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Author: Hans-Joachim Wunderlich
Publisher: Springer Science & Business Media
ISBN: 9048132827
Category : Computers
Languages : en
Pages : 263
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Book Description
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Author: Hans-Joachim Wunderlich
Publisher: Springer Science & Business Media
ISBN: 9048132827
Category : Computers
Languages : en
Pages : 263
Get Book Here
Book Description
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Author: Justyna Zander
Publisher: CRC Press
ISBN: 135183391X
Category : Computers
Languages : en
Pages : 690
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Book Description
What the experts have to say about Model-Based Testing for Embedded Systems: "This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. "It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students." —Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA "This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems." —Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway "As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today." —Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comté, Besançon, France, and co-author of Practical Model-Based Testing
Author: Martin Charles Golumbic
Publisher: Springer Science & Business Media
ISBN: 0387250360
Category : Mathematics
Languages : en
Pages : 296
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Book Description
Graph Theory, Combinatorics and Algorithms: Interdisciplinary Applications focuses on discrete mathematics and combinatorial algorithms interacting with real world problems in computer science, operations research, applied mathematics and engineering. The book contains eleven chapters written by experts in their respective fields, and covers a wide spectrum of high-interest problems across these discipline domains. Among the contributing authors are Richard Karp of UC Berkeley and Robert Tarjan of Princeton; both are at the pinnacle of research scholarship in Graph Theory and Combinatorics. The chapters from the contributing authors focus on "real world" applications, all of which will be of considerable interest across the areas of Operations Research, Computer Science, Applied Mathematics, and Engineering. These problems include Internet congestion control, high-speed communication networks, multi-object auctions, resource allocation, software testing, data structures, etc. In sum, this is a book focused on major, contemporary problems, written by the top research scholars in the field, using cutting-edge mathematical and computational techniques.
Author: National Research Council
Publisher: National Academies Press
ISBN: 0309174198
Category : Technology & Engineering
Languages : en
Pages : 240
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Book Description
For every weapons system being developed, the U.S. Department of Defense (DOD) must make a critical decision: Should the system go forward to full-scale production? The answer to that question may involve not only tens of billions of dollars but also the nation's security and military capabilities. In the milestone process used by DOD to answer the basic acquisition question, one component near the end of the process is operational testing, to determine if a system meets the requirements for effectiveness and suitability in realistic battlefield settings. Problems discovered at this stage can cause significant production delays and can necessitate costly system redesign. This book examines the milestone process, as well as the DOD's entire approach to testing and evaluating defense systems. It brings to the topic of defense acquisition the application of scientific statistical principles and practices.
Author: Zainalabedin Navabi
Publisher: Springer Science & Business Media
ISBN: 1441975489
Category : Technology & Engineering
Languages : en
Pages : 452
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Book Description
This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.
Author: Sabina Jeschke
Publisher: Springer
ISBN: 3319425595
Category : Technology & Engineering
Languages : en
Pages : 714
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Book Description
This book develops the core system science needed to enable the development of a complex industrial internet of things/manufacturing cyber-physical systems (IIoT/M-CPS). Gathering contributions from leading experts in the field with years of experience in advancing manufacturing, it fosters a research community committed to advancing research and education in IIoT/M-CPS and to translating applicable science and technology into engineering practice. Presenting the current state of IIoT and the concept of cybermanufacturing, this book is at the nexus of research advances from the engineering and computer and information science domains. Readers will acquire the core system science needed to transform to cybermanufacturing that spans the full spectrum from ideation to physical realization.
Author: Saurabh Mani Tripathi
Publisher: Springer Nature
ISBN: 981990224X
Category : Electric testing
Languages : en
Pages : 463
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Book Description
This book is an edited collection that explores the fundamental concepts of real-time simulation/hardware-in-the-loop testing using Typhoon HIL for complex electrical systems. Typhoon HIL has recently emerged as a powerful tool in the rapidly growing field of ultra-high-fidelity controller-hardware-in-the-loop (C-HIL) simulations for power electronics, microgrids, and distribution networks. The book integrates the coverage of underlying theory and acclaimed methodological approaches and high-value applications of real-time simulation and hardware-in-the-loop testingall from the perspectives of eminent researchers around the globe utilizing Typhoon HIL. This book serves as a valuable resource for engineers, academicians, researchers, experienced professionals, and research scholars engaged in /becoming familiarized with the real-time simulation of complex electrical systems using Typhoon HIL with a specific focus on hardware-in-the-loop testing.
Author: Matteo Sonza Reorda
Publisher: Springer Science & Business Media
ISBN: 1846281458
Category : Technology & Engineering
Languages : en
Pages : 187
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Book Description
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Author: Mercedes C. Reaves
Publisher:
ISBN:
Category : Finite element method
Languages : en
Pages : 56
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Book Description
Author: Thomas I. Strasser
Publisher: Springer Nature
ISBN: 3030422747
Category : Technology & Engineering
Languages : en
Pages : 141
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Book Description
This book is an open access book. This book provides an overview of the ERIGrid validation methodology for validating CPES, a holistic power system testing method. It introduces readers to corresponding simulation and laboratory-based tools, including co-simulation, real-time simulation, and hardware-in-the-loop. Selected test cases and validation examples are provided, in order to support the theory discussed. The book begins with an introduction to current power system testing methods and an overview of the ERIGrid system-level validation approach. It then moves on to discuss various validation methods, concepts and tools, including simulation and laboratory-based assessment methods. The book presents test cases and validation examples of the proposed methodologies and summarises the lessons learned from the holistic validation approach. In the final section of the book, the educational aspects of these methods, the outlook for the future, and overall conclusions are discussed. Given its scope, the book will be of interest to researchers, engineers, and laboratory personnel in the fields of power systems and smart grids, as well as undergraduate and graduate students studying related engineering topics.
