . . . . 59 4. 1. 2 Output Encoding by the Derivation of Dominance Relations . . . . . . . . . . . . . . . . . . . . . 60 . . 4. 1. 3 Heuristics to Minimize the Number of Encoding Bits . . . . . . . . . . . . 64 4. 1. 4 Disjunctive Relationships . . . . . . . . . . . 65 4. 1. 5 Summary . . . . . . . . . . . . . . . . . . 66 . . 4. 2 Exact Output Encoding Targeting Two-Level Logic. 66 4. 2. 1 Generation of Generalized Prime Implicants . 68 4. 2. 2 Selecting a Minimum Encodeable Cover . . . 68 4. 2. 3 Dominance and Disjunctive Relationships to S- isfy Constraints . . . . . . . . . . . 70 4. 2. 4 Constructing the Optimized Cover 73 4. 2. 5 Correctness of the Procedure . . 73 4. 2. 6 Multiple Symbolic Outputs . . .

Author: Timothy J. Barnes
Publisher: Springer Science & Business Media
ISBN: 1461535581
Category : Technology & Engineering
Languages : en
Pages : 205

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Book Description
When it comes to frameworks, the familiar story of the elephant and the six blind philosophers seems to apply. As each philoso pher encountered a separate part of the elephant, each pronounced his considered, but flawed judgement. One blind philosopher felt a leg and thought it a tree. Another felt the tail and thought he held a rope. Another felt the elephant's flank and thought he stood before a wall. We're supposed to learn about snap judgements from this alle gory, but its author might well have been describing design automation frameworks. For in the reality of today's product development requirements, a framework must be many things to many people. xiv CAD Frameworks: Integration Technology for CAD As the authors of this book note, framework design is an optimi zation problem. Somehow, it has to be both a superior rope for one and a tremendous tree for another. Somehow it needs to provide a standard environment for exploiting the full potential of computer-aided engineering tools. And, somehow, it has to make real such abstractions as interoperability and interchangeability. For years, we've talked about a framework as something that provides application-oriented services, just as an operating system provides system-level support. And for years, that simple statement has hid the tremendous complexity of actually providing those services.

Author: C. H. Chen
Publisher: World Scientific
ISBN: 9789810222765
Category : Computers
Languages : en
Pages : 1000

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Book Description
"The book provides an up-to-date and authoritative treatment of pattern recognition and computer vision, with chapters written by leaders in the field. On the basic methods in pattern recognition and computer vision, topics range from statistical pattern recognition to array grammars to projective geometry to skeletonization, and shape and texture measures."--BOOK JACKET.

Author: Catherine H. Gebotys
Publisher: Springer Science & Business Media
ISBN: 1461540186
Category : Technology & Engineering
Languages : en
Pages : 293

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Book Description
Although research in architectural synthesis has been conducted for over ten years it has had very little impact on industry. This in our view is due to the inability of current architectural synthesizers to provide area-delay competitive (or "optimal") architectures, that will support interfaces to analog, asynchronous, and other complex processes. They also fail to incorporate testability. The OASIC (optimal architectural synthesis with interface constraints) architectural synthesizer and the CATREE (computer aided trees) synthesizer demonstrate how these problems can be solved. Traditionally architectural synthesis is viewed as NP hard and there fore most research has involved heuristics. OASIC demonstrates by using an IP approach (using polyhedral analysis), that most input algo rithms can be synthesized very fast into globally optimal architectures. Since a mathematical model is used, complex interface constraints can easily be incorporated and solved. Research in test incorporation has in general been separate from syn thesis research. This is due to the fact that traditional test research has been at the gate or lower level of design representation. Nevertheless as technologies scale down, and complexity of design scales up, the push for reducing testing times is increased. On way to deal with this is to incorporate test strategies early in the design process. The second half of this text examines an approach for integrating architectural synthesis with test incorporation. Research showed that test must be considered during synthesis to provide good architectural solutions which minimize Xlll area delay cost functions.