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Languages : en
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Author: MIKON (16, 2006, Kraków)
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Category :
Languages : en
Pages : 29
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Category : Microwaves
Languages : en
Pages : 1216
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Author: Stefan Lindenmeier
Publisher: Springer Science & Business Media
ISBN: 3642183751
Category : Technology & Engineering
Languages : en
Pages : 378
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Book Description
This volume provides a discussion of the challenges and perspectives of electromagnetics and network theory and their microwave applications in all aspects. It collects the most interesting contribution of the symposium dedicated to Professor Peter Russer held in October 2009 in Munich.
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Category : Microwaves
Languages : en
Pages : 0
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Author: Anatoly Belous
Publisher: Springer Nature
ISBN: 3030586995
Category : Technology & Engineering
Languages : en
Pages : 992
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Book Description
This comprehensive handbook provides readers with a single-source reference to the theoretical fundamentals, physical mechanisms and principles of operation of all known microwave devices and various radars. The author discusses proven methods of computation and design development, process, schematic, schematic-technical and construction peculiarities of each breed of the microwave devices, as well as the most popular and original technical solutions for radars. Coverage also includes the history of creation of the most widely used radars, as well as guidelines for their potential upgrading. Offers readers a comprehensive, systematized view of all contemporary knowledge, acquired during the last 20 years, on radars and related disciplines; Provides a single-source reference on the physical mechanisms and principles of operation of the basic components of radio location devices, including theoretical aspects of designing the necessary, high-efficiency electronic devices and systems, as well as key, practical methods of computation and design; Presents complex topics using simple language, minimizing mathematics.
Author: Mervin C. Budge
Publisher: Artech House
ISBN: 1630815578
Category : Technology & Engineering
Languages : en
Pages : 816
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Book Description
This highly-anticipated second edition of an Artech House classic covers several key radar analysis areas: the radar range equation, detection theory, ambiguity functions, waveforms, antennas, active arrays, receivers and signal processors, CFAR and chaff analysis. Readers will be able to predict the detection performance of a radar system using the radar range equation, its various parameters, matched filter theory, and Swerling target models. The performance of various signal processors, single pulse, pulsed Doppler, LFM, NLFM, and BPSK, are discussed, taking into account factors including MTI processing, integration gain, weighting loss and straddling loss. The details of radar analysis are covered from a mathematical perspective, with in-depth breakdowns of radar performance in the presence of clutter. Readers will be able to determine the nose temperature of a multi-channel receiver as it is used in active arrays. With the addition of three new chapters on moving target detectors, inverse synthetic aperture radar (ISAR) and constant false alarm rate (CFAR) and new MATLAB codes, this expanded second edition will appeal to the novice as well as the experienced practitioner.
Author: John D. Cressler
Publisher: CRC Press
ISBN: 143987431X
Category : Technology & Engineering
Languages : en
Pages : 1041
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Book Description
Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.
Author: James Randa
Publisher: John Wiley & Sons
ISBN: 1119910099
Category : Technology & Engineering
Languages : en
Pages : 180
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Book Description
Precision Measurement of Microwave Comprehensive resource covering the foundations and analysis of precision noise measurements with a detailed treatment of their uncertainties Precision Measurement of Microwave Thermal Noise presents the basics of precise measurements of thermal noise at microwave frequencies and guides readers through how to evaluate the uncertainties in such measurement. The focus is on measurement methods used at the U.S. National Institute of Standards and Technology (NIST), but the general principles and methods are useful in a wide range of applications. Readers will learn how to perform accurate microwave noise measurements using the respected author’s expertise of calculations to aid understanding of the challenges and solutions. The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed. Specific topics and concepts covered in the text include: Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sources Amplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategies On-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertainties Multiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.
Author: Oliver Brand
Publisher: John Wiley & Sons
ISBN: 3527647120
Category : Technology & Engineering
Languages : en
Pages : 562
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Book Description
System-level modeling of MEMS - microelectromechanical systems - comprises integrated approaches to simulate, understand, and optimize the performance of sensors, actuators, and microsystems, taking into account the intricacies of the interplay between mechanical and electrical properties, circuitry, packaging, and design considerations. Thereby, system-level modeling overcomes the limitations inherent to methods that focus only on one of these aspects and do not incorporate their mutual dependencies. The book addresses the two most important approaches of system-level modeling, namely physics-based modeling with lumped elements and mathematical modeling employing model order reduction methods, with an emphasis on combining single device models to entire systems. At a clearly understandable and sufficiently detailed level the readers are made familiar with the physical and mathematical underpinnings of MEMS modeling. This enables them to choose the adequate methods for the respective application needs. This work is an invaluable resource for all materials scientists, electrical engineers, scientists working in the semiconductor and/or sensor industry, physicists, and physical chemists.
