National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999 PDF Download
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Author:
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ISBN:
Category :
Languages : en
Pages : 148
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Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 148
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Author: National Semiconductor Metrology Program (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 148
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Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 148
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Author:
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ISBN:
Category :
Languages : en
Pages : 160
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Author: National Institute of Standards and Technology (U.S.)
Publisher:
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Category :
Languages : en
Pages : 1162
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Author: D. K. Harman
Publisher: DIANE Publishing
ISBN: 0788125214
Category :
Languages : en
Pages : 527
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Held in Gaithersburg, MD, Nov. 4-6, 1992. Evaluates new technologies in information retrieval. Numerous graphs, tables and charts.
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
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Author: Barry N. Taylor
Publisher: DIANE Publishing
ISBN: 1437915566
Category : Science
Languages : en
Pages : 25
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Results of measurements and conclusions derived from them constitute much of the technical information produced by the National Institute of Standards and Technology (NIST). In July 1992 the Director of NIST appointed an Ad Hoc Committee on Uncertainty Statements and charged it with recommending a policy on this important topic. The Committee concluded that the CIPM approach could be used to provide quantitative expression of measurement that would satisfy NIST¿s customers¿ requirements. NIST initially published a Technical Note on this issue in Jan. 1993. This 1994 edition addresses the most important questions raised by recipients concerning some of the points it addressed and some it did not. Illustrations.
Author: James R. Ehrstein
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
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Author: Donna K. Harman
Publisher:
ISBN:
Category : Information storage and retrieval systems
Languages : en
Pages : 506
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