Shreir's Corrosion

Shreir's Corrosion PDF Author:
Publisher: Elsevier
ISBN: 0444527877
Category : Technology & Engineering
Languages : en
Pages : 3652

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Book Description
This four-volume reference work builds upon the success of past editions of Elsevier’s Corrosion title (by Shreir, Jarman, and Burstein), covering the range of innovations and applications that have emerged in the years since its publication. Developed in partnership with experts from the Corrosion and Protection Centre at the University of Manchester, Shreir’s Corrosion meets the research and productivity needs of engineers, consultants, and researchers alike. Incorporates coverage of all aspects of the corrosion phenomenon, from the science behind corrosion of metallic and non-metallic materials in liquids and gases to the management of corrosion in specific industries and applications Features cutting-edge topics such as medical applications, metal matrix composites, and corrosion modeling Covers the benefits and limitations of techniques from scanning probes to electrochemical noise and impedance spectroscopy

Conductive Atomic Force Microscopy

Conductive Atomic Force Microscopy PDF Author: Mario Lanza
Publisher: John Wiley & Sons
ISBN: 3527340912
Category : Science
Languages : en
Pages : 382

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Book Description
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.

Shreir's Corrosion

Shreir's Corrosion PDF Author:
Publisher: Elsevier
ISBN: 0444527877
Category : Technology & Engineering
Languages : en
Pages : 3652

Get Book Here

Book Description
This four-volume reference work builds upon the success of past editions of Elsevier’s Corrosion title (by Shreir, Jarman, and Burstein), covering the range of innovations and applications that have emerged in the years since its publication. Developed in partnership with experts from the Corrosion and Protection Centre at the University of Manchester, Shreir’s Corrosion meets the research and productivity needs of engineers, consultants, and researchers alike. Incorporates coverage of all aspects of the corrosion phenomenon, from the science behind corrosion of metallic and non-metallic materials in liquids and gases to the management of corrosion in specific industries and applications Features cutting-edge topics such as medical applications, metal matrix composites, and corrosion modeling Covers the benefits and limitations of techniques from scanning probes to electrochemical noise and impedance spectroscopy

Springer Handbook of Microscopy

Springer Handbook of Microscopy PDF Author: Peter W. Hawkes
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561

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Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Light Microscopy of Carbon Steels

Light Microscopy of Carbon Steels PDF Author: Leonard Ernest Samuels
Publisher: ASM International
ISBN: 9781615032174
Category : Technology & Engineering
Languages : en
Pages : 520

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Book Description
Containing over 1,200 representative micrographs and the information and explanatory text that makes them really useful, including composition, condition, etchant, magnification, and more than 100 graphs and tables, this 'how to' book not only gives everyday working examples, but also discusses the relationship between the constitution, metallurgy, and microstructure of various carbon steel products. Contents: Nomenclature of Phases and Constituents; Phase Transformations; Low-Carbon Irons and Steels; Annealing and Normalizing; Spheroidization and Graphitization; Austenitization; Transformation of Austenite; Tempering of Martensite; Welding; Surface Oxidation, Decarburation and Oxidation Scaling; Glossary of Terms; EtchingMethods; ConversionTables; Index.

High Temperature Corrosion and Materials Chemistry IV

High Temperature Corrosion and Materials Chemistry IV PDF Author: Elizabeth J. Opila
Publisher: The Electrochemical Society
ISBN: 9781566773997
Category : Science
Languages : en
Pages : 588

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Book Description
" ... papers presented at the Fourth International Symposium on High Temperature Corrosion and Materials Chemistry, held at the 203rd meeting of the Electrochemical Society, Inc., in Paris, France, April 30- May 2, 2003"--Preface.

In-situ Electron Microscopy

In-situ Electron Microscopy PDF Author: Gerhard Dehm
Publisher: John Wiley & Sons
ISBN: 3527652183
Category : Technology & Engineering
Languages : en
Pages : 403

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Book Description
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

High Temperature Corrosion and Materials Chemistry ...

High Temperature Corrosion and Materials Chemistry ... PDF Author:
Publisher:
ISBN:
Category : Corrosion and anti-corrosives
Languages : en
Pages : 592

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Book Description


Global Venting, Midwater, and Benthic Ecological Processes

Global Venting, Midwater, and Benthic Ecological Processes PDF Author: Michael De Luca
Publisher:
ISBN:
Category : Benthos
Languages : en
Pages : 460

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Book Description


Electrical Atomic Force Microscopy for Nanoelectronics

Electrical Atomic Force Microscopy for Nanoelectronics PDF Author: Umberto Celano
Publisher: Springer
ISBN: 3030156125
Category : Science
Languages : en
Pages : 424

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Book Description
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.

NBS Special Publication

NBS Special Publication PDF Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 800

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Book Description