Modeling Nanoscale Imaging in Electron Microscopy PDF Download
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Author: Thomas Vogt
Publisher: Springer Science & Business Media
ISBN: 146142190X
Category : Science
Languages : en
Pages : 190
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Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Author: Thomas Vogt
Publisher: Springer Science & Business Media
ISBN: 146142190X
Category : Science
Languages : en
Pages : 190
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Book Description
This book presents advances in nanoscale imaging capabilities of scanning transmission electron microscopes, along with superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
Author: Ze Zhang
Publisher:
ISBN:
Category :
Languages : en
Pages :
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Book Description
Seeing is believing. The ability to directly visualize things greatly deepens people's knowledge and advances researches in many fields. Apart from resolving tiny things, optical imaging can also provide spectroscopy information which offers fundamental insights into the energy states of matter. As research develops at the nanoscale, these energy states are often affected by nanostructuring and local defects of the sample. An imaging tool that can provide optical information with nanometer-scale spatial resolution will offer fundamental insights, greatly enhance our ability to design novel materials, and advance research in a wealth of areas. Optical spectroscopy and imaging techniques like Raman, photoluminescence, and infrared spectroscopy are widely used for materials characterization. Visible photons have energies (meV to eV) match with those of the energy states inside the material and thus process excellent spectral selectivity. However, the spatial resolution of traditional optical techniques is diffraction-limited by the wavelength of light used. Although various super-resolution techniques have been developed to overcome this diffraction limit and reached ~10 nm resolution, these techniques require fluorescent labels or a sharp scanning tip, which limits their application. On the other hand, modern scanning or transmission electron microscopes (SEM or TEM) can readily achieve nanometer and angstrom spatial resolution using 1-300 keV high-energy electrons. However, the energy mismatch between such high-energy electrons and the energy states inside the sample makes high spectral resolution challenging for electron microscopes. Only very recently can some state-of-the-art electron monochromators achieve meV energy resolution, but this requires expensive and specialized instruments. Nanometer and atomic resolution label-free imaging with optical information has remained a major scientific challenge. In the work presented in this thesis, we developed a new imaging technique named PhotoAbsorption Microscopy using ELectron Analysis (PAMELA). PAMELA combines the high spectral selectivity of photoexcitation and the high spatial resolution of electron microscopes to offer nanometer-scale imaging with optical information. We implement PAMELA on two platforms, an SEM and a TEM, to demonstrate optical imaging first below the optical diffraction limit and eventually at the atomic scale resolution. For PAMELA-SEM, we experimentally demonstrate spectrally specific photoabsorption imaging with sub-20 nanometer spatial resolution using various semiconductor and metal nanoparticles. The photoabsorption-induced contrast mechanism is attributed to surface photovoltage which modulates the secondary electron emission. Theoretical analysis and Monte Carlo simulations are performed to explain the trends of the signal observed. For PAMELA-TEM, we discuss the possibility of imaging photoexcited states with atomic-scale resolution. We design an experimental set-up based on high-resolution TEM (HRTEM) and use ab initio together with HRTEM simulations to calculate the imaging conditions required for a few model systems, including defects in hexagonal boron nitride (h-BN) and core-shell quantum dots. We believe PAMELA will offer new opportunities for nanometer-scale optical spectroscopic imaging and material characterization.
Author: Rongming Wang
Publisher: Springer
ISBN: 9811304548
Category : Science
Languages : en
Pages : 508
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Book Description
This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.
Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0323916473
Category : Technology & Engineering
Languages : en
Pages : 665
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Book Description
Principles of Electron Optics: Second Edition, Advanced Wave Optics provides a self-contained, modern account of electron optical phenomena with the Dirac or Schrödinger equation as a starting point. Knowledge of this branch of the subject is essential to understanding electron propagation in electron microscopes, electron holography and coherence. Sections in this new release include, Electron Interactions in Thin Specimens, Digital Image Processing, Acquisition, Sampling and Coding, Enhancement, Linear Restoration, Nonlinear Restoration – the Phase Problem, Three-dimensional Reconstruction, Image Analysis, Instrument Control, Vortex Beams, The Quantum Electron Microscope, and much more. Includes authoritative coverage of many recent developments in wave electron optics Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Includes new content on multislice optics, 3D reconstruction, Wigner optics, vortex beams and the quantum electron microscope
Author: Vlad Stolojan
Publisher: Morgan & Claypool Publishers
ISBN: 1681741202
Category : Technology & Engineering
Languages : en
Pages : 69
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Book Description
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
Author: Nan Yao
Publisher: Springer Science & Business Media
ISBN: 1402080069
Category : Technology & Engineering
Languages : en
Pages : 745
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Book Description
Nanostructured materials take on an enormously rich variety of properties and promise exciting new advances in micromechanical, electronic, and magnetic devices as well as in molecular fabrications. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. Handbook of Microscopy for Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. This handbook highlights various key microcopic techniques and their applications in this fast-growing field. Topics to be covered include the following: scanning near field optical microscopy, confocal optical microscopy, atomic force microscopy, magnetic force microscopy, scanning turning microscopy, high-resolution scanning electron microscopy, orientational imaging microscopy, high-resolution transmission electron microscopy, scanning transmission electron microscopy, environmental transmission electron microscopy, quantitative electron diffraction, Lorentz microscopy, electron holography, 3-D transmission electron microscopy, high-spatial resolution quantitative microanalysis, electron-energy-loss spectroscopy and spectral imaging, focused ion beam, secondary ion microscopy, and field ion microscopy.
Author:
Publisher: World Scientific
ISBN: 9811204586
Category : Computers
Languages : en
Pages : 1001
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Book Description
This compendium provides a comprehensive collection of the emergent applications of big data, machine learning, and artificial intelligence technologies to present day physical sciences ranging from materials theory and imaging to predictive synthesis and automated research. This area of research is among the most rapidly developing in the last several years in areas spanning materials science, chemistry, and condensed matter physics.Written by world renowned researchers, the compilation of two authoritative volumes provides a distinct summary of the modern advances in instrument — driven data generation and analytics, establishing the links between the big data and predictive theories, and outlining the emerging field of data and physics-driven predictive and autonomous systems.
Author: Nobuo Tanaka
Publisher: World Scientific
ISBN: 1783264713
Category : Science
Languages : en
Pages : 616
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Book Description
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
Author: Jian Min Zuo
Publisher: Springer
ISBN: 1493966073
Category : Technology & Engineering
Languages : en
Pages : 741
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Book Description
This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to crystals, their defects, and nanostructures. The authoritative text summarizes and develops most of the useful knowledge which has been gained over the years from the study of the multiple electron scattering problem, the recent development of aberration correctors and their applications to materials structure characterization, as well as the authors' extensive teaching experience in these areas. Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience is ideal for use as an advanced undergraduate or graduate level text in support of course materials in Materials Science, Physics or Chemistry departments.
Author:
Publisher: Academic Press
ISBN: 0323850936
Category : Technology & Engineering
Languages : en
Pages : 296
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Book Description
Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
