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Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 9535105841
Category : Technology & Engineering
Languages : en
Pages : 474
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Book Description
"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.
Author: Luigi Cocco
Publisher: BoD – Books on Demand
ISBN: 9535105841
Category : Technology & Engineering
Languages : en
Pages : 474
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Book Description
"What are the recent developments in the field of Metrology?" International leading experts answer this question providing both state of the art presentation and a road map to the future of measurement science. The book is organized in six sections according to the areas of expertise, namely: Introduction; Length, Distance and Surface; Voltage, Current and Frequency; Optics; Time and Relativity; Biology and Medicine. Theoretical basis and applications are explained in accurate and comprehensive manner, providing a valuable reference to researchers and professionals.
Author: Anil Akdogan
Publisher: BoD – Books on Demand
ISBN: 1789235952
Category : Technology & Engineering
Languages : en
Pages : 124
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Book Description
Metrology, the science of measurement, is crucial for many sciences and technological developments. Since metrology helps to improve many other sciences, the book reflects in general metrology and some special metrological approaches at different fields such as radiation and frequency measurements in detail. This book also focuses on technical testing and control applications in the industry. It also intends the fundamentals of metrology concerning the related standards and systems of units. In addition, the book considers the calibration of measurement instruments and measurement uncertainties as the basic requirements of the related quality standards.
Author: M.J.T. Milton
Publisher: IOS Press
ISBN: 1643682474
Category : Science
Languages : en
Pages : 480
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Book Description
The use of standard and reliable measurements is essential in many areas of life, but nowhere is it of more crucial importance than in the world of science, and physics in particular. This book contains 20 contributions presented as part of Course 206 of the International School of Physics Enrico Fermi on New Frontiers for Metrology: From Biology and Chemistry to Quantum and Data Science, held in Varenna, Italy, from 4 -13 July 2019. The Course was the 7th in the Enrico Fermi series devoted to metrology, and followed a milestone in the history of measurement: the adoption of new definitions for the base units of the SI. During the Course, participants reviewed the decision and discussed how the new foundation for metrology is opening new possibilities for physics, with several of the lecturers reflecting on the implications for an easier exploration of the unification of quantum mechanics and gravity. A wide range of other topics were covered, from measuring color and appearance to atomic weights and radiation, and including the application of metrological principles to the management and interpretation of very large sets of scientific data and the application of metrology to biology. The book also contains a selection of posters from the best of those presented by students at the Course. Offering a fascinating exploration of the latest thinking on the subject of metrology, this book will be of interest to researchers and practitioners from many fields.
Author: Alessandro Ferrero
Publisher: John Wiley & Sons
ISBN: 1119021332
Category : Technology & Engineering
Languages : en
Pages : 398
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Book Description
This book is a collection of chapters linked together by a logical framework aimed at exploring the modern role of the measurement science in both the technically most advanced applications and in everyday life Provides a unique methodological approach to understanding modern measurements Important methods and devices are presented in a synthetic and easy-to-understand way Includes end-of-chapter exercises and solutions
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 204
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Book Description
Author: Ernst O. Göbel
Publisher: John Wiley & Sons
ISBN: 3527412654
Category : Science
Languages : en
Pages : 243
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Book Description
The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization by quantum standards. Therefore, the underlying physics and technologies will receive increasing interest, and not only in the metrology community but in all fields of science. This book introduces and explains the applications of modern physics concepts to metrology, the science and the applications of measurements. A special focus is made on the use of quantum standards for the realization of the forthcoming new SI (the international system of units). The basic physical phenomena are introduced on a level which provides comprehensive information for the experienced reader but also provides a guide for a more intense study of these phenomena for students.
Author:
Publisher:
ISBN:
Category :
Languages : en
Pages : 180
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Book Description
Author: Tapan K. Sarkar
Publisher: John Wiley & Sons
ISBN: 1119076463
Category : Science
Languages : en
Pages : 724
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Book Description
New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterization Describes a solution to the generation of non-minimum phase from amplitude-only data Covers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.
Author: Manuel Servin
Publisher: John Wiley & Sons
ISBN: 3527411526
Category : Technology & Engineering
Languages : en
Pages : 344
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Book Description
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Author: sir George Christopher T. Bartley
Publisher:
ISBN:
Category :
Languages : en
Pages : 194
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Book Description
