Author: Publisher:
ISBN:
Category : Grazing incidence
Languages : en
Pages : 592
Book Description
Multilayer and Grazing Incidence X-ray/EUV Optics II
Author: Publisher:
ISBN:
Category : Grazing incidence
Languages : en
Pages : 592
Book Description
Multilayer and Grazing Incidence X-ray/EUV Optics II
Author: Richard B. HooverPublisher: Society of Photo Optical
ISBN: 9780819412607
Category : Technology & Engineering
Languages : en
Pages : 592
Book Description
Crystal and Multilayer Optics
Author: A. T. MacranderPublisher: SPIE-International Society for Optical Engineering
ISBN:
Category : Science
Languages : en
Pages : 398
Book Description
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category :
Languages : en
Pages : 1162
Book Description
Handbook of X-ray and Gamma-ray Astrophysics
Author: Cosimo BambiPublisher: Springer Nature
ISBN: 9811969604
Category :
Languages : en
Pages : 5912
Book Description
Technology 2000
Author: Publisher:
ISBN:
Category : Technology
Languages : en
Pages : 436
Book Description
Handbook of Optomechanical Engineering
Author: Anees AhmadPublisher: CRC Press
ISBN: 1498761496
Category : Science
Languages : en
Pages : 594
Book Description
This comprehensive handbook covers all major aspects of optomechanical engineering - from conceptual design to fabrication and integration of complex optical systems. The practical information within is ideal for optical and optomechanical engineers and scientists involved in the design, development and integration of modern optical systems for commercial, space, and military applications. Charts, tables, figures, and photos augment this already impressive text. Fully revised, the new edition includes 4 new chapters: Plastic optics, Optomechanical tolerancing and error budgets, Analysis and design of flexures, and Optomechanical constraint equations.
National Semiconductor Metrology Program
Author: National Semiconductor Metrology Program (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 136
Book Description
National Semiconductor Metrology Program
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Semiconductors
Languages : en
Pages : 160
Book Description
National Semiconductor Metrology Program, NIST List OF Publications, LP 103, May 2000
Author: Publisher:
ISBN:
Category :
Languages : en
Pages : 160
Book Description
